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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- computing and processing 20 Treffer
- circuit faults 18 Treffer
- sequential circuits 18 Treffer
- sequential analysis 15 Treffer
- communication, networking and broadcast technologies 13 Treffer
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45 weitere Werte:
- logic testing 13 Treffer
- signal processing and analysis 13 Treffer
- circuit synthesis 11 Treffer
- flip-flops 10 Treffer
- automata 8 Treffer
- power, energy and industry applications 8 Treffer
- circuit simulation 7 Treffer
- engineered materials, dielectrics and plasmas 7 Treffer
- automatic test pattern generation 6 Treffer
- signal synthesis 6 Treffer
- very large scale integration 6 Treffer
- asynchronous circuits 5 Treffer
- delay 5 Treffer
- test pattern generators 5 Treffer
- automatic testing 4 Treffer
- benchmark testing 4 Treffer
- clocks 4 Treffer
- logic circuits 4 Treffer
- photonics and electrooptics 4 Treffer
- redundancy 4 Treffer
- built-in self-test 3 Treffer
- data structures 3 Treffer
- hazards 3 Treffer
- boolean functions 2 Treffer
- combinational circuits 2 Treffer
- computational modeling 2 Treffer
- computer science 2 Treffer
- concurrent computing 2 Treffer
- counting circuits 2 Treffer
- design methodology 2 Treffer
- dh-hemts 2 Treffer
- explosions 2 Treffer
- fault diagnosis 2 Treffer
- frequency 2 Treffer
- hardware design languages 2 Treffer
- intellectual property 2 Treffer
- latches 2 Treffer
- logic design 2 Treffer
- national electric code 2 Treffer
- programmable logic arrays 2 Treffer
- protection 2 Treffer
- registers 2 Treffer
- signal generators 2 Treffer
- system testing 2 Treffer
- timing 2 Treffer
Verlag
Publikation
- ieee transactions on computer-aided design of integrated circuits and systems, computer-aided design of integrated circuits and systems, ieee transactions on, ieee trans. comput.-aided des. integr. circuits syst. 6 Treffer
- [1991 proceedings] ieee international conference on computer design: vlsi in computers and processors, computer design: vlsi in computers and processors, 1991. iccd '91. proceedings, 1991 ieee international conference on 1 Treffer
- 1989 ieee international symposium on circuits and systems (iscas), circuits and systems (iscas), 1989 ieee international symposium on 1 Treffer
- 1991, proceedings. international test conference, test conference, 1991, proceedings., international 1 Treffer
- 1993 ieee international symposium on circuits and systems (iscas), circuits and systems (iscas), 1993 ieee international symposium on, circuits and systems 1 Treffer
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21 weitere Werte:
- 1995 ieee international symposium on circuits and systems (iscas), circuits and systems (iscas), 1995 ieee international symposium on, circuits and systems 1 Treffer
- 2004 international conferce on test, test conference, 2004. proceedings. itc 2004. international, international test conference 1 Treffer
- 2007 ieee symposium on vlsi circuits, vlsi circuits, 2007 ieee symposium on 1 Treffer
- 2008 international conference on computer science and software engineering, computer science and software engineering, 2008 international conference on 1 Treffer
- 22nd ieee vlsi test symposium, 2004. proceedings., vlsi test symposium, 2004. proceedings. 22nd ieee, vlsi test symposium 1 Treffer
- 26th acm/ieee design automation conference, design automation, 1989. 26th conference on 1 Treffer
- 27th acm/ieee design automation conference, design automation conference, 1990. proceedings., 27th acm/ieee 1 Treffer
- 30th acm/ieee design automation conference, design automation, 1993. 30th conference on 1 Treffer
- first international conference on industrial and information systems, industrial and information systems, first international conference on 1 Treffer
- proceedings 1994 ieee international conference on computer design: vlsi in computers and processors, computer design: vlsi in computers and processors, 1994. iccd '94. proceedings., ieee international conference on, computer design: vlsi in computers and processors 1 Treffer
- proceedings 1999 ieee international conference on computer design: vlsi in computers and processors (cat. no.99cb37040), computer design, 1999. (iccd '99) international conference on, computer design 1 Treffer
- proceedings design, automation and test in europe, design, automation and test in europe, 1998., proceedings, design, automation and test in europe 1 Treffer
- proceedings of 1993 ieee international conference on computer design iccd'93, computer design: vlsi in computers and processors, 1993. iccd '93. proceedings., 1993 ieee international conference on, vlsi in computers and processors 1 Treffer
- proceedings of european design and test conference edac-etc-euroasic, european design and test conference, 1994. edac, the european conference on design automation. etc european test conference. euroasic, the european event in asic design, proceedings. 1 Treffer
- proceedings of tencon '93. ieee region 10 international conference on computers, communications and automation, tencon '93. proceedings. computer, communication, control and power engineering.1993 ieee region 10 conference on, computer, communication, control and power engineering 1 Treffer
- proceedings of the 2002 ieee international frequency control symposium and pda exhibition (cat. no.02ch37234), frequency control symposium and pda exhibition, 2002. ieee international, frequency control symposium 1 Treffer
- proceedings seventh asian test symposium (ats'98) (cat. no.98tb100259), test symposium, 1998. ats '98. proceedings. seventh asian, asian test symposium 1 Treffer
- proceedings sixth asian test symposium (ats'97), test symposium, 1997. (ats '97) proceedings., sixth asian, test symposium 1 Treffer
- proceedings. international test conference 1990, test conference, 1990. proceedings., international 1 Treffer
- proceedings. 'meeting the tests of time'., international test conference, test conference, 1989. proceedings. meeting the tests of time., international 1 Treffer
- proceedings., 1990 ieee international conference on computer design: vlsi in computers and processors, computer design: vlsi in computers and processors, 1990. iccd '90. proceedings, 1990 ieee international conference on 1 Treffer
31 Treffer
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In: 1989 IEEE International Symposium on Circuits and Systems (ISCAS), 1989, S. 1939-1941KonferenzZugriff:
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In: 2004 International Conferce on Test, 2004, S. 820-829KonferenzZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Jg. 25 (2006-10-01), Heft 10, S. 2275-2282Online academicJournalZugriff:
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In: 1995 IEEE International Symposium on Circuits and Systems (ISCAS), Jg. 2 (1995), S. 1074-1077KonferenzZugriff:
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In: Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computers and Processors, 1994, S. 447-452KonferenzZugriff:
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In: 30th ACM/IEEE Design Automation Conference, 1993, S. 7-13Online KonferenzZugriff:
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In: [1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors, 1991, S. 77-80KonferenzZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Jg. 20 (2001-09-01), Heft 9, S. 1101-1117Online academicJournalZugriff:
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In: Proceedings. International Test Conference 1990, 1990, S. 537-543KonferenzZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Jg. 12 (1993-08-01), Heft 8, S. 1217-1231Online academicJournalZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Jg. 12 (1993-05-01), Heft 5, S. 579-598Online academicJournalZugriff:
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In: Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC, 1994, S. 670-670KonferenzZugriff:
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In: 1993 IEEE International Symposium on Circuits and Systems (ISCAS), 1993-05-01, S. 1519-1519KonferenzZugriff:
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In: Proceedings of TENCON '93. IEEE Region 10 International Conference on Computers, Communications and Automation, Jg. 1 (1993), S. 89-89KonferenzZugriff:
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In: 1991, Proceedings. International Test Conference, 1991, S. 67-67KonferenzZugriff:
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In: Proceedings. 'Meeting the Tests of Time'., International Test Conference, 1989, S. 491-500KonferenzZugriff:
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In: 22nd IEEE VLSI Test Symposium,, 2004, S. 389-394KonferenzZugriff:
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In: Proceedings of the 2002 IEEE International Frequency Control Symposium and PDA Exhibition (Cat. No.02CH37234), 2002, S. 307-310KonferenzZugriff:
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In: Proceedings Design, Automation and Test in Europe, 1998, S. 670-677Online KonferenzZugriff:
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In: Proceedings Sixth Asian Test Symposium (ATS'97), 1997, S. 410-415KonferenzZugriff: