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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- circuits electroniques 271 Treffer
- electronic circuits 271 Treffer
- circuits integres 262 Treffer
- integrated circuits 262 Treffer
- complementary mos technology 260 Treffer
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45 weitere Werte:
- technologie mos complementaire 260 Treffer
- tecnologia mos complementario 260 Treffer
- conception. technologies. analyse fonctionnement. essais 254 Treffer
- design. technologies. operation analysis. testing 254 Treffer
- evaluacion prestacion 107 Treffer
- evaluation performance 107 Treffer
- performance evaluation 107 Treffer
- transistors 99 Treffer
- circuits numeriques 87 Treffer
- digital circuits 87 Treffer
- circuit integre 78 Treffer
- circuito integrado 78 Treffer
- integrated circuit 78 Treffer
- electronique faible puissance 76 Treffer
- low-power electronics 76 Treffer
- amplificateurs 71 Treffer
- amplifiers 71 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 68 Treffer
- electronic equipment and fabrication. passive components, printed wiring boards, connectics 68 Treffer
- convertisseurs de signal 62 Treffer
- signal convertors 62 Treffer
- power electronics 60 Treffer
- electronique puissance 59 Treffer
- electronica potencia 58 Treffer
- implementacion 58 Treffer
- implementation 58 Treffer
- consommation electricite 52 Treffer
- consumo electricidad 52 Treffer
- electric power consumption 52 Treffer
- circuit integre cmos 48 Treffer
- cmos integrated circuits 48 Treffer
- circuit design 46 Treffer
- conception circuit 46 Treffer
- diseno circuito 44 Treffer
- oscillateurs, resonateurs, synthetiseurs 40 Treffer
- oscillators, resonators, synthetizers 40 Treffer
- baja tension 39 Treffer
- basse tension 39 Treffer
- low voltage 39 Treffer
- circuit logique 38 Treffer
- circuito logico 38 Treffer
- logic circuit 38 Treffer
- transistor 37 Treffer
- gain 36 Treffer
- analog circuit 35 Treffer
Publikation
- microelectronics journal 129 Treffer
- microelectronics and reliability 63 Treffer
- integration (amsterdam) 53 Treffer
- solid-state electronics 22 Treffer
- amf/rf[ams/rf] cmos circuit design for wireless transceivers 11 Treffer
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24 weitere Werte:
- microelectronic engineering 10 Treffer
- organic electronics (print) 9 Treffer
- 16th european symposium on reliability of electron devices, failure physics and analysis (esref 2005), arcachon, france, october 10-14, 2005 4 Treffer
- 17th european symposium on reliability of electron devices, failure physics and analysis (esref 2006), wuppertal, germany, 3-6 october 2006 4 Treffer
- cryogenics (guildford) 4 Treffer
- 2009 international electron devices and materials symposium (iedms) 3 Treffer
- fuzzy sets and systems 3 Treffer
- journal of parallel and distributed computing (print) 3 Treffer
- 14th workshop on dielectrics in microelectronics (wodim 2006) 2 Treffer
- materials science in semiconductor processing 2 Treffer
- physica. e, low-dimentional systems and nanostructures 2 Treffer
- proceedings of the e-mrs 2008 symposium c: frontiers in silicon-based photonics e-mrs symposium c 2 Treffer
- comptes rendus. physique 1 Treffer
- computing with future nanotechnology 1 Treffer
- expert systems with applications 1 Treffer
- hardware architectures for algebra, cryptology and number theory 1 Treffer
- journal of systems architecture 1 Treffer
- micro/nano devices and systems 2013: an open thematic journal issue 1 Treffer
- negative-bias-temperature instability (nbti) in mos devices special sectio n 1 Treffer
- parallel computing with optical interconnects 1 Treffer
- reliability of electron devices, failure physics and analysis 1 Treffer
- selected extended papers from ulis 2012 conference 1 Treffer
- special issue with papers selected from the ultimate integration on silicon conference, ulis 2008 1 Treffer
- ultimate lithography 1 Treffer
Sprache
Geographischer Bezug
303 Treffer
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In: Microelectronics and reliability, Jg. 54 (2014), Heft 1, S. 90-99academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 4, S. 510-531academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 1, S. 48-61academicJournalZugriff:
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-state electronics, Jg. 91 (2014), S. 81-86academicJournalZugriff:
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In: Solid-state electronics, Jg. 62 (2011), Heft 1, S. 115-122academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 46 (2006), Heft 5-6, S. 702-712KonferenzZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 127-130academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 3, S. 349-355academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 45 (2012), Heft 2, S. 222-227academicJournalZugriff:
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In: AMF/RF[AMS/RF] CMOS Circuit Design for Wireless Transceivers, Jg. 42 (2009), Heft 1, S. 83-88academicJournalZugriff:
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In: Solid-state electronics, Jg. 79 (2013), S. 79-86academicJournalZugriff:
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In: Solid-state electronics, Jg. 82 (2013), S. 41-45academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 46 (2013), Heft 4, S. 449-462academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 51 (2011), Heft 12, S. 2357-2365academicJournalZugriff:
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In: Microelectronic engineering, Jg. 88 (2011), Heft 6, S. 888-901academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 51 (2011), Heft 5, S. 871-878academicJournalZugriff:
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In: Solid-state electronics, Jg. 61 (2011), Heft 1, S. 38-45academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 44 (2011), Heft 2, S. 136-143academicJournalZugriff:
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In: Microelectronics journal, Jg. 41 (2010), Heft 12, S. 897-905academicJournalZugriff:
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In: Microelectronics journal, Jg. 41 (2010), Heft 4, S. 247-255academicJournalZugriff: