Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics 7 Treffer
- business 6 Treffer
- japanese competition 6 Treffer
- integrated circuits 5 Treffer
- semiconductor industry 5 Treffer
-
45 weitere Werte:
- application specific integrated circuits 4 Treffer
- cmos integrated circuits 4 Treffer
- cmos technology 4 Treffer
- computers 4 Treffer
- computers and office automation industries 4 Treffer
- front-end electronics 4 Treffer
- image sensor 4 Treffer
- microcomputer 4 Treffer
- mixed analog-digital integrated circuits 4 Treffer
- neutrino oscillation 4 Treffer
- neutrinos 4 Treffer
- oscillations 4 Treffer
- pacs 85.42 4 Treffer
- power electronics 4 Treffer
- readout electronics 4 Treffer
- semiconductor device 4 Treffer
- time projection chambers 4 Treffer
- time projection chambers (nuclear physics) 4 Treffer
- vertical integration 4 Treffer
- proton synchrotron 3 Treffer
- size 0.35 mum 3 Treffer
- [spi.signal]engineering sciences [physics]/signal and image processing 2 Treffer
- [spi]engineering sciences [physics] 2 Treffer
- 3d integration 2 Treffer
- adc 2 Treffer
- analog-to-digital converters 2 Treffer
- digital electronics 2 Treffer
- imager 2 Treffer
- mems 2 Treffer
- neuromorphic 2 Treffer
- pixel 2 Treffer
- power resources 2 Treffer
- semiconductor technology 2 Treffer
- spectrum 2 Treffer
- successive approximation analog-to-digital converters 2 Treffer
- temperature compensation 2 Treffer
- tin 2 Treffer
- voltage-controlled oscillators 2 Treffer
- x-ray 2 Treffer
- actuator 1 Treffer
- belle ii 1 Treffer
- bimorph 1 Treffer
- broadband communication systems 1 Treffer
- commercial treaties -- japan 1 Treffer
- communications equipment 1 Treffer
Verlag
Publikation
Sprache
Geographischer Bezug
13 Treffer
-
In: IEEJ Transactions on Electrical & Electronic Engineering, Jg. 19 (2024-05-01), Heft 5, S. 785-790Online academicJournalZugriff:
-
In: Nuclear Instruments & Methods in Physics Research Section A, Jg. 1048 (2023-03-01), S. N.PAGacademicJournalZugriff:
-
In: Proc. of International Image Sensor Workshop (IISW'11) ; International Image Sensor Workshop (IISW'11) ; https://hal.science/hal-00670962 ; International Image Sensor Workshop (IISW'11), Jun 2011, Hokkaido, Japan. pp.138-141, 2011KonferenzZugriff:
-
In: IEEJ Technical Meeting on Sensors and Micromachines ; https://hal.archives-ouvertes.fr/hal-00777827 ; IEEJ Technical Meeting on Sensors and Micromachines, Jun 2012, Kyoto, Japan. pp.71, 2012KonferenzZugriff:
-
In: Proc. of International Image Sensor Workshop (IISW'11) ; International Image Sensor Workshop (IISW'11) ; https://hal.science/hal-00670949 ; International Image Sensor Workshop (IISW'11), Jun 2011, Hokkaido, Japan. pp.142-145, 2011KonferenzZugriff:
-
In: IEEJ Transactions on Electrical & Electronic Engineering, Jg. 16 (2021-09-01), Heft 9, S. 1221-1228Online academicJournalZugriff:
-
In: IEEE Journal of Solid-State Circuits, Jg. 41 (2006-04-01), Heft 4, S. 891-898Online academicJournalZugriff:
-
In: 2017 Symposium on VLSI Circuits (978-4-86348-606-5) ; https://cea.hal.science/cea-02194515 ; 2017 Symposium on VLSI Circuits (978-4-86348-606-5), Jun 2017, Kyoto, Japan. pp.C246-C247, ⟨10.23919/VLSIC.2017.8008496⟩, 2017KonferenzZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 55 (2008-06-03), Heft 3, S. 1744-1752Online academicJournalZugriff:
-
In: InformationWeek, 1988-02-29, Heft n158, S. 32-35serialPeriodicalZugriff:
-
In: Electronic Business, Jg. v16 (1990-05-14), Heft n9, S. p35serialPeriodicalZugriff:
-
In: Computerworld, Jg. v20 (1986-06-23), Heft n25, S. 120-121serialPeriodicalZugriff:
-
In: PC Week, Jg. v4 (1987-12-01), Heft n48, S. p185serialPeriodicalZugriff: