Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- soi technology 3 Treffer
- automatic test generation 2 Treffer
- bridging faults 2 Treffer
- fault simulation 2 Treffer
- functional testing 2 Treffer
-
24 weitere Werte:
- stuck-open faults 2 Treffer
- active filters 1 Treffer
- analog circuits 1 Treffer
- analog multipliers 1 Treffer
- capacitance measurement 1 Treffer
- clock skew 1 Treffer
- cmos technology 1 Treffer
- continuous-time filters 1 Treffer
- correspondence theory 1 Treffer
- critical path analysis 1 Treffer
- device characterization 1 Treffer
- fault analysis 1 Treffer
- fault behavior 1 Treffer
- fault modeling 1 Treffer
- group delay 1 Treffer
- iddq testing 1 Treffer
- kripke frames 1 Treffer
- low-voltage analog circuits 1 Treffer
- non-linear circuits 1 Treffer
- nora 1 Treffer
- operational amplifier 1 Treffer
- rf components 1 Treffer
- signal generator 1 Treffer
- universal test set 1 Treffer
Publikation
- analog integrated circuits and signal processing: an international journal 7 Treffer
- journal of electronic testing: theory and applications 4 Treffer
- journal of electronic testing 2 Treffer
- journal of electronic testing: theory and applications (jetta) 1 Treffer
- journal of logic, language and information 1 Treffer
Sprache
13 Treffer
-
In: Analog Integrated Circuits and Signal Processing: An International Journal, Jg. 47 (2006-05-01), Heft 2, S. 103-112Online academicJournalZugriff:
-
In: Analog Integrated Circuits and Signal Processing: An International Journal, Jg. 41 (2004-10-01), Heft 1, S. 55-63Online academicJournalZugriff:
-
Fully-Depleted SOI CMOS Technology for Low-Voltage Low-Power Mixed Digital/Analog/Microwave CircuitsIn: Analog Integrated Circuits and Signal Processing: An International Journal, Jg. 21 (1999-12-01), Heft 3, S. 213-228Online academicJournalZugriff:
-
In: Journal of Electronic Testing: Theory and Applications, Jg. 18 (2002-04-01), Heft 2, S. 109-120Online academicJournalZugriff:
-
In: Journal of Electronic Testing: Theory and Applications, Jg. 6 (1995-06-01), Heft 3, S. 313-323Online academicJournalZugriff:
-
In: Analog Integrated Circuits and Signal Processing: An International Journal, Jg. 47 (2006-06-01), Heft 3, S. 345-353Online academicJournalZugriff:
-
In: Analog Integrated Circuits and Signal Processing: An International Journal, Jg. 37 (2003-12-01), Heft 3, S. 253-257Online academicJournalZugriff:
-
In: Journal of Logic, Language and Information, Jg. 13 (2004-12-01), Heft 3, S. 241-266Online academicJournalZugriff:
-
In: Analog Integrated Circuits and Signal Processing: An International Journal, Jg. 40 (2004-07-01), Heft 1, S. 103-108Online academicJournalZugriff:
-
In: Journal of Electronic Testing: Theory and Applications, Jg. 16 (2000-12-01), Heft 6, S. 617-629Online academicJournalZugriff:
-
In: Analog Integrated Circuits and Signal Processing: An International Journal, Jg. 23 (2000-06-01), Heft 3, S. 189-198Online academicJournalZugriff:
-
In: Journal of Electronic Testing: Theory and Applications, Jg. 2 (1991-06-01), Heft 2, S. 181-190Online academicJournalZugriff:
-
Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!academicJournalZugriff: