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Weniger Treffer
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Schlagwort
- gate oxide 4 Treffer
- bipolar transistor 3 Treffer
- cmos technology 3 Treffer
- atomic layer deposition 2 Treffer
- bipolar junction transistor 2 Treffer
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45 weitere Werte:
- clock signal 2 Treffer
- gate length 2 Treffer
- nmos transistor 2 Treffer
- noise immunity 2 Treffer
- output driver 2 Treffer
- reference plane 2 Treffer
- signal conductor 2 Treffer
- switching noise 2 Treffer
- threshold voltage shift 2 Treffer
- active layer 1 Treffer
- amplifier 1 Treffer
- analog signal processing 1 Treffer
- arrhenius expression 1 Treffer
- bipolar device 1 Treffer
- bipolar technology 1 Treffer
- boundary element method 1 Treffer
- calcium fluoride 1 Treffer
- channel doping 1 Treffer
- circuit board 1 Treffer
- cmos inverter 1 Treffer
- cmos process 1 Treffer
- conduction path 1 Treffer
- conductive layer 1 Treffer
- contact resistance 1 Treffer
- coulomb blockade 1 Treffer
- delay calculation 1 Treffer
- direct memory access 1 Treffer
- effective inductance 1 Treffer
- electron spin resonance 1 Treffer
- electron spin resonance spectrum 1 Treffer
- electronic component 1 Treffer
- epitaxial layer 1 Treffer
- equivalent oxide thickness 1 Treffer
- fault tolerance 1 Treffer
- fiber optic system 1 Treffer
- flux linkage 1 Treffer
- gate dielectric 1 Treffer
- gate electrode 1 Treffer
- ground noise 1 Treffer
- high performance computer 1 Treffer
- hydrofluoric acid solution 1 Treffer
- iedm tech 1 Treffer
- interface device 1 Treffer
- interface trap 1 Treffer
- interface type 1 Treffer
Verlag
Publikation
- simultaneous switching noise of cmos devices and systems 8 Treffer
- bicmos technology and applications 2 Treffer
- interface fundamentals in microprocessor-controlled systems 2 Treffer
- reliability of nanoscale circuits and systems : methodologies and circuit architectures 2 Treffer
- cmos vlsi engineering : silicon-on-insulator (soi) 1 Treffer
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18 weitere Werte:
- cryptographic hardware and embedded systems - ches 2002 : 4th international workshop redwood shores, ca, usa, august 13-15, 2002 revised papers 1 Treffer
- defects in sio2 and related dielectrics: science and technology 1 Treffer
- engineering applications of residual stress, volume 8 : proceedings of the 2011 annual conference on experimental and applied mechanics 1 Treffer
- high-speed cmos circuits for optical receivers 1 Treffer
- low-power digital vlsi design : circuits and systems 1 Treffer
- manuel cardona : memories and reminiscences 1 Treffer
- manufacturing technology in the electronics industry : an introduction 1 Treffer
- mm-wave silicon technology : 60 ghz and beyond 1 Treffer
- novel silicon based technologies 1 Treffer
- physical and technical problems of soi structures and devices 1 Treffer
- proceedings of the fourth international conference on microelectronics, computing and communication systems : mccs 2019 1 Treffer
- simulation of semiconductor processes and devices 2001 : sispad 01 1 Treffer
- subsecond annealing of advanced materials : annealing by lasers, flash lamps and swift heavy ions 1 Treffer
- the electronics assembly handbook 1 Treffer
- the physics and chemistry of sio2 and the si-sio2 interface 2 1 Treffer
- thin films and heterostructures for oxide electronics 1 Treffer
- ultra high-speed cmos circuits : beyond 100 ghz 1 Treffer
- vibrational properties of defective oxides and 2d nanolattices : insights from first-principles simulations 1 Treffer
33 Treffer
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In: Ultra High-Speed CMOS Circuits : Beyond 100 GHz; (2012) S. 59-80Online E-BookZugriff:
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1994Online E-BookZugriff:
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In: CMOS VLSI Engineering : Silicon-on-Insulator (SOI); (1998) S. 1-14Online E-BookZugriff:
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In: High-speed CMOS Circuits for Optical Receivers; (2001) S. 1-12Online E-BookZugriff:
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1994Online E-BookZugriff:
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1994Online E-BookZugriff:
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1994Online E-BookZugriff:
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1994Online E-BookZugriff:
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1994Online E-BookZugriff:
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In: Thin Films and Heterostructures for Oxide Electronics; (2005) S. 79-126Online E-BookZugriff:
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1995Online E-BookZugriff:
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2014Online E-BookZugriff:
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In: Manuel Cardona : Memories and Reminiscences; (2016) S. 171-174Online E-BookZugriff:
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In: Engineering Applications of Residual Stress, Volume 8 : Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics; (2011) S. 35-37Online E-BookZugriff:
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In: Reliability of Nanoscale Circuits and Systems : Methodologies and Circuit Architectures; (2011) S. 19-34Online E-BookZugriff:
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In: Reliability of Nanoscale Circuits and Systems : Methodologies and Circuit Architectures; (2011) S. 1-6Online E-BookZugriff:
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2000Online E-BookZugriff: