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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- complementary mos technology 61 Treffer
- technologie mos complementaire 61 Treffer
- tecnologia mos complementario 61 Treffer
- circuits electriques, optiques et optoelectroniques 48 Treffer
- electric, optical and optoelectronic circuits 48 Treffer
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45 weitere Werte:
- circuit properties 44 Treffer
- proprietes des circuits 44 Treffer
- circuits electroniques 43 Treffer
- electronic circuits 43 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 34 Treffer
- electronic equipment and fabrication. passive components, printed wiring boards, connectics 34 Treffer
- evaluacion prestacion 34 Treffer
- evaluation performance 34 Treffer
- performance evaluation 34 Treffer
- transistors 33 Treffer
- circuit integre 30 Treffer
- circuito integrado 30 Treffer
- integrated circuit 30 Treffer
- circuit integre radiofrequence 19 Treffer
- radiofrequency integrated circuits 19 Treffer
- electronica potencia 17 Treffer
- electronique puissance 17 Treffer
- power electronics 17 Treffer
- electronique faible puissance 16 Treffer
- low-power electronics 16 Treffer
- circuit design 15 Treffer
- conception circuit 15 Treffer
- delay time 15 Treffer
- diseno circuito 15 Treffer
- inverter 15 Treffer
- ondulador 15 Treffer
- onduleur 15 Treffer
- temps retard 15 Treffer
- tiempo retardo 15 Treffer
- circuits numeriques 14 Treffer
- digital circuits 14 Treffer
- amplificateurs 13 Treffer
- amplifiers 13 Treffer
- seuil tension 13 Treffer
- umbral tension 13 Treffer
- voltage threshold 13 Treffer
- fiabilidad 12 Treffer
- fiabilite 12 Treffer
- implementacion 12 Treffer
- implementation 12 Treffer
- modelisation 12 Treffer
- mosfet 12 Treffer
- optimisation 12 Treffer
- optimization 12 Treffer
- physics 12 Treffer
Publikation
- microelectronics journal 28 Treffer
- microelectronics and reliability 26 Treffer
- integration (amsterdam) 12 Treffer
- solid-state electronics 10 Treffer
- microelectronic engineering 5 Treffer
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21 weitere Werte:
- organic electronics (print) 5 Treffer
- journal of non-crystalline solids 2 Treffer
- reliability of electron devices, failure physics and analysis 2 Treffer
- 14th workshop on dielectrics in microelectronics (wodim 2006) 1 Treffer
- adc modelling and testing 1 Treffer
- amf/rf[ams/rf] cmos circuit design for wireless transceivers 1 Treffer
- displays 1 Treffer
- international journal of heat and fluid flow 1 Treffer
- international journal of thermal sciences 1 Treffer
- journal of crystal growth 1 Treffer
- lcos - a disruptive microdisplay technology for large screen displays 1 Treffer
- measurement 1 Treffer
- micro/nano devices and systems 2013: an open thematic journal issue 1 Treffer
- negative-bias-temperature instability (nbti) in mos devices special sectio n 1 Treffer
- proceedings of the 19th international conference on amorphous and microcrystalline semiconductors - science and technology (icams 19), nice, france, august 27-31, 2001. part b 1 Treffer
- selected full-length extended papers from the eurosoi 2009 conference 1 Treffer
- sio2, advanced dielectrics and related devices, mondelo, palermo, italy, june 25-28, 2006 1 Treffer
- special issue devoted to the 2nd international memory workshop (imw 2010) 1 Treffer
- special issue with papers selected from the ultimate integration on silicon conference, ulis 2008 1 Treffer
- the international symposium on ion implantation and other applications of ions and electrons - ion 2002, 10-13 june 2002, kazimierz dolny, poland 1 Treffer
- vacuum 1 Treffer
Sprache
94 Treffer
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In: Microelectronics and reliability, Jg. 54 (2014), Heft 1, S. 90-99academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 4, S. 510-531academicJournalZugriff:
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-state electronics, Jg. 91 (2014), S. 81-86academicJournalZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 155-158academicJournalZugriff:
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In: Solid-state electronics, Jg. 98 (2014), S. 26-31academicJournalZugriff:
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In: SiO2, advanced dielectrics and related devices, Mondelo, Palermo, Italy, June 25-28, 2006, Jg. 353 (2007), Heft 5-7, S. 639-644KonferenzZugriff:
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In: Microelectronics and reliability, Jg. 46 (2006), Heft 5-6, S. 702-712KonferenzZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 3, S. 349-355academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 4, S. 592-599academicJournalZugriff:
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In: Solid-state electronics, Jg. 81 (2013), S. 151-156academicJournalZugriff:
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In: Reliability of electron devices, failure physics and analysis, Jg. 44 (2004), Heft 9-11, S. 1519-1522KonferenzZugriff:
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In: International journal of thermal sciences, Jg. 56 (2012), S. 77-85academicJournalZugriff:
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In: AMF/RF[AMS/RF] CMOS Circuit Design for Wireless Transceivers, Jg. 42 (2009), Heft 1, S. 83-88academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 46 (2013), Heft 4, S. 449-462academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 51 (2011), Heft 12, S. 2357-2365academicJournalZugriff:
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In: Microelectronic engineering, Jg. 88 (2011), Heft 6, S. 888-901academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 51 (2011), Heft 5, S. 871-878academicJournalZugriff:
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In: Solid-state electronics, Jg. 61 (2011), Heft 1, S. 38-45academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 44 (2011), Heft 2, S. 136-143academicJournalZugriff:
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In: Proceedings of the 19th international conference on amorphous and microcrystalline semiconductors - science and technology (ICAMS 19), Nice, France, August 27-31, 2001. Part B, Jg. 299302 (2002), S. 1316-1320KonferenzZugriff: