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Publikation
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In: Analog Integrated Circuits & Signal Processing, Jg. 98 (2019-02-01), Heft 2, S. 321-329Online academicJournalZugriff:
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In: Analog Integrated Circuits & Signal Processing, Jg. 98 (2019-03-01), Heft 3, S. 627-632Online academicJournalZugriff:
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In: Analog Integrated Circuits & Signal Processing, Jg. 98 (2019-03-01), Heft 3, S. 643-649Online academicJournalZugriff:
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In: Analog Integrated Circuits & Signal Processing, Jg. 98 (2019-03-01), Heft 3, S. 615-625Online academicJournalZugriff:
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In: Analog Integrated Circuits & Signal Processing, Jg. 98 (2019-02-01), Heft 2, S. 257-264Online academicJournalZugriff:
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In: Analog Integrated Circuits & Signal Processing, Jg. 78 (2014-02-01), Heft 2, S. 409-419Online academicJournalZugriff:
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In: Analog Integrated Circuits & Signal Processing, Jg. 84 (2015-07-01), Heft 1, S. 75-88Online academicJournalZugriff:
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In: Analog Integrated Circuits & Signal Processing, Jg. 98 (2019-02-01), Heft 2, S. 233-241Online academicJournalZugriff:
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In: Analog Integrated Circuits & Signal Processing, Jg. 84 (2015-07-01), Heft 1, S. 137-148Online academicJournalZugriff:
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In: Analog Integrated Circuits & Signal Processing, Jg. 98 (2019-03-01), Heft 3, S. 575-585Online academicJournalZugriff:
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In: Analog Integrated Circuits & Signal Processing, Jg. 95 (2018-06-01), Heft 3, S. 395-401Online academicJournalZugriff:
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In: Journal of Electronic Testing, Jg. 34 (2018-02-01), Heft 1, S. 27-41Online academicJournalZugriff:
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In: Analog Integrated Circuits & Signal Processing, Jg. 84 (2015-07-01), Heft 1, S. 119-126Online academicJournalZugriff:
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In: Circuits, Systems & Signal Processing, Jg. 34 (2015-05-01), Heft 5, S. 1405-1429Online academicJournalZugriff: