Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- semiconductor industry 73 Treffer
- semiconductor industry -- analysis 73 Treffer
- transistors -- analysis 33 Treffer
- circuit components -- analysis 24 Treffer
- semiconductor device 24 Treffer
-
45 weitere Werte:
- complementary metal oxide semiconductors -- models 22 Treffer
- silicon -- analysis 21 Treffer
- metal oxide semiconductor field effect transistors -- analysis 19 Treffer
- complementary metal oxide semiconductors -- methods 14 Treffer
- integrated circuits -- analysis 12 Treffer
- semiconductor chips -- analysis 12 Treffer
- sensors -- analysis 12 Treffer
- standard ic 12 Treffer
- dielectrics -- analysis 10 Treffer
- epitaxy -- analysis 10 Treffer
- detectors -- analysis 9 Treffer
- complementary metal oxide semiconductors -- electric properties 7 Treffer
- dielectric films -- analysis 7 Treffer
- nanotechnology -- analysis 7 Treffer
- semiconductor industry -- methods 7 Treffer
- thin films -- analysis 7 Treffer
- amplifiers (electronics) -- analysis 6 Treffer
- neural network 6 Treffer
- neural networks -- analysis 6 Treffer
- semiconductor industry -- models 6 Treffer
- capacitors -- analysis 5 Treffer
- circuit components -- models 5 Treffer
- industrial equipment and supplies industry -- analysis 5 Treffer
- mechanical engineering -- analysis 5 Treffer
- silicon compounds -- analysis 5 Treffer
- southern oscillation -- analysis 5 Treffer
- transistors -- models 5 Treffer
- very-large-scale integration -- analysis 5 Treffer
- alloys -- analysis 4 Treffer
- electrical engineering 4 Treffer
- electrical engineering -- analysis 4 Treffer
- finite element method -- analysis 4 Treffer
- metal oxide semiconductor field effect transistors -- models 4 Treffer
- radiation -- analysis 4 Treffer
- tiltmeters -- analysis 4 Treffer
- atomic force microscopy -- analysis 3 Treffer
- chemical vapor deposition -- analysis 3 Treffer
- complementary metal oxide semiconductors -- usage 3 Treffer
- computer simulation -- analysis 3 Treffer
- computer-aided design -- analysis 3 Treffer
- computer-generated environments -- analysis 3 Treffer
- control systems -- analysis 3 Treffer
- dielectric films -- electric properties 3 Treffer
- dielectrics -- electric properties 3 Treffer
- electronic components industry -- analysis 3 Treffer
Publikation
- solid state electronics 30 Treffer
- microelectronic engineering 23 Treffer
- microelectronics journal 21 Treffer
- microelectronics and reliability 15 Treffer
- materials science & engineering b 12 Treffer
-
31 weitere Werte:
- nuclear instruments and methods in physics research, a 12 Treffer
- sensors & actuators: a. physical 12 Treffer
- aeue - international journal of electronics and communications 8 Treffer
- nuclear instruments and methods in physics research, b 5 Treffer
- biosensors and bioelectronics 4 Treffer
- materials science in semiconductor processing 4 Treffer
- applied surface science 3 Treffer
- integration, the vlsi journal 3 Treffer
- measurement 3 Treffer
- international congress series 2 Treffer
- journal of electrostatics 2 Treffer
- materials science & engineering c 2 Treffer
- sensors & actuators: b. chemical 2 Treffer
- thin solid films 2 Treffer
- chemical physics 1 Treffer
- comptes rendus - chimie 1 Treffer
- computational materials science 1 Treffer
- current applied physics 1 Treffer
- ecological modelling 1 Treffer
- european journal of mechanics / b fluids 1 Treffer
- journal of magnetism and magnetic materials 1 Treffer
- journal of non-crystalline solids 1 Treffer
- journal of quantitative spectroscopy and radiative transfer 1 Treffer
- journal of systems architecture 1 Treffer
- mathematics and computers in simulation 1 Treffer
- neurocomputing 1 Treffer
- optical materials 1 Treffer
- optics and laser technology 1 Treffer
- optics communications 1 Treffer
- proceedings of the combustion institute 1 Treffer
- robotics and autonomous systems 1 Treffer
Sprache
182 Treffer
-
In: AEUE - International Journal of Electronics and Communications, Jg. 63 (2009-12-01), Heft 12, S. 1067-1071Online academicJournal
-
In: Microelectronics Journal, Jg. 40 (2009-10-01), Heft 10, S. 1496-1501academicJournalZugriff:
-
In: Microelectronic Engineering, Jg. 86 (2009-10-01), Heft 10, S. 2123-2126academicJournalZugriff:
-
In: Microelectronics Journal, Jg. 40 (2009-09-01), Heft 9, S. 1281-1292academicJournalZugriff:
-
In: Optics and Laser Technology, Jg. 41 (2009-09-01), Heft 6, S. 764-769academicJournalZugriff:
-
In: Sensors & Actuators: A. Physical, Jg. 153 (2009-08-03), Heft 2, S. 244-250academicJournalZugriff:
-
In: Microelectronics Journal, Jg. 40 (2009-06-01), Heft 6, S. 958-965academicJournalZugriff:
-
In: Microelectronics Journal, Jg. 40 (2009-06-01), Heft 6, S. 1000-1006academicJournalZugriff:
-
In: Sensors & Actuators: A. Physical, Jg. 152 (2009-05-21), Heft 1, S. 21-28academicJournalZugriff:
-
In: Microelectronic Engineering, Jg. 86 (2009-04-01), Heft 4-6, S. 1046-1049academicJournalZugriff:
-
In: Measurement, Jg. 41 (2008-12-01), Heft 10, S. 1077-1092academicJournalZugriff:
-
In: Nuclear Instruments and Methods in Physics Research, A, Jg. 596 (2008-10-21), Heft 1, S. 107-112academicJournalZugriff:
-
In: Microelectronics Journal, Jg. 39 (2008-09-01), Heft 9, S. 1130-1139academicJournalZugriff:
-
In: Nuclear Instruments and Methods in Physics Research, A, Jg. 583 (2007-12-21), Heft 2-3, S. 469-478academicJournalZugriff:
-
In: Solid State Electronics, Jg. 51 (2007-11-01), Heft 11-12, S. 1609-1617academicJournalZugriff:
-
In: Sensors & Actuators: A. Physical, Jg. 139 (2007-09-12), Heft 1-2, S. 265-271academicJournalZugriff:
-
In: Nuclear Instruments and Methods in Physics Research, A, Jg. 579 (2007-08-21), Heft 1, S. 235-238academicJournalZugriff:
-
In: Materials Science & Engineering B, Jg. 135 (2006-12-15), Heft 3, S. 261-266academicJournalZugriff:
-
In: Nuclear Instruments and Methods in Physics Research, A, Jg. 568 (2006-11-30), Heft 1, S. 343-349academicJournalZugriff:
-
In: Nuclear Instruments and Methods in Physics Research, A, Jg. 568 (2006-11-30), Heft 1, S. 124-127academicJournalZugriff: