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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- circuit testing 223 Treffer
- circuit faults 180 Treffer
- signal processing and analysis 170 Treffer
- power, energy and industry applications 134 Treffer
- computing and processing 125 Treffer
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45 weitere Werte:
- engineered materials, dielectrics and plasmas 118 Treffer
- logic testing 100 Treffer
- fault detection 95 Treffer
- voltage 83 Treffer
- integrated circuit testing 79 Treffer
- electrical fault detection 67 Treffer
- current measurement 65 Treffer
- cmos technology 62 Treffer
- leakage current 53 Treffer
- power supplies 53 Treffer
- cmos logic circuits 48 Treffer
- current supplies 47 Treffer
- circuit simulation 42 Treffer
- semiconductor device modeling 42 Treffer
- communication, networking and broadcast technologies 40 Treffer
- production 36 Treffer
- costs 32 Treffer
- monitoring 30 Treffer
- testing 30 Treffer
- system testing 29 Treffer
- automatic testing 28 Treffer
- cmos integrated circuits 28 Treffer
- very large scale integration 28 Treffer
- manufacturing 24 Treffer
- switches 24 Treffer
- delay 23 Treffer
- semiconductor device measurement 23 Treffer
- failure analysis 22 Treffer
- threshold voltage 22 Treffer
- fault diagnosis 20 Treffer
- frequency 20 Treffer
- performance evaluation 20 Treffer
- degradation 19 Treffer
- leak detection 19 Treffer
- application specific integrated circuits 18 Treffer
- clocks 18 Treffer
- computer science 18 Treffer
- general topics for engineers 18 Treffer
- switching circuits 18 Treffer
- logic circuits 17 Treffer
- robotics and control systems 17 Treffer
- bridge circuits 16 Treffer
- fabrication 16 Treffer
- integrated circuit modeling 16 Treffer
- laboratories 16 Treffer
Verlag
Publikation
- proceedings of 1995 ieee international test conference (itc), test conference, 1995. proceedings., international, international test conference 11 Treffer
- digest of papers ieee international workshop on iddq testing, iddq testing, 1997. digest of papers., ieee international workshop on, iddq testing 10 Treffer
- ieee transactions on computer-aided design of integrated circuits and systems, computer-aided design of integrated circuits and systems, ieee transactions on, ieee trans. comput.-aided des. integr. circuits syst. 10 Treffer
- ieee transactions on very large scale integration (vlsi) systems, very large scale integration (vlsi) systems, ieee transactions on, ieee trans. vlsi syst. 8 Treffer
- international test conference 1999. proceedings (ieee cat. no.99ch37034), test conference, 1999. proceedings. international, international test conference 8 Treffer
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45 weitere Werte:
- proceedings 13th ieee vlsi test symposium, vlsi test symposium, 1995. proceedings., 13th ieee, vlsi test symposium 8 Treffer
- digest of papers 1996 ieee international workshop on iddq testing, iddq testing, 1996., ieee international workshop on, iddq testing 7 Treffer
- proceedings international test conference 1996. test and design validity, test conference, 1996. proceedings., international, international test conference 7 Treffer
- proceedings international test conference 1997, test conference, 1997. proceedings., international, test conference 7 Treffer
- proceedings 1998 ieee international workshop on iddq testing (cat. no.98ex232), iddq testing, 1998. proceedings. 1998 ieee international workshop on, iddq testing 6 Treffer
- proceedings international test conference 1998 (ieee cat. no.98ch36270), test conference, 1998. proceedings., international, international test conference 6 Treffer
- proceedings international test conference 2000 (ieee cat. no.00ch37159), test conference, 2000. proceedings. international, international test conference 2000 6 Treffer
- proceedings. international test conference 1990, test conference, 1990. proceedings., international 6 Treffer
- proceedings., international test conference, test conference, 1994. proceedings., international, international test conference 1994 6 Treffer
- ieee journal of solid-state circuits, solid-state circuits, ieee journal of, ieee j. solid-state circuits 5 Treffer
- proceedings 2000 ieee international workshop on defect based testing (cat. no.pr00637), defect based testing, 2000. proceedings. 2000 ieee international workshop on, defect based testing 5 Treffer
- proceedings international test conference 2001 (cat. no.01ch37260), test conference, 2001. proceedings. international, international test conference 5 Treffer
- proceedings of 14th vlsi test symposium, vlsi test symposium, 1996., proceedings of 14th, vlsi test 5 Treffer
- proceedings of ieee international test conference - (itc), test conference, 1993. proceedings., international, international test conference 5 Treffer
- proceedings of ieee vlsi test symposium, vlsi test symposium, 1994. proceedings., 12th ieee 5 Treffer
- proceedings seventh asian test symposium (ats'98) (cat. no.98tb100259), test symposium, 1998. ats '98. proceedings. seventh asian, asian test symposium 5 Treffer
- proceedings. 2005 ieee international workshop on current and defect based testing, 2005. dbt 2005., current and defect based testing, 2005. dbt 2005. proceedings. 2005 ieee international workshop on, current and defect based testing 5 Treffer
- proceedings. international test conference, test conference, 2002. proceedings. international, international test conference 5 Treffer
- 22nd ieee vlsi test symposium, 2004. proceedings., vlsi test symposium, 2004. proceedings. 22nd ieee, vlsi test symposium 4 Treffer
- proceedings ieee european test workshop, test workshop, 2000. proceedings. ieee european, european test workshop 4 Treffer
- proceedings of the ieee 1991 custom integrated circuits conference, custom integrated circuits conference, 1991., proceedings of the ieee 1991 4 Treffer
- 16th international conference on vlsi design, 2003. proceedings., vlsi design, 2003. proceedings. 16th international conference on, vlsi design 3 Treffer
- digest of papers eleventh annual 1993 ieee vlsi test symposium, vlsi test symposium, 1993. digest of papers., eleventh annual 1993 ieee 3 Treffer
- ieee transactions on instrumentation and measurement, instrumentation and measurement, ieee transactions on, ieee trans. instrum. meas. 3 Treffer
- international test conference, 2003. proceedings. itc 2003., test conference, 2003. proceedings. itc 2003. international, international test conference 3 Treffer
- proceedings 17th ieee vlsi test symposium (cat. no.pr00146), vlsi test symposium, 1999. proceedings. 17th ieee, vlsi test symposium 3 Treffer
- proceedings 18th ieee symposium on defect and fault tolerance in vlsi systems, defect and fault tolerance in vlsi systems, 2003. proceedings. 18th ieee international symposium on, defect and fault tolerance in vlsi systems 3 Treffer
- proceedings 18th ieee vlsi test symposium, vlsi test symposium, 2000. proceedings. 18th ieee, vlsi test symposium 3 Treffer
- proceedings 1998 ieee international symposium on defect and fault tolerance in vlsi systems (cat. no.98ex223), defect and fault tolerance in vlsi systems, 1998. proceedings., 1998 ieee international symposium on, defect and fault tolerance in vlsi systems 3 Treffer
- proceedings 20th ieee vlsi test symposium (vts 2002), vlsi test symposium, 2002. (vts 2002). proceedings 20th ieee, vlsi test symposium 3 Treffer
- proceedings design, automation and test in europe, design, automation and test in europe, 1998., proceedings, design, automation and test in europe 3 Treffer
- proceedings international test conference 1992, test conference, 1992. proceedings., international 3 Treffer
- proceedings of 7th international conference on vlsi design, vlsi design, 1994., proceedings of the seventh international conference on 3 Treffer
- proceedings sixth asian test symposium (ats'97), test symposium, 1997. (ats '97) proceedings., sixth asian, test symposium 3 Treffer
- proceedings. 15th ieee vlsi test symposium (cat. no.97tb100125), vlsi test symposium, 1997., 15th ieee, vlsi test 3 Treffer
- 17th ieee international symposium on defect and fault tolerance in vlsi systems, 2002. dft 2002. proceedings., defect and fault tolerance in vlsi systems, 2002. dft 2002. proceedings. 17th ieee international symposium on, defect and fault tolerance in vlsi systems 2 Treffer
- 1997 proceedings second annual ieee international conference on innovative systems in silicon, innovative systems in silicon, 1997. proceedings., second annual ieee international conference on, innovative systems in silicon 2 Treffer
- 23rd ieee vlsi test symposium (vts'05), vlsi test symposium, 2005. proceedings. 23rd ieee, vlsi test symposium 2 Treffer
- 25th ieee vlsi test symposium (vts'07), vlsi test symposium, 2007. 25th ieee 2 Treffer
- 48th midwest symposium on circuits and systems, 2005., circuits and systems, 2005. 48th midwest symposium on, circuits and systems 2 Treffer
- ieee transactions on power electronics, power electronics, ieee transactions on, ieee trans. power electron. 2 Treffer
- ieee transactions on semiconductor manufacturing, semiconductor manufacturing, ieee transactions on, ieee trans. semicond. manufact. 2 Treffer
- ieee transactions on transportation electrification, transportation electrification, ieee transactions on, ieee trans. transp. electrific. 2 Treffer
- proceedings 19th ieee vlsi test symposium. vts 2001, vlsi test symposium, 19th ieee proceedings on. vts 2001, vlsi test symposium 2 Treffer
- proceedings eighth asian test symposium (ats'99), test symposium, 1999. (ats '99) proceedings. eighth asian, asian test symposium 2 Treffer
345 Treffer
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In: 2023 Asian Hardware Oriented Security and Trust Symposium (AsianHOST), 2023-12-13, S. 1-4KonferenzZugriff:
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In: 2023 IEEE 23rd International Conference on Communication Technology (ICCT), 2023-10-20, S. 1325-1329KonferenzZugriff:
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In: 2023 3rd International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME), 2023-07-19, S. 1-5KonferenzZugriff:
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In: IEEE Transactions on Power Electronics, Jg. 38 (2023-10-01), Heft 10, S. 11814-11825Online academicJournalZugriff:
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In: IEEE Transactions on Power Electronics, Jg. 38 (2023-10-01), Heft 10, S. 11738-11750Online academicJournalZugriff:
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In: 2022 IEEE Transportation Electrification Conference & Expo (ITEC), 2022-06-15, S. 579-583KonferenzZugriff:
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In: 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia), 2023-05-22, S. 1031-1037KonferenzZugriff:
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In: 2019 IEEE PELS Workshop on Emerging Technologies: Wireless Power Transfer (WoW), 2019-06-01, S. 140-143KonferenzZugriff:
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In: 2018 9th Annual Power Electronics, Drives Systems and Technologies Conference (PEDSTC), 2018-02-01, S. 26-29KonferenzZugriff:
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In: 2017 IEEE PELS Workshop on Emerging Technologies: Wireless Power Transfer (WoW), 2017-05-01, S. 1-6KonferenzZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 58 (2009-07-01), Heft 7, S. 2196-2208Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 15 (2007-11-01), Heft 11, S. 1245-1255Online academicJournalZugriff:
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In: Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA, 2005, S. 47-51KonferenzZugriff:
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In: Proceedings 2000 IEEE International Workshop on Defect Based Testing (Cat. No.PR00637), 2000, S. 45-50KonferenzZugriff:
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In: 23rd IEEE VLSI Test Symposium (VTS'05), 2005, S. 427-432KonferenzZugriff:
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In: Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC, 2005, S. 471-474KonferenzZugriff:
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In: 17th International Conference on VLSI, 2004, S. 889-894KonferenzZugriff:
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In: 13th Asian Test Symposium, 2004, S. 112-117KonferenzZugriff:
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In: 22nd IEEE VLSI Test Symposium,, 2004, S. 65-70KonferenzZugriff:
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In: 22nd IEEE VLSI Test Symposium,, 2004, S. 53-58KonferenzZugriff: