Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Schlagwort
- overlay 32 Treffer
- metrology 27 Treffer
- optics 25 Treffer
- diffraction 19 Treffer
- electronic engineering 18 Treffer
-
45 weitere Werte:
- lithography 14 Treffer
- computer 11 Treffer
- law 11 Treffer
- law.invention 11 Treffer
- process (computing) 11 Treffer
- 02 engineering and technology 10 Treffer
- computer hardware 10 Treffer
- multiple patterning 10 Treffer
- computer.software_genre 9 Treffer
- computersystemsorganization_computer-communicationnetworks 9 Treffer
- wafer 9 Treffer
- artificial intelligence 7 Treffer
- electrical and electronic engineering 7 Treffer
- telecommunications 7 Treffer
- 01 natural sciences 6 Treffer
- 0103 physical sciences 6 Treffer
- algorithm 6 Treffer
- computer network 6 Treffer
- robustness (computer science) 6 Treffer
- 010309 optics 5 Treffer
- 0210 nano-technology 5 Treffer
- 021001 nanoscience & nanotechnology 5 Treffer
- delay spread 5 Treffer
- node (networking) 5 Treffer
- semiconductor device fabrication 5 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 4 Treffer
- atomic and molecular physics, and optics 4 Treffer
- grating 4 Treffer
- media_common 4 Treffer
- media_common.quotation_subject 4 Treffer
- node (circuits) 4 Treffer
- photolithography 4 Treffer
- signal 4 Treffer
- transmitter 4 Treffer
- wireless 4 Treffer
- computer networks and communications 3 Treffer
- computingmethodologies_imageprocessingandcomputervision 3 Treffer
- database 3 Treffer
- layer (object-oriented design) 3 Treffer
- nanotechnology 3 Treffer
- optical communication 3 Treffer
- reticle 3 Treffer
- sensitivity (control systems) 3 Treffer
- 010302 applied physics 2 Treffer
- 020204 information systems 2 Treffer
Verlag
Publikation
- spie proceedings 22 Treffer
- metrology, inspection, and process control for microlithography xxviii 3 Treffer
- ieee transactions on communications 2 Treffer
- metrology, inspection, and process control for microlithography xxiii 2 Treffer
- 2008 ieee international conference on communications 1 Treffer
-
19 weitere Werte:
- 2015 20th microoptics conference (moc) 1 Treffer
- 2015 ieee international conference on communications (icc) 1 Treffer
- 2017 28th annual semi advanced semiconductor manufacturing conference (asmc) 1 Treffer
- 2021 ieee world congress on services (services) 1 Treffer
- acm sigsoft software engineering notes 1 Treffer
- acm transactions on sensor networks 1 Treffer
- applied intelligence 1 Treffer
- catalysis from a to z 1 Treffer
- ieee journal of selected topics in quantum electronics 1 Treffer
- ieee photonics journal 1 Treffer
- international journal of wireless information networks 1 Treffer
- journal of semiconductors 1 Treffer
- metrology, inspection, and process control for microlithography xxxiii 1 Treffer
- metrology, inspection, and process control for semiconductor manufacturing xxxv 1 Treffer
- optics letters 1 Treffer
- photonic network communications 1 Treffer
- proceedings of 2012 2nd international conference on computer science and network technology 1 Treffer
- proceedings of 6th international symposium on personal, indoor and mobile radio communications 1 Treffer
- proceedings of the 2015 conference on empirical methods in natural language processing 1 Treffer
Sprache
57 Treffer
-
In: 2021 IEEE World Congress on Services (SERVICES), 2021-09-01Online unknownZugriff:
-
In: Catalysis from A to Z, 2020-04-18Online unknownZugriff:
-
In: Photonic Network Communications, Jg. 31 (2015-08-07), S. 251-258Online unknownZugriff:
-
In: Journal of Semiconductors, Jg. 40 (2019-12-01), S. 122403-122403Online unknownZugriff:
-
In: SPIE Proceedings, 2013-04-10Online unknownZugriff:
-
In: Applied Intelligence, Jg. 52 (2021-10-27), S. 8351-8371Online unknownZugriff:
-
In: Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV, 2021-02-22Online unknownZugriff:
-
In: Photomask Technology 2020, 2020-10-12Online unknownZugriff:
-
In: SPIE Proceedings, 2017-03-28Online unknownZugriff:
-
In: 2015 IEEE International Conference on Communications (ICC), 2015-06-01Online unknownZugriff:
-
In: ACM Transactions on Sensor Networks, Jg. 6 (2009-12-01), S. 1-35Online unknownZugriff:
-
In: SPIE Proceedings, 2015-03-19Online unknownZugriff:
-
In: Proceedings of the 2015 Conference on Empirical Methods in Natural Language Processing, 2015Online unknownZugriff:
-
In: Metrology, Inspection, and Process Control for Microlithography XXVIII, 2014-04-02Online unknownZugriff:
-
In: SPIE Proceedings, 2012-03-29Online unknownZugriff:
-
In: SPIE Proceedings, 2012-03-29Online unknownZugriff:
-
In: SPIE Proceedings, 2012-03-29Online unknownZugriff:
-
In: SPIE Proceedings, 2012-03-29Online unknownZugriff: