Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- bipolar transistors 5 Treffer
- transistors 3 Treffer
- junction transistors 2 Treffer
- <italic xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/math/mathml" xmlns:xlink="http://www.w3.org/1999/xlink" ... 1 Treffer
- artificial intelligence 1 Treffer
-
45 weitere Werte:
- bicmos integrated circuits 1 Treffer
- bipolar junction transistor 1 Treffer
- breakdown voltage 1 Treffer
- broadband communication systems 1 Treffer
- carrier density 1 Treffer
- carrier lifetime (semiconductors) 1 Treffer
- charge collection 1 Treffer
- collimators 1 Treffer
- complementary metal oxide semiconductors 1 Treffer
- complementary sige (c-sige) 1 Treffer
- computer circuits 1 Treffer
- cooling 1 Treffer
- doping agents (chemistry) 1 Treffer
- dose-response relationship in ionizing radiation 1 Treffer
- electric controllers 1 Treffer
- electric power 1 Treffer
- electric resistance 1 Treffer
- electronic amplifiers 1 Treffer
- electronic circuits 1 Treffer
- fermions 1 Treffer
- gain 1 Treffer
- gallium nitride 1 Treffer
- graphene 1 Treffer
- heterojunction bipolar transistors 1 Treffer
- ions 1 Treffer
- kirkendall effect 1 Treffer
- mechanical efficiency 1 Treffer
- microwave devices 1 Treffer
- microwave transistors 1 Treffer
- modeling and simulation 1 Treffer
- modelling 1 Treffer
- performance evaluation 1 Treffer
- radiation 1 Treffer
- radiation hardening 1 Treffer
- radio technology 1 Treffer
- semiconductor doping 1 Treffer
- semiconductor junctions 1 Treffer
- shift registers 1 Treffer
- sige hbt 1 Treffer
- silicon 1 Treffer
- silicon carbide 1 Treffer
- silicon germanium 1 Treffer
- simulation 1 Treffer
- single-event effects (see) 1 Treffer
- single-event transient (set) 1 Treffer
Verlag
Publikation
Sprache
9 Treffer
-
In: Semiconductor Science & Technology, Jg. 32 (2017-04-01), Heft 4, S. 1-1Online academicJournalZugriff:
-
In: Solid-State Electronics, Jg. 47 (2003-09-01), Heft 9, S. 1501-1506academicJournalZugriff:
-
In: Solid-State Electronics, Jg. 36 (1993-06-01), S. 933-935academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), Heft 1, S. 231-238Online academicJournalZugriff:
-
In: International Journal of Electronics, Jg. 99 (2012-04-01), Heft 4, S. 531-542academicJournalZugriff:
-
In: Solid-State Electronics, Jg. 41 (1997-08-01), S. 1133-1138Online academicJournalZugriff:
-
In: Russian Microelectronics, Jg. 36 (2007-11-18), Heft 6, S. 409-414Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 53 (2006-12-01), Heft 6, S. 3223-3231Online academicJournalZugriff:
-
In: Solid-State Electronics, Jg. 39 (1996), S. 101-108Online academicJournalZugriff: