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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- chemical vapor deposition (including plasma-enhanced cvd, mocvd, etc.) 25 Treffer
- depot chimique en phase vapeur (incluant le cvd active par plasma, mocvd, etc.) 25 Treffer
- methodes de depot de films et de revetements; croissance de films et epitaxie 25 Treffer
- methods of deposition of films and coatings; film growth and epitaxy 25 Treffer
- surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) 23 Treffer
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45 weitere Werte:
- surfaces et interfaces; couches minces et trichites (structure et proprietes non electroniques) 23 Treffer
- couche mince 22 Treffer
- thin films 21 Treffer
- depot chimique phase vapeur 20 Treffer
- cvd 18 Treffer
- structure et morphologie de couches minces 13 Treffer
- thin film structure and morphology 13 Treffer
- croissance cristalline en phase vapeur 12 Treffer
- crystal growth from vapors 12 Treffer
- methode pecvd 12 Treffer
- pecvd 12 Treffer
- cristallisation 11 Treffer
- crystallization 11 Treffer
- structure and morphology; thickness 11 Treffer
- structure et morphologie; epaisseur 11 Treffer
- metal transition compose 9 Treffer
- binary compounds 8 Treffer
- compose binaire 8 Treffer
- infrared spectra 8 Treffer
- spectre ir 8 Treffer
- transition element compounds 8 Treffer
- caracterisation 6 Treffer
- caracterizacion 6 Treffer
- characterization 6 Treffer
- condensed matter: electronic structure, electrical, magnetic, and optical properties 6 Treffer
- diffraction rx 6 Treffer
- etat condense: structure electronique, proprietes electriques, magnetiques et optiques 6 Treffer
- oxides 6 Treffer
- oxyde 6 Treffer
- xrd 6 Treffer
- chemical composition 5 Treffer
- chemical preparation 5 Treffer
- composition chimique 5 Treffer
- dopage 5 Treffer
- doping 5 Treffer
- durete 5 Treffer
- fourier transformation 5 Treffer
- hardness 5 Treffer
- mechanical and acoustical properties 5 Treffer
- physical properties of thin films, nonelectronic 5 Treffer
- preparation chimique 5 Treffer
- proprietes mecaniques et acoustiques 5 Treffer
- proprietes physiques non electroniques de couches minces 5 Treffer
- raman spectra 5 Treffer
- silicium 5 Treffer
Publikation
- proceedings of the third international conference on hot-wire cvd (cat-cvd) process, utrecht, the netherlands, august 23-27, 2004 3 Treffer
- proceedings of the thin films and electronic materials and processing sessions from the 14th international vacuum congress, birmingham, uk, 31 august-4 september, 1998 2 Treffer
- proceedings of symposium j on growth and evolution of ultra thin films: surface and interface geometric & electronic structure, of the e-mrs 2002 spring conference, strasbourg, france, june 18-21, 2002 1 Treffer
- proceedings of symposium m on optical and x-ray metrology for advanced device materials characterization, of the e-mrs 2003 spring conference, strasbourg, france, june 10-13, 2003 1 Treffer
- proceedings of the 28th international conference on metallurgical coatings and thin films, san diego, california, april 30-may 4 2001 1 Treffer
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3 weitere Werte:
- proceedings of the 29th international conference on metallurgical coatings and thin films, san diego, ca, usa, april 22-26, 2002 (icmctf2002) 1 Treffer
- proceedings of the 2nd asian conference on chemical vapour deposition, gyeongju, korea, may 28-30, 2001 1 Treffer
- symposium q on thin films 1 Treffer
Sprache
29 Treffer
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In: Proceedings of the Third International Conference on Hot-Wire CVD (Cat-CVD) Process, Utrecht, The Netherlands, August 23-27, 2004, Jg. 501 (2006), Heft 1-2, S. 186-189KonferenzZugriff:
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In: Proceedings of Symposium J on Growth and Evolution of Ultra Thin Films: Surface and Interface Geometric & Electronic Structure, Jg. 428 (2003), Heft 1-2, S. 263-268KonferenzZugriff:
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In: Thin solid films, Jg. 419 (2002), Heft 1-2, S. 54-59academicJournalZugriff:
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In: Proceedings of the Thin Films and Electronic Materials and Processing sessions from the 14th International Vacuum Congress, Birmingham, UK, 31 August-4 September, 1998, Jg. 343-4 (1999), S. 292-294KonferenzZugriff:
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In: Proceedings of the Third International Conference on Hot-Wire CVD (Cat-CVD) Process, Utrecht, The Netherlands, August 23-27, 2004, Jg. 501 (2006), Heft 1-2, S. 338-340KonferenzZugriff:
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In: Thin solid films, Jg. 513 (2006), Heft 1-2, S. 217-222academicJournalZugriff:
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In: Symposium Q on thin films, Jg. 334 (1998), Heft 1-2, S. 6-10KonferenzZugriff:
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In: Proceedings of the 2nd Asian Conference on Chemical Vapour Deposition, Gyeongju, Korea, May 28-30, 2001, Jg. 409 (2002), Heft 1, S. 15-22KonferenzZugriff:
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In: Proceedings of the 29th international conference on metallurgical coatings and thin films, San Diego, CA, USA, April 22-26, 2002 (ICMCTF2002), Jg. 420-21 (2002), S. 371-376KonferenzZugriff:
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In: Proceedings of the 28th International Conference on Metallurgical Coatings and Thin Films, San Diego, California, April 30-May 4 2001, Jg. 398-99 (2001), Heft 1, S. 35-40KonferenzZugriff:
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In: Proceedings of the Thin Films and Electronic Materials and Processing sessions from the 14th International Vacuum Congress, Birmingham, UK, 31 August-4 September, 1998, Jg. 343-4 (1999), S. 632-636KonferenzZugriff:
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In: Thin solid films, Jg. 510 (2006), Heft 1-2, S. 88-94academicJournalZugriff:
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In: Thin solid films, Jg. 496 (2006), Heft 2, S. 698-702academicJournalZugriff:
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In: Thin solid films, Jg. 467 (2004), Heft 1-2, S. 133-139academicJournalZugriff:
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In: Thin solid films, Jg. 466 (2004), Heft 1-2, S. 103-107academicJournalZugriff:
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In: Thin solid films, Jg. 468 (2004), Heft 1-2, S. 79-83academicJournalZugriff:
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In: Thin solid films, Jg. 458 (2004), Heft 1-2, S. 129-136academicJournalZugriff:
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In: Proceedings of Symposium M on Optical and X-Ray Metrology for Advanced Device Materials Characterization, Jg. 450 (2004), Heft 1, S. 134-137KonferenzZugriff:
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In: Thin solid films, Jg. 426 (2003), Heft 1-2, S. 200-204academicJournalZugriff:
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In: Thin solid films, Jg. 413 (2002), Heft 1-2, S. 59-64academicJournalZugriff: