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Weniger Treffer
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Schlagwort
- electronic, optical and magnetic materials 130 Treffer
- surfaces, coatings and films 108 Treffer
- 01 natural sciences 106 Treffer
- 020208 electrical & electronic engineering 105 Treffer
- business 104 Treffer
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45 weitere Werte:
- business.industry 104 Treffer
- cmos 99 Treffer
- 0103 physical sciences 91 Treffer
- atomic and molecular physics, and optics 91 Treffer
- safety, risk, reliability and quality 85 Treffer
- electronic engineering 80 Treffer
- 010302 applied physics 78 Treffer
- law 61 Treffer
- law.invention 61 Treffer
- hardware_integratedcircuits 53 Treffer
- hardware_performanceandreliability 52 Treffer
- engineering 49 Treffer
- computer science 48 Treffer
- electrical engineering 42 Treffer
- materials science 42 Treffer
- hardware_logicdesign 32 Treffer
- instrumentation 30 Treffer
- optoelectronics 30 Treffer
- transistor 26 Treffer
- electronic circuit 25 Treffer
- 020206 networking & telecommunications 24 Treffer
- 020202 computer hardware & architecture 23 Treffer
- voltage 23 Treffer
- materials chemistry 18 Treffer
- metals and alloys 17 Treffer
- reliability (semiconductor) 16 Treffer
- 0104 chemical sciences 14 Treffer
- 010401 analytical chemistry 14 Treffer
- 0210 nano-technology 13 Treffer
- 021001 nanoscience & nanotechnology 13 Treffer
- integrated circuit 13 Treffer
- applied mathematics 12 Treffer
- robustness (computer science) 12 Treffer
- static random-access memory 11 Treffer
- chip 10 Treffer
- electrostatic discharge 9 Treffer
- pmos logic 9 Treffer
- amplifier 8 Treffer
- chemistry 8 Treffer
- spice 8 Treffer
- 010308 nuclear & particles physics 7 Treffer
- 020210 optoelectronics & photonics 7 Treffer
- chemistry.chemical_element 7 Treffer
- cmos process 7 Treffer
- hardware_arithmeticandlogicstructures 7 Treffer
Publikation
- microelectronics reliability 85 Treffer
- sensors and actuators a: physical 17 Treffer
- solid-state electronics 17 Treffer
- measurement 12 Treffer
- microelectronic engineering 5 Treffer
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10 weitere Werte:
- physica b: condensed matter 3 Treffer
- infrared physics & technology 1 Treffer
- international journal of heat and mass transfer 1 Treffer
- international journal of thermal sciences 1 Treffer
- journal of magnetic resonance 1 Treffer
- materials science and engineering: b 1 Treffer
- organic electronics 1 Treffer
- physica c: superconductivity and its applications 1 Treffer
- superlattices and microstructures 1 Treffer
- vacuum 1 Treffer
Sprache
148 Treffer
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In: Microelectronics Reliability, Jg. 98 (2019-07-01), S. 42-48Online unknownZugriff:
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In: Measurement, Jg. 146 (2019-11-01), S. 372-379Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 93 (2019-02-01), S. 98-101Online unknownZugriff:
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In: Microelectronic Engineering, Jg. 200 (2018-11-01), S. 45-50Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 97 (2019-06-01), S. 53-65Online unknownZugriff:
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In: Microelectronics Reliability, 2018-09-01, S. 196-202Online unknownZugriff:
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In: Microelectronics Reliability, 2018-09-01, S. 965-968Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 82 (2018-03-01), S. 100-112Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 81 (2018-02-01), S. 31-40Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 79 (2017-12-01), S. 416-425Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 81 (2018-02-01), S. 101-111Online unknownZugriff:
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In: Microelectronics Reliability, 2017-09-01, S. 680-684Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 85 (2018-06-01), S. 176-189Online unknownZugriff:
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In: Microelectronics Reliability, 2017-09-01, S. 13-24Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 117 (2021-02-01), S. 114038-114038Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 117 (2021-02-01), S. 114036-114036Online unknownZugriff:
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In: Solid-State Electronics, Jg. 129 (2017-03-01), S. 168-174Online unknownZugriff:
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In: Solid-State Electronics, Jg. 129 (2017-03-01), S. 61-65Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 69 (2017-02-01), S. 52-59Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 67 (2016-12-01), S. 74-81Online unknownZugriff: