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In: Microelectronics Reliability, Jg. 75 (2017-08-01), S. 27-36Online unknownZugriff:
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In: Microelectronics Reliability ; volume 75, page 27-36 ; ISSN 0026-2714, 2017academicJournalZugriff:
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In: Journal of Low Temperature Physics, Jg. 210 (2022-10-08), S. 325-333Online unknownZugriff:
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In: Microelectronic Engineering, Jg. 87 (2010-11-01), S. 2234-2240Online unknownZugriff:
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In: Microelectronic Engineering, Jg. 84 (2007-11-01), S. 2491-2500Online unknownZugriff:
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In: Journal of Materials Science: Materials in Electronics, Jg. 17 (2006), S. 27-33Online unknownZugriff:
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In: Microelectronic Engineering, Jg. 76 (2004-10-01), S. 285-289Online unknownZugriff:
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In: Journal of Materials Science: Materials in Electronics, Jg. 14 (2003), S. 247-254Online unknownZugriff:
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In: Journal of Materials Science: Materials in Electronics, Jg. 10 (1999), S. 339-343Online unknownZugriff:
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In: Journal of Materials Science Materials in Electronics, Jg. 5 (1994-06-01), S. 147-152Online unknownZugriff:
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In: Journal of Materials Science: Materials in Electronics, Jg. 10 (1999), S. 209-213Online unknownZugriff:
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In: Hyperfine Interactions, Jg. 54 (1990-07-01), S. 847-851Online unknownZugriff: