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- business 48 Treffer
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- surfaces, coatings and films 34 Treffer
- engineering 27 Treffer
- safety, risk, reliability and quality 27 Treffer
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45 weitere Werte:
- electrical engineering 26 Treffer
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- 01 natural sciences 9 Treffer
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- 02 engineering and technology 9 Treffer
- hardware_integratedcircuits 8 Treffer
- 010302 applied physics 7 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 7 Treffer
- hardware_performanceandreliability 7 Treffer
- robustness (computer science) 7 Treffer
- voltage 7 Treffer
- 020208 electrical & electronic engineering 6 Treffer
- chemistry 6 Treffer
- hardware_logicdesign 6 Treffer
- integrated circuit 6 Treffer
- computer science 5 Treffer
- low-noise amplifier 5 Treffer
- power (physics) 5 Treffer
- amplifier 4 Treffer
- electronic circuit 4 Treffer
- hardware_memorystructures 4 Treffer
- mosfet 4 Treffer
- parasitic capacitance 4 Treffer
- 010308 nuclear & particles physics 3 Treffer
- chemistry.chemical_compound 3 Treffer
- chemistry.chemical_element 3 Treffer
- current (fluid) 3 Treffer
- diode 3 Treffer
- frequency synthesizer 3 Treffer
- inductor 3 Treffer
- microelectronics 3 Treffer
- noise figure 3 Treffer
- physics 3 Treffer
- pmos logic 3 Treffer
- reliability (semiconductor) 3 Treffer
- 020206 networking & telecommunications 2 Treffer
- 0210 nano-technology 2 Treffer
- 021001 nanoscience & nanotechnology 2 Treffer
Verlag
- elsevier bv 31 Treffer
- wiley 18 Treffer
- attuale: elsevier science limited:oxford fulfillment center, po box 800, kidlington oxford ox5 1dx united kingdom:011 44 1865 843000, 011 44 1865 843699, email: asianfo@elsevier.com, tcb@elsevier.co.uk, internet: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, fax: 011 44 1865 843010 precedente: pergamon press., oxford 1 Treffer
- institute of electrical and electronics engineers (ieee) 1 Treffer
- springer science and business media llc 1 Treffer
Publikation
Sprache
54 Treffer
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In: Microwave and Optical Technology Letters, Jg. 63 (2020-08-20), S. 235-241Online unknownZugriff:
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In: Microwave and Optical Technology Letters, Jg. 63 (2020-10-19), S. 2024-2030Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 84 (2018-05-01), S. 20-25Online unknownZugriff:
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In: Microwave and Optical Technology Letters, Jg. 59 (2017-05-16), S. 1750-1755Online unknownZugriff:
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In: Microwave and Optical Technology Letters, Jg. 57 (2015-02-24), S. 830-832Online unknownZugriff:
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In: Microwave and Optical Technology Letters, Jg. 56 (2014-07-22), S. 2456-2458Online unknownZugriff:
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In: Microwave and Optical Technology Letters, Jg. 51 (2009-07-01), S. 1695-1699Online unknownZugriff:
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In: Microwave and Optical Technology Letters, Jg. 50 (2008), S. 1187-1191Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 52 (2012-11-01), S. 2627-2631Online unknownZugriff:
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In: Microwave and Optical Technology Letters, Jg. 51 (2009-06-19), S. 2003-2007Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 51 (2011-08-01), S. 1315-1324Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 49 (2009-06-01), S. 650-659Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 49 (2009), S. 17-25Online unknownZugriff:
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In: Microwave and Optical Technology Letters, Jg. 36 (2003-01-22), S. 270-275Online unknownZugriff:
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In: Optoelectronics Letters, Jg. 4 (2008-11-01), S. 395-398Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 45 (2005-09-01), S. 1311-1316Online unknownZugriff:
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In: Microwave and Optical Technology Letters, Jg. 60 (2018-01-10), S. 528-528Online unknownZugriff:
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In: Microwave and Optical Technology Letters, Jg. 49 (2007-01-26), S. 647-649Online unknownZugriff:
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In: Microwave and Optical Technology Letters, Jg. 36 (2003-02-14), S. 462-465Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 40 (2000-08-01), S. 1437-1442Online unknownZugriff: