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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- electronic, optical and magnetic materials 54 Treffer
- atomic and molecular physics, and optics 29 Treffer
- surfaces, coatings and films 27 Treffer
- business 22 Treffer
- business.industry 22 Treffer
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45 weitere Werte:
- safety, risk, reliability and quality 19 Treffer
- 02 engineering and technology 16 Treffer
- 01 natural sciences 14 Treffer
- materials science 14 Treffer
- engineering 12 Treffer
- computer science 10 Treffer
- electrical engineering 10 Treffer
- 0104 chemical sciences 9 Treffer
- 0210 nano-technology 9 Treffer
- 021001 nanoscience & nanotechnology 9 Treffer
- chemistry 8 Treffer
- instrumentation 8 Treffer
- reliability engineering 8 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 7 Treffer
- energy engineering and power technology 7 Treffer
- 010402 general chemistry 6 Treffer
- materials chemistry 6 Treffer
- metals and alloys 6 Treffer
- 0103 physical sciences 5 Treffer
- analytical chemistry 5 Treffer
- law 5 Treffer
- law.invention 5 Treffer
- reliability (statistics) 5 Treffer
- [chim.coor]chemical sciences/coordination chemistry 4 Treffer
- 020208 electrical & electronic engineering 4 Treffer
- control theory 4 Treffer
- fault (power engineering) 4 Treffer
- line (electrical engineering) 4 Treffer
- [sdv]life sciences [q-bio] 3 Treffer
- 010306 general physics 3 Treffer
- 010401 analytical chemistry 3 Treffer
- 03 medical and health sciences 3 Treffer
- commutation 3 Treffer
- compensation (engineering) 3 Treffer
- electric power system 3 Treffer
- electronic engineering 3 Treffer
- fault current limiter 3 Treffer
- general materials science 3 Treffer
- high-voltage direct current 3 Treffer
- inductance 3 Treffer
- limit (music) 3 Treffer
- nanotechnology 3 Treffer
- spin crossover 3 Treffer
- thyristor 3 Treffer
- voltage source 3 Treffer
Verlag
Publikation
- microelectronics reliability 8 Treffer
- ieee transactions on applied superconductivity 7 Treffer
- physica c: superconductivity and its applications 4 Treffer
- measurement 2 Treffer
- progress in photovoltaics: research and applications 2 Treffer
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23 weitere Werte:
- smart materials and structures 2 Treffer
- ieee journal of quantum electronics 1 Treffer
- ieee microwave and wireless components letters 1 Treffer
- ieee transactions on applied superconductivity ; volume 30, issue 4, page 1-6 ; issn 1051-8223 1558-2515 2378-7074 1 Treffer
- ieee transactions on applied superconductivity ; volume 31, issue 8, page 1-4 ; issn 1051-8223 1558-2515 2378-7074 1 Treffer
- ieee transactions on applied superconductivity ; volume 31, issue 8, page 1-6 ; issn 1051-8223 1558-2515 2378-7074 1 Treffer
- ieee transactions on electromagnetic compatibility ; page 1-14 ; issn 0018-9375 1558-187x 1 Treffer
- ieice electronics express 1 Treffer
- journal of communications technology and electronics 1 Treffer
- journal of materials science: materials in electronics 1 Treffer
- journal of micro/nanolithography, mems, and moems 1 Treffer
- journal of optical communications 1 Treffer
- microelectronics reliability ; volume 15, issue 1, page 18 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 15, issue 6, page 524 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 17, issue 6, page 562 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 20, issue 4, page 539 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 20, issue 4, page 540 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 20, issue 5, page 756 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 22, issue 1, page 133 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 25, issue 3, page 582 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 27, issue 6, page 1036 ; issn 0026-2714 1 Treffer
- microsystem technologies 1 Treffer
- sensors and actuators a: physical 1 Treffer
Sprache
65 Treffer
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In: IEEE Transactions on Applied Superconductivity, Jg. 31 (2021-11-01), S. 1-6Online unknownZugriff:
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In: Journal of Materials Science: Materials in Electronics, Jg. 33 (2022), S. 1489-1502Online unknownZugriff:
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In: IEEE Transactions on Electromagnetic Compatibility ; page 1-14 ; ISSN 0018-9375 1558-187X, 2024Online academicJournalZugriff:
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In: IEEE Transactions on Applied Superconductivity, Jg. 31 (2021-11-01), S. 1-4Online unknownZugriff:
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In: IEEE Transactions on Applied Superconductivity, Jg. 30 (2020-06-01), S. 1-6Online unknownZugriff:
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In: Physica C: Superconductivity and its Applications, Jg. 530 (2016-11-01), S. 160-163Online unknownZugriff:
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In: Physica C: Superconductivity and its Applications, Jg. 518 (2015-11-01), S. 149-153Online unknownZugriff:
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In: Journal of Materials Science: Materials in Electronics ; volume 33, issue 3, page 1489-1502 ; ISSN 0957-4522 1573-482X, 2022academicJournalZugriff:
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In: Physica C: Superconductivity and its Applications, Jg. 518 (2015-11-01), S. 166-170Online unknownZugriff:
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In: IEEE Transactions on Applied Superconductivity ; volume 31, issue 8, page 1-6 ; ISSN 1051-8223 1558-2515 2378-7074, 2021Online academicJournalZugriff:
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In: IEEE Transactions on Applied Superconductivity ; volume 31, issue 8, page 1-4 ; ISSN 1051-8223 1558-2515 2378-7074, 2021Online academicJournalZugriff:
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In: IEEE Transactions on Applied Superconductivity ; volume 30, issue 4, page 1-6 ; ISSN 1051-8223 1558-2515 2378-7074, 2020Online academicJournalZugriff:
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In: IEICE Electronics Express, Jg. 11 (2014), S. 20140711-20140711Online unknownZugriff:
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In: IEEE Transactions on Applied Superconductivity, Jg. 22 (2012-06-01), S. 5801304-5801304Online unknownZugriff:
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In: Physica C: Superconductivity and its Applications ; volume 530, page 160-163 ; ISSN 0921-4534, 2016academicJournalZugriff:
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In: Physica C: Superconductivity and its Applications ; volume 518, page 149-153 ; ISSN 0921-4534, 2015academicJournalZugriff:
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In: Physica C: Superconductivity and its Applications ; volume 518, page 166-170 ; ISSN 0921-4534, 2015academicJournalZugriff:
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In: Microelectronics Reliability, Jg. 17 (1978), S. 25-29Online unknownZugriff:
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In: Microelectronics Reliability ; volume 17, issue 1, page 25-29 ; ISSN 0026-2714, 1978academicJournalZugriff: