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Weniger Treffer
Gefunden in
Schlagwort
- electrical and electronic engineering 65 Treffer
- electronic, optical and magnetic materials 63 Treffer
- materials science 59 Treffer
- optoelectronics 41 Treffer
- materials chemistry 38 Treffer
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45 weitere Werte:
- law 31 Treffer
- law.invention 31 Treffer
- mosfet 29 Treffer
- doping 28 Treffer
- transistor 28 Treffer
- voltage 19 Treffer
- field-effect transistor 15 Treffer
- threshold voltage 15 Treffer
- atomic and molecular physics, and optics 14 Treffer
- surfaces, coatings and films 14 Treffer
- safety, risk, reliability and quality 13 Treffer
- cmos 12 Treffer
- drain-induced barrier lowering 12 Treffer
- equivalent series resistance 12 Treffer
- electric field 11 Treffer
- chemistry 10 Treffer
- hardware_integratedcircuits 10 Treffer
- degradation (geology) 9 Treffer
- gate oxide 9 Treffer
- hardware_performanceandreliability 9 Treffer
- communication channel 8 Treffer
- engineering 8 Treffer
- transconductance 8 Treffer
- chemistry.chemical_compound 7 Treffer
- leakage (electronics) 7 Treffer
- breakdown voltage 6 Treffer
- channel length modulation 6 Treffer
- fabrication 6 Treffer
- integrated circuit 6 Treffer
- noise (electronics) 6 Treffer
- thin-film transistor 6 Treffer
- nmos logic 5 Treffer
- oxide 5 Treffer
- physics 5 Treffer
- stress (mechanics) 5 Treffer
- substrate (electronics) 5 Treffer
- subthreshold conduction 5 Treffer
- 02 engineering and technology 4 Treffer
- capacitance 4 Treffer
- condensed matter::mesoscopic systems and quantum hall effect 4 Treffer
- electrostatic discharge 4 Treffer
- gate voltage 4 Treffer
- hardware_logicdesign 4 Treffer
- high voltage 4 Treffer
- hot-carrier injection 4 Treffer
Verlag
Publikation
- solid-state electronics 33 Treffer
- microelectronics reliability 12 Treffer
- ieee electron device letters 3 Treffer
- ieee transactions on electron devices 3 Treffer
- journal of semiconductors 3 Treffer
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16 weitere Werte:
- journal of display technology 2 Treffer
- 1987 international electron devices meeting 1 Treffer
- 2001 ieee international reliability physics symposium proceedings. 39th annual (cat. no.00ch37167) 1 Treffer
- 2011 international conference on mechatronic science, electric engineering and computer (mec) 1 Treffer
- 2014 26th international conference on microelectronics (icm) 1 Treffer
- acta physica sinica 1 Treffer
- advances in condensed matter physics 1 Treffer
- ieee journal of the electron devices society 1 Treffer
- ieee microwave and wireless components letters 1 Treffer
- ieee transactions on electromagnetic compatibility 1 Treffer
- ieee transactions on semiconductor manufacturing 1 Treffer
- indrastra global 1 Treffer
- international conference on microelectronic test structures 1 Treffer
- journal of electrostatics 1 Treffer
- materials science forum 1 Treffer
- smart structures, devices, and systems 1 Treffer
Sprache
74 Treffer
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In: Solid-State Electronics, Jg. 46 (2002-07-01), S. 965-970Online unknownZugriff:
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In: Solid-State Electronics, Jg. 44 (2000-03-01), S. 487-499Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 38 (1998-12-01), S. 1955-1961Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 39 (1999-06-01), S. 869-874Online unknownZugriff:
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In: IEEE Microwave and Wireless Components Letters, Jg. 17 (2007-06-01), S. 445-447Online unknownZugriff:
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In: Solid-State Electronics, Jg. 38 (1995-02-01), S. 419-424Online unknownZugriff:
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In: Solid-State Electronics, Jg. 37 (1994-12-01), S. 1961-1965Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 37 (1997-10-01), S. 1747-1754Online unknownZugriff:
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In: Solid-State Electronics, Jg. 36 (1993-11-01), S. 1515-1521Online unknownZugriff:
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In: Solid-State Electronics, Jg. 37 (1994-11-01), S. 1853-1862Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 36 (1996-11-01), S. 1707-1710Online unknownZugriff:
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In: Solid-State Electronics, Jg. 33 (1990-08-01), S. 1043-1048Online unknownZugriff:
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In: 2011 International Conference on Mechatronic Science, Electric Engineering and Computer (MEC), 2011-08-01Online unknownZugriff:
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In: 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167), 2002-11-13Online unknownZugriff:
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In: IEEE Transactions on Semiconductor Manufacturing, Jg. 7 (1994), S. 460-462Online unknownZugriff:
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In: Solid-State Electronics, Jg. 37 (1994-12-01), S. 1993-1995Online unknownZugriff:
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In: Journal of Semiconductors, Jg. 32 (2011-11-01), S. 114001-114001Online unknownZugriff:
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In: Acta Physica Sinica, Jg. 56 (2007), S. 1662-1662Online unknownZugriff:
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In: Solid-State Electronics, Jg. 27 (1984), S. 89-96Online unknownZugriff:
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In: Solid-State Electronics, Jg. 28 (1985-10-01), S. 959-965Online unknownZugriff: