Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Schlagwort
- cmos 1.470 Treffer
- electronic engineering 1.295 Treffer
- electrical engineering 1.274 Treffer
- atomic and molecular physics, and optics 791 Treffer
- law 757 Treffer
-
45 weitere Werte:
- law.invention 757 Treffer
- hardware_integratedcircuits 710 Treffer
- materials chemistry 690 Treffer
- surfaces, coatings and films 587 Treffer
- hardware_performanceandreliability 544 Treffer
- voltage 348 Treffer
- safety, risk, reliability and quality 323 Treffer
- transistor 263 Treffer
- hardware_logicdesign 260 Treffer
- amplifier 252 Treffer
- chip 222 Treffer
- 02 engineering and technology 219 Treffer
- optoelectronics 213 Treffer
- integrated circuit 212 Treffer
- electronic circuit 199 Treffer
- instrumentation 199 Treffer
- metals and alloys 198 Treffer
- microwave 187 Treffer
- power (physics) 160 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 159 Treffer
- phase noise 158 Treffer
- noise figure 155 Treffer
- voltage-controlled oscillator 154 Treffer
- low-noise amplifier 142 Treffer
- 01 natural sciences 132 Treffer
- inductor 118 Treffer
- mosfet 117 Treffer
- 020208 electrical & electronic engineering 116 Treffer
- hardware_general 116 Treffer
- 0103 physical sciences 115 Treffer
- dbc 115 Treffer
- reliability (semiconductor) 107 Treffer
- capacitor 103 Treffer
- 010302 applied physics 101 Treffer
- chemistry 93 Treffer
- bandwidth (signal processing) 92 Treffer
- electrostatic discharge 91 Treffer
- industrial and manufacturing engineering 91 Treffer
- capacitance 90 Treffer
- linearity 84 Treffer
- low voltage 81 Treffer
- nmos logic 77 Treffer
- silicon on insulator 75 Treffer
- cmos process 74 Treffer
- wideband 73 Treffer
Verlag
- elsevier bv 657 Treffer
- iop publishing 453 Treffer
- wiley 428 Treffer
- institute of electronics, information and communications engineers (ieice) 134 Treffer
- institute of electrical and electronics engineers (ieee) 87 Treffer
-
26 weitere Werte:
- springer science and business media llc 47 Treffer
- hal ccsd 34 Treffer
- emerald 28 Treffer
- elsevier 14 Treffer
- ieee 13 Treffer
- esd assoc 3 Treffer
- ieee-inst electrical electronics engineers inc 3 Treffer
- informa uk limited 3 Treffer
- springer 3 Treffer
- the electrochemical society 3 Treffer
- attuale: elsevier science limited:oxford fulfillment center, po box 800, kidlington oxford ox5 1dx united kingdom:011 44 1865 843000, 011 44 1865 843699, email: asianfo@elsevier.com, tcb@elsevier.co.uk, internet: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, fax: 011 44 1865 843010 precedente: pergamon press., oxford 2 Treffer
- pleiades publishing ltd 2 Treffer
- aperta 1 Treffer
- arxiv 1 Treffer
- elsevier ltd 1 Treffer
- elsevier science 1 Treffer
- elsevier sequoia, lausanne , svizzera 1 Treffer
- elsevier, new york ;, paesi bassi 1 Treffer
- ieee computer society 1 Treffer
- institute of electronics, information and communication engineers 1 Treffer
- kth, mikro- och nanosystemteknik 1 Treffer
- lulea tekniska universitet, eislab 1 Treffer
- spie 1 Treffer
- springer berlin heidelberg 1 Treffer
- transducer research foundation, inc. 1 Treffer
- 電子情報通信学会 1 Treffer
Publikation
- journal of semiconductors 449 Treffer
- microwave and optical technology letters 422 Treffer
- microelectronics reliability 278 Treffer
- solid-state electronics 195 Treffer
- sensors and actuators a: physical 162 Treffer
-
36 weitere Werte:
- ieice electronics express 135 Treffer
- ieee transactions on semiconductor manufacturing 85 Treffer
- microsystem technologies 41 Treffer
- microelectronics international 28 Treffer
- journal of electrostatics 18 Treffer
- microelectronic engineering 7 Treffer
- indrastra global 4 Treffer
- physica status solidi (a) 4 Treffer
- journal of materials science: materials in electronics 3 Treffer
- journal of the electrochemical society 3 Treffer
- ferroelectrics 2 Treffer
- journal of electronic materials 2 Treffer
- journal of non-crystalline solids 2 Treffer
- journal of physics d: applied physics 2 Treffer
- proceedings of the 7th european symposium on reliability of electron devices, failure physics and analysis 2 Treffer
- russian microelectronics 2 Treffer
- semiconductor science and technology 2 Treffer
- sensors and actuators b: chemical 2 Treffer
- 1993 international symposium on vlsi technology, systems, and applications proceedings of technical papers 1 Treffer
- 2000 solid-state, actuators, and microsystems workshop technical digest 1 Treffer
- 2004 ieee international reliability physics symposium. proceedings 1 Treffer
- 2016 ieee international nanoelectronics conference (inec) 1 Treffer
- advanced functional materials 1 Treffer
- critical reviews in solid state and materials sciences 1 Treffer
- electrical overstress/electrostatic discharge symposium proceedings 1 Treffer
- electrical overstress/electrostatic discharge symposium proceedings 2000 (ieee cat. no.00th8476) 1 Treffer
- icmts 93 proceedings of the 1993 international conference on microelectronic test structures 1 Treffer
- ieee journal of the electron devices society 1 Treffer
- ieee transactions on electron devices 1 Treffer
- infrared physics & technology 1 Treffer
- international conference on microelectronic test structures, 2003. 1 Treffer
- journal of communications technology and electronics 1 Treffer
- laser & photonics reviews 1 Treffer
- physica c: superconductivity 1 Treffer
- proceedings of 35th european solid-state device research conference, 2005. essderc 2005. 1 Treffer
- sensors and actuators. a: physical 1 Treffer
Sprache
1.990 Treffer
-
In: Solid-State Electronics, Jg. 135 (2017-09-01), S. 100-104Online unknownZugriff:
-
In: Solid-State Electronics, Jg. 186 (2021-12-01), S. 108093-108093Online unknownZugriff:
-
In: Solid-State Electronics, Jg. 137 (2017-11-01), S. 128-133Online unknownZugriff:
-
In: Microelectronics Reliability, Jg. 83 (2018-04-01), S. 254-259Online unknownZugriff:
-
In: Microelectronics Reliability, 2017-09-01, S. 680-684Online unknownZugriff:
-
In: Microelectronics Reliability, 2017-09-01, S. 13-24Online unknownZugriff:
-
In: Microsystem Technologies, Jg. 25 (2017-06-01), S. 1571-1583Online unknownZugriff:
-
In: Microelectronics International, Jg. 34 (2017-05-02), S. 91-98Online unknownZugriff:
-
In: Microsystem Technologies, Jg. 24 (2017-04-24), S. 503-510Online unknownZugriff:
-
In: Solid-State Electronics, Jg. 129 (2017-03-01), S. 168-174Online unknownZugriff:
-
In: Microsystem Technologies, Jg. 24 (2017-02-13), S. 299-304Online unknownZugriff:
-
In: Microelectronics Reliability, Jg. 69 (2017-02-01), S. 52-59Online unknownZugriff:
-
In: Microelectronics Reliability, Jg. 67 (2016-12-01), S. 74-81Online unknownZugriff:
-
In: Microsystem Technologies, Jg. 24 (2016-10-18), S. 71-78Online unknownZugriff:
-
In: Solid-State Electronics, Jg. 124 (2016-10-01), S. 28-34Online unknownZugriff:
-
In: Sensors and Actuators A: Physical, Jg. 248 (2016-09-01), S. 281-289Online unknownZugriff:
-
In: Microwave and Optical Technology Letters, Jg. 59 (2017-06-27), S. 2112-2122Online unknownZugriff:
-
In: Microelectronics Reliability, Jg. 73 (2017-06-01), S. 116-121Online unknownZugriff:
-
In: Microelectronics Reliability, Jg. 72 (2017-05-01), S. 90-97Online unknownZugriff:
-
In: Microelectronics Reliability, Jg. 72 (2017-05-01), S. 39-44Online unknownZugriff: