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Weniger Treffer
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- atomic and molecular physics, and optics 8 Treffer
- electrical and electronic engineering 8 Treffer
- electronic, optical and magnetic materials 8 Treffer
- surfaces, coatings and films 8 Treffer
- safety, risk, reliability and quality 4 Treffer
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45 weitere Werte:
- engineering 3 Treffer
- fabrication 3 Treffer
- general chemistry 3 Treffer
- general materials science 3 Treffer
- business 2 Treffer
- business.industry 2 Treffer
- chemistry 2 Treffer
- electronic engineering 2 Treffer
- materials science 2 Treffer
- mechanics of materials 2 Treffer
- resistive touchscreen 2 Treffer
- temperature coefficient 2 Treffer
- 01 natural sciences 1 Treffer
- 0104 chemical sciences 1 Treffer
- 010402 general chemistry 1 Treffer
- 02 engineering and technology 1 Treffer
- 0210 nano-technology 1 Treffer
- 021001 nanoscience & nanotechnology 1 Treffer
- adsorption 1 Treffer
- alloy 1 Treffer
- amorphous solid 1 Treffer
- band-pass filter 1 Treffer
- bioinformatics 1 Treffer
- biomedical engineering 1 Treffer
- capacitance 1 Treffer
- cationic polymerization 1 Treffer
- chelation 1 Treffer
- chemical engineering 1 Treffer
- chemistry.chemical_compound 1 Treffer
- circuit design 1 Treffer
- congo red 1 Treffer
- crystal 1 Treffer
- crystallography 1 Treffer
- electric properties 1 Treffer
- electrical conductor 1 Treffer
- electrical engineering 1 Treffer
- electrical resistivity and conductivity 1 Treffer
- electrode material 1 Treffer
- engineering.material 1 Treffer
- etching 1 Treffer
- focused impedance measurement 1 Treffer
- heavy metal ions 1 Treffer
- hybrid material 1 Treffer
- laboratory test 1 Treffer
- law 1 Treffer
Verlag
Publikation
Sprache
11 Treffer
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In: Microporous and Mesoporous Materials, Jg. 268 (2018-09-01), S. 31-38Online unknownZugriff:
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In: Microporous and Mesoporous Materials ; volume 268, page 31-38 ; ISSN 1387-1811, 2018academicJournalZugriff:
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In: Microelectronics Reliability, Jg. 54 (2014), S. 200-203Online unknownZugriff:
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In: Microelectronics International, Jg. 26 (2009-05-08), S. 24-27Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 45 (2005-12-01), S. 1930-1934Online unknownZugriff:
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In: Microelectronics Reliability ; volume 54, issue 1, page 200-203 ; ISSN 0026-2714, 2014academicJournalZugriff:
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In: Microelectronics International, Jg. 16 (1999-12-01), S. 46-53Online unknownZugriff:
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In: Acta Crystallographica Section E, Jg. 68 (2012-04-01), Heft 4Online unknownZugriff:
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In: Microelectronics International ; volume 26, issue 2, page 24-27 ; ISSN 1356-5362, 2009academicJournalZugriff:
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In: Microelectronics Reliability ; volume 45, issue 12, page 1930-1934 ; ISSN 0026-2714, 2005academicJournalZugriff:
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In: Microelectronics International ; volume 16, issue 3, page 46-53 ; ISSN 1356-5362, 1999academicJournalZugriff: