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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- chemical vapor deposition (including plasma-enhanced cvd, mocvd, etc.) 12 Treffer
- cvd 12 Treffer
- depot chimique en phase vapeur (incluant le cvd active par plasma, mocvd, etc.) 12 Treffer
- depot chimique phase vapeur 12 Treffer
- condensed matter: structure, mechanical and thermal properties 8 Treffer
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45 weitere Werte:
- etat condense: structure, proprietes mecaniques et thermiques 8 Treffer
- semiconductor materials 8 Treffer
- surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) 8 Treffer
- surfaces et interfaces; couches minces et trichites (structure et proprietes non electroniques) 8 Treffer
- binary compounds 7 Treffer
- c si 7 Treffer
- compose binaire 7 Treffer
- couche epitaxique 7 Treffer
- epitaxial layers 7 Treffer
- iii-v semiconductors 7 Treffer
- materiau semiconducteur 7 Treffer
- semiconducteur iii-v 7 Treffer
- sic 7 Treffer
- silicium carbure 7 Treffer
- silicon carbides 7 Treffer
- methode mocvd 6 Treffer
- mocvd 6 Treffer
- condensed matter: electronic structure, electrical, magnetic, and optical properties 5 Treffer
- etat condense: structure electronique, proprietes electriques, magnetiques et optiques 5 Treffer
- gallium nitrides 5 Treffer
- gallium nitrure 5 Treffer
- couche mince 4 Treffer
- ga n 4 Treffer
- gan 4 Treffer
- low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties 4 Treffer
- optical properties 4 Treffer
- optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation 4 Treffer
- photoluminescence 4 Treffer
- propriete optique 4 Treffer
- proprietes optiques, spectroscopie et autres interactions de la matiere condensee avec les particules et le rayonnement 4 Treffer
- structures de basse dimensionnalite (superreseaux, puits quantiques, multicouches): structure et proprietes non electroniques 4 Treffer
- thin films 4 Treffer
- caracterisation 3 Treffer
- caracterizacion 3 Treffer
- characterization 3 Treffer
- chemical composition 3 Treffer
- composition chimique 3 Treffer
- dopage 3 Treffer
- doping 3 Treffer
- indium nitrides 3 Treffer
- indium nitrure 3 Treffer
- morphologie 3 Treffer
- morphology 3 Treffer
- nanomateriaux et nanostructures : fabrication et caracterisation 3 Treffer
- nanoscale materials and structures: fabrication and characterization 3 Treffer
Publikation
Sprache
14 Treffer
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In: Fundamental questions and applications of SiC (Part I), Jg. 202 (1997), Heft 1, S. 305-320Online academicJournalZugriff:
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In: Fundamental questions and applications of SiC (Part I), Jg. 202 (1997), Heft 1, S. 281-304Online academicJournalZugriff:
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In: Fundamental questions and applications of SiC (Part I), Jg. 202 (1997), Heft 1, S. 529-548Online academicJournalZugriff:
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In: Fundamental questions and applications of SiC (Part I), Jg. 202 (1997), Heft 1, S. 321-334Online academicJournalZugriff:
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In: Proceedings (Part B.1) of the Fourth International Conference on Nitride Semiconductors, ICNS-4, Denver, Colorado, USA, July 16-20, 2001, Jg. 228 (2001), Heft 1, S. 187-190Online KonferenzZugriff:
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In: Proceedings (Part B.1) of the Fourth International Conference on Nitride Semiconductors, ICNS-4, Denver, Colorado, USA, July 16-20, 2001, Jg. 228 (2001), Heft 1, S. 165-168Online KonferenzZugriff:
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In: Proceedings (Part B.1) of the Fourth International Conference on Nitride Semiconductors, ICNS-4, Denver, Colorado, USA, July 16-20, 2001, Jg. 228 (2001), Heft 1, S. 191-194Online KonferenzZugriff:
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In: Proceedings (Part B.1) of the Fourth International Conference on Nitride Semiconductors, ICNS-4, Denver, Colorado, USA, July 16-20, 2001, Jg. 228 (2001), Heft 1, S. 315-318Online KonferenzZugriff:
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In: Proceedings (Part B.1) of the Fourth International Conference on Nitride Semiconductors, ICNS-4, Denver, Colorado, USA, July 16-20, 2001, Jg. 228 (2001), Heft 1, S. 31-34Online KonferenzZugriff:
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In: Proceedings (Part B.1) of the Fourth International Conference on Nitride Semiconductors, ICNS-4, Denver, Colorado, USA, July 16-20, 2001, Jg. 228 (2001), Heft 1, S. 161-164Online KonferenzZugriff:
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In: Proceedings (Part B.1) of the Fourth International Conference on Nitride Semiconductors, ICNS-4, Denver, Colorado, USA, July 16-20, 2001, Jg. 228 (2001), Heft 1, S. 263-267Online KonferenzZugriff:
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In: Fundamental questions and applications of SiC (Part I), Jg. 202 (1997), Heft 1, S. 247-262Online academicJournalZugriff:
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In: Physica status solidi. B. Basic research, Jg. 202 (1997), Heft 1Online unknownZugriff:
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In: Fundamental questions and applications of SiC (Part I), Jg. 202 (1997), Heft 1, S. 379-404Online academicJournalZugriff: