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- frequency-domain analysis 1 Treffer
- gain 1 Treffer
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- insertion loss 1 Treffer
- integrated circuit noise 1 Treffer
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- integrated circuits 1 Treffer
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- metal-insulator-semiconductor devices 1 Treffer
- metals 1 Treffer
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- monolithic microwave integrated circuits 1 Treffer
- noise measurement 1 Treffer
- power amplifier 1 Treffer
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- propagation losses 1 Treffer
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- reflection coefficient 1 Treffer
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In: IEEE Transactions on Components, Packaging & Manufacturing Technology, Jg. 2 (2012-12-15), Heft 5, S. 847-851Online academicJournalZugriff:
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In: IEEE Transactions on Microwave Theory & Techniques, Jg. 44 (1996-12-02), Heft 12, S. 2487-2494Online academicJournalZugriff:
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In: IEEE Transactions on Microwave Theory & Techniques, Jg. 44 (1996-12-02), Heft 12, S. 2375-2378Online academicJournalZugriff:
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In: IEEE Transactions on Circuits & Systems. Part I: Regular Papers, Jg. 59 (2012-08-01), Heft 8, S. 1680-1693Online serialPeriodicalZugriff: