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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- cvd 19 Treffer
- materials science 19 Treffer
- science des materiaux 19 Treffer
- condensed matter: structure, mechanical and thermal properties 18 Treffer
- depot chimique phase vapeur 18 Treffer
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45 weitere Werte:
- etat condense: structure, proprietes mecaniques et thermiques 18 Treffer
- methodes de depot de films et de revetements; croissance de films et epitaxie 18 Treffer
- methods of deposition of films and coatings; film growth and epitaxy 18 Treffer
- chimie generale, chimie physique 17 Treffer
- general chemistry, physical chemistry 17 Treffer
- chemical vapor deposition (including plasma-enhanced cvd, mocvd, etc.) 16 Treffer
- compose mineral 16 Treffer
- depot chimique en phase vapeur (incluant le cvd active par plasma, mocvd, etc.) 16 Treffer
- inorganic compounds 15 Treffer
- croissance film 13 Treffer
- film growth 13 Treffer
- condensed matter: electronic structure, electrical, magnetic, and optical properties 12 Treffer
- etat condense: structure electronique, proprietes electriques, magnetiques et optiques 12 Treffer
- surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) 11 Treffer
- surfaces et interfaces; couches minces et trichites (structure et proprietes non electroniques) 11 Treffer
- etude experimentale 10 Treffer
- experimental study 10 Treffer
- cristallographie cristallogenese 9 Treffer
- crystallography 9 Treffer
- methode mocvd 9 Treffer
- mocvd 9 Treffer
- structure et morphologie de couches minces 9 Treffer
- thin film structure and morphology 9 Treffer
- electronics 8 Treffer
- electronique 8 Treffer
- metal transition compose 7 Treffer
- transition element compounds 7 Treffer
- xrd 7 Treffer
- atomic force microscopy 6 Treffer
- diffraction rx 6 Treffer
- microscopie force atomique 6 Treffer
- iii-v semiconductors 5 Treffer
- optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation 5 Treffer
- proprietes optiques, spectroscopie et autres interactions de la matiere condensee avec les particules et le rayonnement 5 Treffer
- semiconducteur iii-v 5 Treffer
- spectre photoelectron rx 5 Treffer
- structure and morphology; thickness 5 Treffer
- structure et morphologie; epaisseur 5 Treffer
- structure surface 5 Treffer
- surface structure 5 Treffer
- x-ray photoelectron spectra 5 Treffer
- zinc oxides 5 Treffer
- zinc oxyde 5 Treffer
- zno 5 Treffer
- composition and phase identification 4 Treffer
Publikation
- surface and interface analysis 16 Treffer
- physica status solidi. b. basic research 8 Treffer
- proceedings (part b.1) of the fourth international conference on nitride semiconductors, icns-4, denver, colorado, usa, july 16-20, 2001 4 Treffer
- proceedings of the 48th international field emission symposium, 8-11 july 2002, lyon, france 2 Treffer
- wide band gap ii-vi semiconductors: growth, characterization and applications, warsaw, 4-8 september 2006 2 Treffer
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5 weitere Werte:
- 5th international conference on nitride semiconductors (icns-5), nara, japan, 25-30 may 2003 1 Treffer
- chemphyschem (print) 1 Treffer
- ecasia 99, sevilla, spain, 4-8 october 1999 1 Treffer
- international journal of applied glass science (print) 1 Treffer
- papers presented at ecasia '03, proceedings of the 10th european conference on applications of surface and interface analysis, 5-10 october 2003, berlin, germany 1 Treffer
Sprache
26 Treffer
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In: Proceedings of the 48th International Field Emission Symposium, 8-11 July 2002, Lyon, France, Jg. 36 (2004), Heft 5-6, S. 465-469Online KonferenzZugriff:
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In: Proceedings of the 48th International Field Emission Symposium, 8-11 July 2002, Lyon, France, Jg. 36 (2004), Heft 5-6, S. 481-484Online KonferenzZugriff:
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In: Surface and interface analysis, Jg. 38 (2006), Heft 7, S. 1122-1129Online academicJournalZugriff:
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In: Surface and interface analysis, Jg. 11 (1988), Heft 10, S. 517-521Online academicJournalZugriff:
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In: Wide band gap II-VI semiconductors: growth, characterization and applications, Warsaw, 4-8 September 2006, Jg. 244 (2007), Heft 5, S. 1512-1516Online KonferenzZugriff:
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In: Surface and interface analysis, Jg. 38 (2006), Heft 1, S. 1-5Online academicJournalZugriff:
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In: Physica status solidi. B. Basic research, Jg. 241 (2004), Heft 3, S. 676-679Online KonferenzZugriff:
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In: 5th International Conference on Nitride Semiconductors (ICNS-5), Nara, Japan, 25-30 May 2003, Jg. 240 (2003), Heft 2, S. 404-407Online KonferenzZugriff:
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In: Proceedings (Part B.1) of the Fourth International Conference on Nitride Semiconductors, ICNS-4, Denver, Colorado, USA, July 16-20, 2001, Jg. 228 (2001), Heft 1, S. 165-168Online KonferenzZugriff:
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In: Proceedings (Part B.1) of the Fourth International Conference on Nitride Semiconductors, ICNS-4, Denver, Colorado, USA, July 16-20, 2001, Jg. 228 (2001), Heft 1, S. 315-318Online KonferenzZugriff:
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In: Proceedings (Part B.1) of the Fourth International Conference on Nitride Semiconductors, ICNS-4, Denver, Colorado, USA, July 16-20, 2001, Jg. 228 (2001), Heft 1, S. 161-164Online KonferenzZugriff:
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In: Proceedings (Part B.1) of the Fourth International Conference on Nitride Semiconductors, ICNS-4, Denver, Colorado, USA, July 16-20, 2001, Jg. 228 (2001), Heft 1, S. 263-267Online KonferenzZugriff:
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In: Surface and interface analysis, Jg. 44 (2012), Heft 3, S. 265-269Online academicJournalZugriff:
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In: ECASIA 99, Sevilla, Spain, 4-8 October 1999, Jg. 30 (2000), Heft 1, S. 603-606Online KonferenzZugriff:
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In: ChemPhysChem (Print), Jg. 12 (2011), Heft 18, S. 3524-3528Online academicJournalZugriff:
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In: Surface and interface analysis, Jg. 42 (2010), Heft 12-13, S. 1702-1705Online academicJournalZugriff:
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In: Surface and interface analysis, Jg. 41 (2009), Heft 1, S. 44-48Online academicJournalZugriff:
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In: Surface and interface analysis, Jg. 41 (2009), Heft 7, S. 615-623Online academicJournalZugriff:
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In: Wide band gap II-VI semiconductors: growth, characterization and applications, Warsaw, 4-8 September 2006, Jg. 244 (2007), Heft 5, S. 1451-1457Online KonferenzZugriff:
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In: Papers presented at ECASIA '03, Proceedings of the 10th European Conference on Applications of Surface and Interface Analysis, 5-10 October 2003, Berlin, Germany, Jg. 36 (2004), Heft 8, S. 1151-1154Online KonferenzZugriff: