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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- complementary mos technology 12 Treffer
- technologie mos complementaire 12 Treffer
- tecnologia mos complementario 12 Treffer
- circuits integres 9 Treffer
- conception. technologies. analyse fonctionnement. essais 9 Treffer
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45 weitere Werte:
- design. technologies. operation analysis. testing 9 Treffer
- integrated circuits 9 Treffer
- fiabilidad 8 Treffer
- fiabilite 8 Treffer
- nmos technology 8 Treffer
- reliability 8 Treffer
- technologie nmos 8 Treffer
- tecnologia nmos 8 Treffer
- circuits electriques, optiques et optoelectroniques 7 Treffer
- damaging 7 Treffer
- deterioracion 7 Treffer
- electric, optical and optoelectronic circuits 7 Treffer
- endommagement 7 Treffer
- circuit properties 6 Treffer
- circuits electroniques 6 Treffer
- electronic circuits 6 Treffer
- proprietes des circuits 6 Treffer
- corriente rejilla 5 Treffer
- courant grille 5 Treffer
- evaluacion prestacion 5 Treffer
- evaluation performance 5 Treffer
- gate current 5 Treffer
- performance evaluation 5 Treffer
- corriente escape 4 Treffer
- courant fuite 4 Treffer
- epaisseur 4 Treffer
- espesor 4 Treffer
- leakage current 4 Treffer
- n type semiconductor 4 Treffer
- semiconducteur type n 4 Treffer
- semiconductor tipo n 4 Treffer
- thickness 4 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 3 Treffer
- circuit simulation 3 Treffer
- cmos 3 Treffer
- electronic equipment and fabrication. passive components, printed wiring boards, connectics 3 Treffer
- mos technology 3 Treffer
- simulation circuit 3 Treffer
- technologie mos 3 Treffer
- tecnologia mos 3 Treffer
- 1/f noise 2 Treffer
- bipolar transistor 2 Treffer
- bruit basse frequence 2 Treffer
- bruit grenaille 2 Treffer
- caracteristica transferencia 2 Treffer
Verlag
Publikation
- i.e.e.e. transactions on electron devices 3 Treffer
- ieee electron device letters 2 Treffer
- 12th workshop on dielectrics in microelectronics (grenoble, 18-20 november 2002) 1 Treffer
- 17th european symposium on reliability of electron devices, failure physics and analysis (esref 2006), wuppertal, germany, 3-6 october 2006 1 Treffer
- 2002 ieee radio frequency integrated circuits (rfic) symposium (seattle wa, 2-4 june 2002, digest of papers) 1 Treffer
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10 weitere Werte:
- 2004 ieee international reliability physics symposium proceedings, 42nd annual (phoenix az, 25-29 april 2004) 1 Treffer
- advanced gate stack, source/drain and channel engineering for si-based cmos : naw materials, processes, and equipment (quebec pq, 16-18 may 2005) 1 Treffer
- digest of papers - ieee radio frequency integrated circuits symposium 1 Treffer
- icmts 2002 : proceedings of the 2002 international conference on microelectronic test structures (cork, 4-11 april 2002) 1 Treffer
- ieee transactions on device and materials reliability 1 Treffer
- microelectronic engineering 1 Treffer
- microelectronics and reliability 1 Treffer
- proceedings - electrochemical society 1 Treffer
- semiconductor science and technology 1 Treffer
- solid-state electronics 1 Treffer
Sprache
15 Treffer
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In: I.E.E.E. transactions on electron devices, Jg. 58 (2011), Heft 8, S. 2466-2472Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 53 (2006), Heft 8, S. 1815-1820Online academicJournalZugriff:
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In: IEEE electron device letters, Jg. 32 (2011), Heft 6, S. 728-730Online academicJournalZugriff:
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In: 17th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2006), Wuppertal, Germany, 3-6 October 2006, Jg. 46 (2006), Heft 9-11, S. 1669-1672KonferenzZugriff:
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In: IEEE transactions on device and materials reliability, Jg. 3 (2003), Heft 3, S. 79-84Online academicJournalZugriff:
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In: 2004 IEEE international reliability physics symposium proceedings, 42nd annual (Phoenix AZ, 25-29 April 2004), 2004, S. 605-606KonferenzZugriff:
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In: 12th workshop on dielectrics in microelectronics (Grenoble, 18-20 November 2002), 2003, S. 205-208KonferenzZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 55 (2008), Heft 4, S. 997-1004Online academicJournalZugriff:
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In: Microelectronic engineering, Jg. 84 (2007), Heft 1, S. 31-36academicJournalZugriff:
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In: IEEE electron device letters, Jg. 26 (2005), Heft 6, S. 390-393Online academicJournalZugriff:
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In: Semiconductor science and technology, Jg. 25 (2010), Heft 11Online academicJournalZugriff:
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In: Advanced gate stack, source/drain and channel engineering for Si-based CMOS : naw materials, processes, 2005, S. 151-160KonferenzZugriff:
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In: ICMTS 2002 : proceedings of the 2002 international conference on microelectronic test structures (Cork, 4-11 April 2002), 2002, S. 229-234KonferenzZugriff:
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In: 2002 IEEE radio frequency integrated circuits (RFIC) symposium (Seattle WA, 2-4 June 2002, digest of papers), 2002, S. 59-62KonferenzZugriff:
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In: Solid-state electronics, Jg. 75 (2012), S. 22-27academicJournalZugriff: