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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- condensed matter: structure, mechanical and thermal properties 27 Treffer
- etat condense: structure, proprietes mecaniques et thermiques 27 Treffer
- condensed matter: electronic structure, electrical, magnetic, and optical properties 22 Treffer
- etat condense: structure electronique, proprietes electriques, magnetiques et optiques 22 Treffer
- materials science 19 Treffer
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45 weitere Werte:
- science des materiaux 19 Treffer
- methodes de depot de films et de revetements; croissance de films et epitaxie 17 Treffer
- methods of deposition of films and coatings; film growth and epitaxy 17 Treffer
- chemical vapor deposition (including plasma-enhanced cvd, mocvd, etc.) 16 Treffer
- compose mineral 16 Treffer
- depot chimique en phase vapeur (incluant le cvd active par plasma, mocvd, etc.) 16 Treffer
- inorganic compounds 16 Treffer
- couche mince 11 Treffer
- spectre photoelectron rx 11 Treffer
- thin films 11 Treffer
- x-ray photoelectron spectra 11 Treffer
- c 10 Treffer
- atomic force microscopy 8 Treffer
- microscopie force atomique 8 Treffer
- carbon 7 Treffer
- carbon nanotubes 7 Treffer
- carbone 7 Treffer
- metal transition compose 7 Treffer
- nanotube carbone 7 Treffer
- structure surface 7 Treffer
- surface structure 7 Treffer
- surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) 7 Treffer
- surfaces et interfaces; couches minces et trichites (structure et proprietes non electroniques) 7 Treffer
- transition element compounds 7 Treffer
- diamant 6 Treffer
- diamonds 6 Treffer
- microscopie electronique balayage 6 Treffer
- scanning electron microscopy 6 Treffer
- silicium 6 Treffer
- silicon 6 Treffer
- structure and morphology; thickness 6 Treffer
- structure et morphologie de couches minces 6 Treffer
- structure et morphologie; epaisseur 6 Treffer
- thin film structure and morphology 6 Treffer
- emission champ 5 Treffer
- field emission 5 Treffer
- metal transition 5 Treffer
- microstructure 5 Treffer
- si 5 Treffer
- transition elements 5 Treffer
- xps 5 Treffer
- annealing 4 Treffer
- binary compounds 4 Treffer
- chemical vapor deposition 4 Treffer
- compose binaire 4 Treffer
Publikation
- surface and interface analysis 34 Treffer
- proceedings of the 48th international field emission symposium, 8-11 july 2002, lyon, france 6 Treffer
- papers presented at ecasia '03, proceedings of the 10th european conference on applications of surface and interface analysis, 5-10 october 2003, berlin, germany 4 Treffer
- advanced materials (weinheim) 2 Treffer
- ecasia'01: proceedings of the 9th european conference on applications of surface and interface analysis, 30th september-5th october 2001, avignon, france 2 Treffer
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5 weitere Werte:
- 5th international symposium on atomic level characterizations for new materials and devices (alc'05) 1 Treffer
- applied organometallic chemistry 1 Treffer
- ecasia 99, sevilla, spain, 4-8 october 1999 1 Treffer
- papers presented at ecasia'05: proceedings of the 11th european conference on applications of surface and interface analysis, 25-30 september 2005, vienna, austria 1 Treffer
- thin film processing by chemical vapour deposition 1 Treffer
37 Treffer
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In: Papers presented at ECASIA '03, Proceedings of the 10th European Conference on Applications of Surface and Interface Analysis, 5-10 October 2003, Berlin, Germany, Jg. 36 (2004), Heft 8, S. 1181-1184Online KonferenzZugriff:
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In: Surface and interface analysis, Jg. 44 (2012), Heft 10, S. 1319-1323Online academicJournalZugriff:
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In: ECASIA'01: proceedings of the 9th European conference on applications of surface and interface analysis, 30th September-5th October 2001, Avignon, France, Jg. 34 (2002), Heft 1, S. 703-707Online KonferenzZugriff:
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In: Proceedings of the 48th International Field Emission Symposium, 8-11 July 2002, Lyon, France, Jg. 36 (2004), Heft 5-6, S. 465-469Online KonferenzZugriff:
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In: Surface and interface analysis, Jg. 38 (2006), Heft 7, S. 1122-1129Online academicJournalZugriff:
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In: Surface and interface analysis, Jg. 37 (2005), Heft 3, S. 310-315Online academicJournalZugriff:
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In: Advanced materials (Weinheim), Jg. 9 (1997), Heft 14, S. 311-317Online academicJournalZugriff:
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In: 5th International symposium on Atomic Level Characterizations for new materials and devices (ALC'05), Jg. 38 (2006), Heft 12-13, S. 1692-1695Online KonferenzZugriff:
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In: Papers presented at ECASIA'05: Proceedings of the 11th European Conference on Applications of Surface and Interface Analysis, 25-30 September 2005, Vienna, Austria, Jg. 38 (2006), Heft 4, S. 422-425Online KonferenzZugriff:
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In: Surface and interface analysis, Jg. 38 (2006), Heft 1, S. 1-5Online academicJournalZugriff:
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In: Proceedings of the 48th International Field Emission Symposium, 8-11 July 2002, Lyon, France, Jg. 36 (2004), Heft 5-6, S. 493-496Online KonferenzZugriff:
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In: Proceedings of the 48th International Field Emission Symposium, 8-11 July 2002, Lyon, France, Jg. 36 (2004), Heft 5-6, S. 489-492Online KonferenzZugriff:
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In: Surface and interface analysis, Jg. 45 (2013), Heft 4, S. 800-804Online academicJournalZugriff:
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In: ECASIA'01: proceedings of the 9th European conference on applications of surface and interface analysis, 30th September-5th October 2001, Avignon, France, Jg. 34 (2002), Heft 1, S. 681-685Online KonferenzZugriff:
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In: Surface and interface analysis, Jg. 44 (2012), Heft 4, S. 456-465Online academicJournalZugriff:
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In: ECASIA 99, Sevilla, Spain, 4-8 October 1999, Jg. 30 (2000), Heft 1, S. 603-606Online KonferenzZugriff:
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In: Surface and interface analysis, Jg. 43 (2011), Heft 5, S. 865-868Online academicJournalZugriff:
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In: Surface and interface analysis, Jg. 41 (2009), Heft 1, S. 44-48Online academicJournalZugriff:
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In: Surface and interface analysis, Jg. 41 (2009), Heft 7, S. 615-623Online academicJournalZugriff:
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In: Surface and interface analysis, Jg. 41 (2009), Heft 7, S. 602-609Online academicJournalZugriff: