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Weniger Treffer
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Schlagwort
- etude experimentale 2 Treffer
- experimental study 2 Treffer
- 68.66.hb 1 Treffer
- 78.67.hc 1 Treffer
- 81.15.gh 1 Treffer
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45 weitere Werte:
- 8460j 1 Treffer
- al ga n 1 Treffer
- algan 1 Treffer
- aluminium nitrides 1 Treffer
- aluminium nitrure 1 Treffer
- antireflection coatings 1 Treffer
- atomic force microscopy 1 Treffer
- band structure 1 Treffer
- binary compounds 1 Treffer
- campo interno 1 Treffer
- cellule solaire 1 Treffer
- champ interne 1 Treffer
- cinetique 1 Treffer
- compose binaire 1 Treffer
- compose ternaire 1 Treffer
- confinement 1 Treffer
- correlation 1 Treffer
- correlations 1 Treffer
- couche mince 1 Treffer
- cross-disciplinary physics: materials science; rheology 1 Treffer
- densite 1 Treffer
- density 1 Treffer
- dependance temperature 1 Treffer
- diffusion length 1 Treffer
- digital simulation 1 Treffer
- domaines interdisciplinaires: science des materiaux; rheologie 1 Treffer
- effet champ electrique 1 Treffer
- electric field effects 1 Treffer
- elemental semiconductors 1 Treffer
- elipsometria espectroscopica 1 Treffer
- ellipsometrie spectroscopique 1 Treffer
- exciton 1 Treffer
- excitons 1 Treffer
- ga n 1 Treffer
- gallium nitrides 1 Treffer
- gallium nitrure 1 Treffer
- gan 1 Treffer
- ge 1 Treffer
- germanium 1 Treffer
- iii-v semiconductors 1 Treffer
- internal field 1 Treffer
- kinetics 1 Treffer
- longueur diffusion(transport) 1 Treffer
- materials science 1 Treffer
- methode mocvd 1 Treffer
Publikation
- proceedings of symposium f on thin film and nanostructured materials for photovoltaics, emrs 2005 conference, strasbourg, france, may 31-june 3, 2005 1 Treffer
- proceedings of symposium m on optical and x-ray metrology for advanced device materials characterization, of the e-mrs 2003 spring conference, strasbourg, france, june 10-13, 2003 1 Treffer
Sprache
3 Treffer
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In: Proceedings of Symposium F on Thin Film and Nanostructured Materials for Photovoltaics, EMRS 2005 Conference, Strasbourg, France, May 31-June 3, Jg. 511-12 (2006), S. 103-107KonferenzZugriff:
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In: Proceedings of Symposium M on Optical and X-Ray Metrology for Advanced Device Materials Characterization, Jg. 450 (2004), Heft 1, S. 75-78KonferenzZugriff:
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In: Thin solid films, Jg. 479 (2005), Heft 1-2, S. 113-120academicJournalZugriff: