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- cmos image sensors 4 Treffer
- image sensors 4 Treffer
- logic gates 4 Treffer
- irradiation 3 Treffer
- total ionizing dose (tid) 3 Treffer
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45 weitere Werte:
- activation energy 2 Treffer
- annealing 2 Treffer
- cis 2 Treffer
- cmos image sensor (cis) 2 Treffer
- complementary metal oxide semiconductors 2 Treffer
- current measurement 2 Treffer
- ionizing radiation dosage 2 Treffer
- layout 2 Treffer
- pinned photodiode (ppd) 2 Treffer
- protons 2 Treffer
- radiation hardening 2 Treffer
- radiation hardening (electronics) 2 Treffer
- shallow trench isolation (sti) 2 Treffer
- silicon 2 Treffer
- spectrometry 2 Treffer
- traps 2 Treffer
- active pixel sensors (aps) 1 Treffer
- analog-to-digital converters 1 Treffer
- charge transfer 1 Treffer
- clusters 1 Treffer
- cmos 1 Treffer
- cmos image sensors (ciss) 1 Treffer
- dark current distribution 1 Treffer
- degradation 1 Treffer
- detectors 1 Treffer
- displacement damage dose 1 Treffer
- drain 1 Treffer
- gamma 1 Treffer
- gamma rays 1 Treffer
- image color analysis 1 Treffer
- integrated circuit 1 Treffer
- interface states 1 Treffer
- ionization 1 Treffer
- ionizing radiation 1 Treffer
- ions 1 Treffer
- leakage current 1 Treffer
- manufacturing processes 1 Treffer
- monolithic active pixel sensor (maps) 1 Treffer
- mosfet 1 Treffer
- neutrons 1 Treffer
- niel 1 Treffer
- point defects 1 Treffer
- quantum efficiency 1 Treffer
- rad hard 1 Treffer
- radiation damage 1 Treffer
Sprache
6 Treffer
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 45-53Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 66 (2019), Heft 1, S. 111-119Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 27-37Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 63 (2016-08-01), Heft a4, S. 2183-2192Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 59 (2012-04-15), Heft 4, S. 918-926Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 61 (2014-02-20), Heft 1, S. 636-645Online academicJournalZugriff: