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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- complementary mos technology 119 Treffer
- technologie mos complementaire 119 Treffer
- tecnologia mos complementario 119 Treffer
- evaluacion prestacion 53 Treffer
- evaluation performance 53 Treffer
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45 weitere Werte:
- performance evaluation 53 Treffer
- reliability 53 Treffer
- fiabilidad 52 Treffer
- fiabilite 52 Treffer
- seuil tension 35 Treffer
- umbral tension 35 Treffer
- voltage threshold 35 Treffer
- hot carrier 33 Treffer
- portador caliente 33 Treffer
- porteur chaud 33 Treffer
- contrainte electrique 32 Treffer
- electric stress 32 Treffer
- tension electrica 32 Treffer
- contrainte thermique 31 Treffer
- tension termica 31 Treffer
- thermal stress 31 Treffer
- grille transistor 30 Treffer
- rejilla transistor 30 Treffer
- transistor gate 30 Treffer
- circuits electriques, optiques et optoelectroniques 28 Treffer
- electric, optical and optoelectronic circuits 28 Treffer
- nmos technology 28 Treffer
- pmos technology 28 Treffer
- technologie nmos 28 Treffer
- technologie pmos 28 Treffer
- tecnologia nmos 28 Treffer
- tecnologia pmos 28 Treffer
- degradation 27 Treffer
- silicon on insulator technology 27 Treffer
- technologie silicium sur isolant 27 Treffer
- tecnologia silicio sobre aislante 27 Treffer
- circuit properties 25 Treffer
- gate oxide 25 Treffer
- oxido rejilla 25 Treffer
- oxyde grille 25 Treffer
- proprietes des circuits 25 Treffer
- degradacion 23 Treffer
- circuits electroniques 21 Treffer
- cmos integrated circuits 21 Treffer
- electronic circuits 21 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 20 Treffer
- circuit integre cmos 20 Treffer
- electronic equipment and fabrication. passive components, printed wiring boards, connectics 20 Treffer
- couche ultramince 19 Treffer
- dual gate transistor 19 Treffer
Verlag
- institute of electrical and electronics engineers 61 Treffer
- elsevier 18 Treffer
- elsevier science 16 Treffer
- ieee 16 Treffer
- oxford university press 5 Treffer
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11 weitere Werte:
- ieee society 4 Treffer
- business center for academic societies 3 Treffer
- institute of physics 3 Treffer
- electrochemical society 2 Treffer
- ieee computer society 2 Treffer
- springer 2 Treffer
- american scientific publishers 1 Treffer
- institution of electrical engineers 1 Treffer
- institution of engineering and technology 1 Treffer
- kluwer academic publishers 1 Treffer
- spie 1 Treffer
Publikation
- i.e.e.e. transactions on electron devices 35 Treffer
- microelectronic engineering 13 Treffer
- microelectronics and reliability 13 Treffer
- ieee electron device letters 10 Treffer
- solid-state electronics 7 Treffer
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40 weitere Werte:
- ieice transactions on electronics 5 Treffer
- 2004 ieee international integrated reliability workshop (final report) 4 Treffer
- 2004 ieee international reliability physics symposium proceedings, 42nd annual (phoenix az, 25-29 april 2004) 4 Treffer
- ieee microwave and wireless components letters 4 Treffer
- ieee transactions on microwave theory and techniques 4 Treffer
- 2004 symposium on vlsi technology (digest of technical papers) 3 Treffer
- ieee transactions on nanotechnology 3 Treffer
- infos 2005: proceedings of the 14th biennal conference on insulating films on semiconductors, june 22-24, 2005, leuven, belgium 3 Treffer
- journal of computational electronics (print) 3 Treffer
- semiconductor science and technology 3 Treffer
- 17th european symposium on reliability of electron devices, failure physics and analysis (esref 2006), wuppertal, germany, 3-6 october 2006 2 Treffer
- 17th international conference on vlsi design (concurrently with the 3rd international conference on embedded systems design) 2 Treffer
- 2004 ieee international soi conference (charleston sc, 4-7 october 2004) 2 Treffer
- 3rd international sige technology and device meeting (princeton, new jersey, 15-17 may 2006) 2 Treffer
- electronics letters 2 Treffer
- ieee international electron devices meeting 2004 (iedm technical digest) 2 Treffer
- ieee journal of solid-state circuits 2 Treffer
- ieee transactions on very large scale integration (vlsi) systems 2 Treffer
- proceedings - electrochemical society 2 Treffer
- proceedings of the 11th international symposium on the physical & failure analysis of integrated circuits (ipfa 2004) 2 Treffer
- reliability of electron devices, failure physics and analysis 2 Treffer
- 14th workshop on dielectrics in microelectronics (wodim 2006) 1 Treffer
- 16th european symposium on reliability of electron devices, failure physics and analysis (esref 2005), arcachon, france, october 10-14, 2005 1 Treffer
- 2004 24th internationcal conference on microelectronics (nis, serbia and montenegro, 16-19 may 20) 1 Treffer
- 2004 international conference on microelectronic test structures (march 22-25, 2004, awaji yumebutai international conference center, japan) 1 Treffer
- 2005 ulis conference. selected papers 1 Treffer
- 2006 symposium on vlsi circuits 1 Treffer
- 35th european microwave conference, paris, october 3-7, 2005 1 Treffer
- electron devices (san francisco ca, 8-11 december 2002, technical digest) 1 Treffer
- eurosoi'06 conference. selected papers 1 Treffer
- ieee transactions on semiconductor manufacturing 1 Treffer
- infos 2003 proceedings of the 13th biennial conference on insulating films on semiconductors: june 18-20, 2003, barcelona, spain 1 Treffer
- infos 2007: proceedings of the 15th biennial conference on insulating films on semiconductors, june 20-23, 2007, glyfada athens, greece 1 Treffer
- insulating films on semiconductors 2013 1 Treffer
- journal of low power electronics (print) 1 Treffer
- microelectronics journal 1 Treffer
- noise in devices and circuits iii (24-26 may 2005, austin, texas, usa) 1 Treffer
- proceedings of spie, the international society for optical engineering 1 Treffer
- silicon-on-insulator technology and devices xi (paris, 28 april - 2 may 2003) 1 Treffer
- silicon-on-insulator technology and devices xii (quebec pq, 15-20 may 2005) 1 Treffer
Sprache
134 Treffer
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In: 2006 Symposium on VLSI circuits, Jg. 42 (2007), Heft 4, S. 798-803Online KonferenzZugriff:
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In: Infos 2005: Proceedings of the 14th Biennal Conference on Insulating Films on Semiconductors, June 22-24, Jg. 80 (2005), S. 114-121KonferenzZugriff:
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In: 2004 IEEE international reliability physics symposium proceedings, 42nd annual (Phoenix AZ, 25-29 April 2004), 2004, S. 110-116KonferenzZugriff:
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In: Reliability of electron devices, failure physics and analysis, Jg. 44 (2004), Heft 9-11, S. 1519-1522KonferenzZugriff:
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In: IEEE transactions on nanotechnology, Jg. 11 (2012), Heft 2, S. 215-219Online academicJournalZugriff:
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In: 2004 international conference on microelectronic test structures (March 22-25, 2004, S. 235-240KonferenzZugriff:
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In: Infos 2005: Proceedings of the 14th Biennal Conference on Insulating Films on Semiconductors, June 22-24, Jg. 80 (2005), S. 353-361KonferenzZugriff:
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In: IEEE transactions on microwave theory and techniques, Jg. 60 (2012), Heft 4, S. 1079-1085Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 54 (2007), Heft 1, S. 59-67Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 51 (2004), Heft 10, S. 1621-1627Online academicJournalZugriff:
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In: IEEE transactions on very large scale integration (VLSI) systems, Jg. 14 (2006), Heft 12, S. 1347-1353Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 53 (2006), Heft 8, S. 1815-1820Online academicJournalZugriff:
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In: IEEE electron device letters, Jg. 33 (2012), Heft 6, S. 749-751Online academicJournalZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 18 (2005), Heft 2, S. 328-337Online academicJournalZugriff:
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In: IEEE microwave and wireless components letters, Jg. 16 (2006), Heft 4, S. 182-184Online academicJournalZugriff:
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In: Noise in devices and circuits III (24-26 May 2005, Austin, Texas, USA), 2005, S. 52-62KonferenzZugriff:
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In: 17th International Conference on VLSI Design (concurrently with the 3rd International Conference on Embedded Systems Design), 2004, S. 646-649KonferenzZugriff:
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In: EUROSOI'06 Conference. Selected papers, Jg. 51 (2007), Heft 2, S. 268-277KonferenzZugriff:
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In: 14TH Workshop on dielectrics in microelectronics (WoDiM 2006), Jg. 47 (2007), Heft 4-5, S. 552-558KonferenzZugriff:
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In: 17th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2006), Wuppertal, Germany, 3-6 October 2006, Jg. 46 (2006), Heft 9-11, S. 1669-1672KonferenzZugriff: