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- complementary metal oxide semiconductors 281 Treffer
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45 weitere Werte:
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- programmable logic devices 7 Treffer
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- cmos integrated circuits 6 Treffer
Publikation
- microelectronics reliability 68 Treffer
- microelectronics journal 61 Treffer
- integration: the vlsi journal 51 Treffer
- solid-state electronics 49 Treffer
- aeu: international journal of electronics & communications 46 Treffer
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30 weitere Werte:
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- journal of systems architecture 6 Treffer
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- computers & electrical engineering 4 Treffer
- engineering applications of artificial intelligence 4 Treffer
- nano communication networks 4 Treffer
- neurocomputing 4 Treffer
- current applied physics 3 Treffer
- physica c 3 Treffer
- ain shams engineering journal 2 Treffer
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- image & vision computing 2 Treffer
- measurement (02632241) 2 Treffer
- alexandria engineering journal 1 Treffer
- energy procedia 1 Treffer
- iii-vs review 1 Treffer
- materials science & engineering: c 1 Treffer
- materials today 1 Treffer
- nuclear instruments & methods in physics research section b 1 Treffer
- nuclear physics b proceedings supplement 1 Treffer
- optics communications 1 Treffer
- optik - international journal for light & electron optics 1 Treffer
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391 Treffer
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In: Alexandria Engineering Journal, Jg. 59 (2020-10-01), Heft 5, S. 3715-3729Online academicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 95 (2024-03-01), S. N.PAGacademicJournalZugriff:
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In: Nuclear Instruments & Methods in Physics Research Section A, Jg. 924 (2019-04-21), S. 104-107academicJournalZugriff:
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In: Microelectronics Journal, Jg. 80 (2018-10-01), S. 28-33academicJournalZugriff:
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In: Solid-State Electronics, Jg. 207 (2023-09-01), S. N.PAGacademicJournalZugriff:
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In: Integration: The VLSI Journal, Jg. 78 (2021-05-01), S. 135-143academicJournalZugriff:
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In: Nuclear Instruments & Methods in Physics Research Section A, Jg. 920 (2019-03-11), S. 68-72academicJournalZugriff:
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In: Microelectronics Reliability, Jg. 117 (2021-02-01), S. N.PAGacademicJournalZugriff:
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In: Science Bulletin, Jg. 66 (2021-08-30), Heft 16, S. 1624-1633academicJournalZugriff:
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In: Microelectronics Reliability, Jg. 81 (2018-02-01), S. 31-40academicJournalZugriff:
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In: Nuclear Instruments & Methods in Physics Research Section A, Jg. 924 (2019-04-21), S. 170-174academicJournalZugriff:
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In: Solid-State Electronics, Jg. 194 (2022-08-01), S. N.PAGacademicJournalZugriff:
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In: AEU: International Journal of Electronics & Communications, Jg. 104 (2019-05-15), S. 66-75Online academicJournal
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In: Microelectronics Reliability, Jg. 91 (2018-12-02), S. 278-282academicJournalZugriff:
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In: AEU: International Journal of Electronics & Communications, 2018-05-01, S. 6-14Online academicJournal
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In: Microelectronics Journal, Jg. 45 (2014-07-01), Heft 7, S. 880-885academicJournalZugriff:
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In: AEU: International Journal of Electronics & Communications, Jg. 88 (2018-05-15), S. 87-97Online academicJournal
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In: Microelectronics Reliability, Jg. 81 (2018-02-01), S. 101-111academicJournalZugriff:
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In: Microelectronics Journal, Jg. 45 (2014-03-01), Heft 3, S. 345-354academicJournalZugriff:
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In: Nuclear Instruments & Methods in Physics Research Section A, Jg. 1034 (2022-07-01), S. N.PAGacademicJournalZugriff: