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45 weitere Werte:
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- fabrication 3 Treffer
- impedance 3 Treffer
- logic gates 3 Treffer
- low noise amplifiers 3 Treffer
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- microfluidics 3 Treffer
- noise immunity 3 Treffer
- organic light emitting diodes 3 Treffer
- touch sensor 3 Treffer
- voltage 3 Treffer
- accelerometer 2 Treffer
- analog front end (afe) 2 Treffer
- capacitive 2 Treffer
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- cmos readout integrated circuit (roic) 2 Treffer
- cmos technology 2 Treffer
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- detector circuits 2 Treffer
- electrostatic 2 Treffer
- electrostatics 2 Treffer
- epitaxial layers 2 Treffer
- field-effect transistors 2 Treffer
- finfets 2 Treffer
- fingerprint recognition 2 Treffer
- force 2 Treffer
- integrated circuit design 2 Treffer
- interference 2 Treffer
Publikation
Sprache
36 Treffer
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In: IEEE Electron Device Letters, Jg. 43 (2022-08-01), Heft 8, S. 1319-1322Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 70 (2021-07-01), S. 1-12Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 69 (2022-06-01), Heft 6, S. 1299-1309Online academicJournalZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 51 (2016-03-01), Heft 3, S. 724-737Online academicJournalZugriff:
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In: IEEE Transactions on Biomedical Engineering, Jg. 66 (2019-04-01), Heft 4, S. 1094-1104Online academicJournalZugriff:
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In: IEEE Transactions on Circuits & Systems. Part I: Regular Papers, Jg. 64 (2017-12-01), Heft 12, S. 3047-3055Online serialPeriodicalZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 51 (2016-11-01), Heft 11, S. 2545-2553Online academicJournalZugriff:
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In: Journal of Microelectromechanical Systems, Jg. 28 (2019-02-01), Heft 1, S. 14-24Online academicJournalZugriff:
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In: Journal of Microelectromechanical Systems, Jg. 28 (2019-10-01), Heft 5, S. 910-918Online academicJournalZugriff:
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In: Journal of Microelectromechanical Systems, Jg. 22 (2013-10-01), Heft 5, S. 1054-1065Online academicJournalZugriff:
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In: IEEE Transactions on Circuits & Systems. Part I: Regular Papers, Jg. 67 (2020-08-01), Heft 8, S. 2556-2565Online serialPeriodicalZugriff:
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In: IEEE Electron Device Letters, Jg. 33 (2012-07-01), Heft 7, S. 934-936Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 62 (2015-05-01), Heft 5, S. 1433-1439Online academicJournalZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 47 (2012-04-01), Heft 4, S. 1043-1055Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-10-01), Heft 10, S. 2263-2272Online academicJournalZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 52 (2017-02-01), Heft 2, S. 528-542Online academicJournalZugriff:
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In: Journal of Microelectromechanical Systems, Jg. 23 (2014-06-01), Heft 3, S. 727-739Online academicJournalZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 53 (2018-04-01), Heft 4, S. 1079-1088Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 62 (2015-03-01), Heft 3, S. 972-979Online academicJournalZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 55 (2020-09-01), Heft 9, S. 2539-2552Online academicJournalZugriff: