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In: Microelectronics Reliability, Jg. 98 (2019-07-01), S. 42-48Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 138 (2022-11-01), S. 114733-114733Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 146 (2023-07-01), S. 115007-115007Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 93 (2019-02-01), S. 98-101Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 97 (2019-06-01), S. 53-65Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 91 (2018-12-01), S. 278-282Online unknownZugriff:
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In: Microelectronics Reliability, 2018-09-01, S. 196-202Online unknownZugriff:
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In: Microelectronics Reliability, 2018-09-01, S. 965-968Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 126 (2021-11-01), S. 114370-114370Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 82 (2018-03-01), S. 100-112Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 81 (2018-02-01), S. 31-40Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 79 (2017-12-01), S. 517-525Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 79 (2017-12-01), S. 416-425Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 126 (2021-11-01), S. 114210-114210Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 84 (2018-05-01), S. 20-25Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 83 (2018-04-01), S. 254-259Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 81 (2018-02-01), S. 101-111Online unknownZugriff:
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In: Microelectronics Reliability, 2017-09-01, S. 680-684Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 74 (2017-07-01), S. 1-8Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 85 (2018-06-01), S. 176-189Online unknownZugriff: