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- microelectronics reliability ; volume 25, issue 3, page 590 ; issn 0026-2714 3 Treffer
- microelectronics reliability ; volume 11, issue 5, page 418 ; issn 0026-2714 2 Treffer
- microelectronics reliability ; volume 21, issue 4, page 621 ; issn 0026-2714 2 Treffer
- microelectronics reliability ; volume 23, issue 5, page 1000 ; issn 0026-2714 2 Treffer
- microelectronics reliability ; volume 24, issue 4, page 815 ; issn 0026-2714 2 Treffer
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45 weitere Werte:
- microelectronics reliability ; volume 29, issue 4, page 654 ; issn 0026-2714 2 Treffer
- sensors and actuators a: physical ; issn 0924-4247 2 Treffer
- microelectronics international ; volume 21, issue 2 ; issn 1356-5362 1 Treffer
- microelectronics international ; volume 23, issue 1 ; issn 1356-5362 1 Treffer
- microelectronics reliability ; volume 11, issue 5, page 417 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 12, issue 5, page 413 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 13, issue 1, page 14 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 13, issue 2, page 84 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 13, issue 3, page 165 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 14, issue 4, page 343 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 14, issue 5-6, page 406 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 15, issue 2, page 108 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 15, issue 6, page 528 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 16, issue 1, page 15 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 16, issue 3, page 213 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 16, issue 6, page 644 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 17, issue 2, page 251 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 17, issue 2, page 252 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 17, issue 4, page 415 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 17, issue 4, page 420 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 17, issue 5, page 487 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 17, issue 6, page 559 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 17, issue 6, page 560 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 18, issue 4, page 317 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 19, issue 5-6, page 423 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 20, issue 4, page 545 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 20, issue 6, page 909 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 20, issue 6, page 910 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 21, issue 4, page 612 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 21, issue 5, page 756 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 21, issue 5, page 757 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 21, issue 5, page 761 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 22, issue 1, page 132 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 22, issue 1, page 133 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 23, issue 2, page 399 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 23, issue 2, page 406 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 23, issue 3, page 589 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 23, issue 5, page 999 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 23, issue 6, page 1181 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 24, issue 1, page 178 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 24, issue 1, page 180 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 24, issue 3, page 591 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 24, issue 3, page 597 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 24, issue 4, page 806 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 24, issue 4, page 811 ; issn 0026-2714 1 Treffer
Sprache
1.103 Treffer
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In: Microelectronics Journal ; volume 144, page 106066 ; ISSN 0026-2692, 2024academicJournalZugriff:
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In: Microelectronics Journal ; volume 143, page 106036 ; ISSN 0026-2692, 2024academicJournalZugriff:
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In: Journal of Materiomics ; volume 10, issue 2, page 277-284 ; ISSN 2352-8478, 2024academicJournalZugriff:
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In: Sensors and Actuators A: Physical ; volume 354, page 114268 ; ISSN 0924-4247, 2023academicJournalZugriff:
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In: Sensors and Actuators B: Chemical ; volume 381, page 133442 ; ISSN 0925-4005, 2023academicJournalZugriff:
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In: Microelectronics Journal ; volume 132, page 105676 ; ISSN 0026-2692, 2023academicJournalZugriff:
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In: Microelectronics Reliability ; volume 146, page 115007 ; ISSN 0026-2714, 2023academicJournalZugriff:
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In: Sensors and Actuators A: Physical ; volume 363, page 114744 ; ISSN 0924-4247, 2023academicJournalZugriff:
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A 16 Gb/s serial link transceiver with active inductor based CTLE and 3-tap DFE in 12-nm FinFET CMOSIn: Microelectronics Journal ; page 106216 ; ISSN 0026-2692, 2024academicJournalZugriff:
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In: Microelectronics Journal ; volume 148, page 106188 ; ISSN 0026-2692, 2024academicJournalZugriff:
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In: Microelectronics Journal ; volume 147, page 106175 ; ISSN 0026-2692, 2024academicJournalZugriff:
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In: Microelectronics Journal ; volume 147, page 106164 ; ISSN 0026-2692, 2024academicJournalZugriff:
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In: Microelectronics Journal ; volume 146, page 106160 ; ISSN 0026-2692, 2024academicJournalZugriff:
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In: Microelectronics Journal ; volume 146, page 106144 ; ISSN 0026-2692, 2024academicJournalZugriff:
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In: Microelectronics Journal ; volume 146, page 106154 ; ISSN 0026-2692, 2024academicJournalZugriff:
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In: Microelectronics Journal ; volume 147, page 106145 ; ISSN 0026-2692, 2024academicJournalZugriff:
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Performance improvement for the CMOS rail-to-rail amplifier via APSO-based design and SNN’s trainingIn: Microelectronics Journal ; volume 146, page 106131 ; ISSN 0026-2692, 2024academicJournalZugriff:
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In: Microelectronics Journal ; volume 145, page 106099 ; ISSN 0026-2692, 2024academicJournalZugriff:
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A 65 nm CMOS rail-to-rail auto-zero operational amplifier based on charge pump internal power supplyIn: Microelectronics Journal ; volume 145, page 106098 ; ISSN 0026-2692, 2024academicJournalZugriff:
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In: Microelectronics Journal ; volume 144, page 106069 ; ISSN 0026-2692, 2024academicJournalZugriff: