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Weniger Treffer
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- business 398 Treffer
- business.industry 398 Treffer
- materials science 370 Treffer
- optoelectronics 329 Treffer
- condensed matter physics 225 Treffer
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45 weitere Werte:
- electrical engineering 211 Treffer
- mosfet 210 Treffer
- doping 172 Treffer
- law 148 Treffer
- law.invention 148 Treffer
- field-effect transistor 137 Treffer
- materials chemistry 128 Treffer
- electronic engineering 123 Treffer
- transistor 116 Treffer
- chemistry 108 Treffer
- surfaces, coatings and films 87 Treffer
- atomic and molecular physics, and optics 82 Treffer
- voltage 81 Treffer
- threshold voltage 71 Treffer
- cmos 70 Treffer
- electric field 65 Treffer
- chemistry.chemical_compound 64 Treffer
- transconductance 64 Treffer
- equivalent series resistance 57 Treffer
- chemistry.chemical_element 56 Treffer
- communication channel 55 Treffer
- engineering 55 Treffer
- safety, risk, reliability and quality 54 Treffer
- thin-film transistor 50 Treffer
- degradation (geology) 46 Treffer
- gate oxide 45 Treffer
- drain-induced barrier lowering 44 Treffer
- oxide 44 Treffer
- hardware_integratedcircuits 43 Treffer
- substrate (electronics) 43 Treffer
- silicon 42 Treffer
- ion implantation 40 Treffer
- stress (mechanics) 40 Treffer
- channel length modulation 36 Treffer
- capacitance 35 Treffer
- physics 35 Treffer
- hardware_performanceandreliability 34 Treffer
- analytical chemistry 31 Treffer
- reliability (semiconductor) 30 Treffer
- nmos logic 29 Treffer
- impact ionization 28 Treffer
- 01 natural sciences 24 Treffer
- fabrication 24 Treffer
- integrated circuit 24 Treffer
- 0103 physical sciences 23 Treffer
Verlag
- institute of electrical and electronics engineers (ieee) 418 Treffer
- elsevier bv 179 Treffer
- iop publishing 16 Treffer
- wiley 9 Treffer
- the electrochemical society 5 Treffer
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15 weitere Werte:
- hal ccsd 4 Treffer
- institute of electronics, information and communications engineers (ieice) 4 Treffer
- springer science and business media llc 3 Treffer
- hindawi limited 2 Treffer
- ieee 2 Treffer
- the institute of electronics engineers of korea 2 Treffer
- walter de gruyter gmbh 2 Treffer
- american chemical society (acs) 1 Treffer
- hindawi publishing corporation 1 Treffer
- ieee institute of electrical and electronic engineers 1 Treffer
- ieee-inst electrical electronics engineers inc 1 Treffer
- institute of electrical and electronics engineers., new york, stati uniti d'america 1 Treffer
- pergamon-elsevier science ltd 1 Treffer
- the korean institute of electrical and electronic material engineers 1 Treffer
- zenodo 1 Treffer
Publikation
- ieee transactions on electron devices 172 Treffer
- ieee electron device letters 87 Treffer
- solid-state electronics 71 Treffer
- microelectronics reliability 26 Treffer
- microelectronic engineering 18 Treffer
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30 weitere Werte:
- journal of semiconductors 8 Treffer
- semiconductor science and technology 8 Treffer
- ieee transactions on device and materials reliability 6 Treffer
- journal of the electrochemical society 5 Treffer
- thin solid films 5 Treffer
- ieice transactions on electronics 4 Treffer
- active and passive electronic components 3 Treffer
- ieee circuits and devices magazine 3 Treffer
- ieee journal of the electron devices society 3 Treffer
- indrastra global 3 Treffer
- ieee transactions on semiconductor manufacturing 2 Treffer
- journal of display technology 2 Treffer
- jsts:journal of semiconductor technology and science 2 Treffer
- physica status solidi (a) 2 Treffer
- advanced functional materials ; volume 32, issue 21 ; issn 1616-301x 1616-3028 1 Treffer
- advanced optical technologies 1 Treffer
- advanced optical technologies ; volume 3, issue 4 ; issn 2192-8584 2192-8576 1 Treffer
- electronic materials letters 1 Treffer
- ieee journal of solid-state circuits 1 Treffer
- journal of electronic materials 1 Treffer
- journal of electrostatics 1 Treffer
- journal of the society for information display 1 Treffer
- microelectronics reliability ; volume 29, issue 4, page 663 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 36, issue 3, page 453 ; issn 0026-2714 1 Treffer
- optical materials 1 Treffer
- optics and lasers in engineering 1 Treffer
- physica b: condensed matter 1 Treffer
- synthetic metals 1 Treffer
- the journal of physical chemistry c 1 Treffer
- transactions on electrical and electronic materials 1 Treffer
Sprache
660 Treffer
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In: IEEE Journal of the Electron Devices Society, Jg. 8 (2020), S. 1039-1042Online unknownZugriff:
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In: Journal of Electronic Materials, Jg. 51 (2022-01-08), S. 1029-1040Online unknownZugriff:
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Ultrathin Body and Buried Oxide SOI MOSFETs With Non-LDD Source/Drain Extensions: A Simulation StudyIn: IEEE Transactions on Electron Devices ; volume 71, issue 1, page 412-417 ; ISSN 0018-9383 1557-9646, 2024Online academicJournalZugriff:
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In: Microelectronics Reliability ; volume 135, page 114603 ; ISSN 0026-2714, 2022academicJournalZugriff:
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In: IEEE Journal of the Electron Devices Society ; volume 8, page 1039-1042 ; ISSN 2168-6734, 2020Online academicJournalZugriff:
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In: Microelectronics Reliability, Jg. 135 (2022-08-01), S. 114603-114603Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 84 (2018-05-01), S. 157-162Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 16 (2016-09-01), S. 298-303Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 63 (2016-06-01), S. 2293-2298Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 55 (2015-07-01), S. 1144-1151Online unknownZugriff:
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In: JSTS:Journal of Semiconductor Technology and Science, Jg. 15 (2015-12-30), S. 653-657Online unknownZugriff:
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In: Electronic Materials Letters, Jg. 8 (2012-06-01), S. 331-334Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012-03-01), S. 705-709Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 11 (2011-03-01), S. 131-140Online unknownZugriff:
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In: Thin Solid Films, Jg. 427 (2003-03-01), S. 117-122Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 57 (2010-06-01), S. 1319-1326Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 10 (2010-03-01), S. 108-115Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 47 (2000-04-01), S. 835-840Online unknownZugriff:
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In: IEICE Transactions on Electronics, 2007-05-01, S. 983-987Online unknownZugriff:
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In: Solid-State Electronics, Jg. 50 (2006-09-01), S. 1540-1545Online unknownZugriff: