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Schlagwort
- application specific integrated circuits 14 Treffer
- detectors 14 Treffer
- cmos integrated circuits 12 Treffer
- electric capacity 11 Treffer
- transistors 11 Treffer
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45 weitere Werte:
- application-specific integrated circuits 9 Treffer
- cmos 9 Treffer
- complementary metal oxide semiconductors 9 Treffer
- electric charge 9 Treffer
- high dynamic range 8 Treffer
- logic gates 8 Treffer
- low-noise 8 Treffer
- mosfets 8 Treffer
- photodiodes 7 Treffer
- arrays 6 Treffer
- power demand 6 Treffer
- asic 5 Treffer
- cadmium zinc telluride detectors 5 Treffer
- cdznte 5 Treffer
- csa 5 Treffer
- electronic noise 5 Treffer
- electrostatic analyzers 5 Treffer
- engineering instruments 5 Treffer
- front-end 5 Treffer
- gamma ray detectors 5 Treffer
- interfaces (physical sciences) 5 Treffer
- leakage currents 5 Treffer
- mcp 5 Treffer
- metal oxide semiconductor field-effect transistors 5 Treffer
- optimization 5 Treffer
- radiation detection 5 Treffer
- scintillator 5 Treffer
- scintillators 5 Treffer
- signal-to-noise ratio 5 Treffer
- space plasmas 5 Treffer
- temperature measurement 5 Treffer
- x-ray 5 Treffer
- x-ray detection 5 Treffer
- clocks 4 Treffer
- cmos amplifiers 4 Treffer
- coupled mode theory (wave-motion) 4 Treffer
- discriminator 4 Treffer
- dynamic range 4 Treffer
- electric noise 4 Treffer
- energy dissipation 4 Treffer
- equations 4 Treffer
- impact (mechanics) 4 Treffer
- impedance 4 Treffer
- integrated circuits 4 Treffer
- leakage current 4 Treffer
Publikation
- ieee transactions on nuclear science 23 Treffer
- ieee journal of solid-state circuits 4 Treffer
- ieee transactions on circuits & systems. part i: regular papers 3 Treffer
- ieee transactions on very large scale integration (vlsi) systems 2 Treffer
- ieee transactions on circuits & systems. part ii: express briefs 1 Treffer
Sprache
10 Treffer
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In: IEEE Transactions on Nuclear Science, Jg. 58 (2011-10-15), Heft 5, S. 2382-2390Online academicJournalZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 47 (2012-12-01), Heft 12, S. 2880-2887Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 62 (2015-10-01), Heft 5a, S. 1995-2002Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 59 (2012-10-22), Heft 5, S. 2580-2586Online academicJournalZugriff:
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In: IEEE Transactions on Circuits & Systems. Part II: Express Briefs, Jg. 61 (2014-07-01), Heft 7, S. 476-480Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 24 (2016-04-01), Heft 4, S. 1460-1469Online academicJournalZugriff:
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In: IEEE Journal of Solid-State Circuits, Jg. 49 (2014-08-01), Heft 8, S. 1739-1750Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 58 (2011-08-01), Heft 4, S. 2129-2136Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 58 (2011-02-15), Heft 1, S. 187-193Online academicJournalZugriff:
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In: IEEE Transactions on Circuits & Systems. Part I: Regular Papers, Jg. 58 (2011-09-01), Heft 9, S. 2118-2126Online serialPeriodicalZugriff: