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Weniger Treffer
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- electronics 9 Treffer
- electric equipment 7 Treffer
- metal oxide semiconductors 7 Treffer
- semiconductors 7 Treffer
- metal oxide semiconductors, complementary 6 Treffer
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45 weitere Werte:
- electric circuits 4 Treffer
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- electric potential 3 Treffer
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- transistors 3 Treffer
- complementary metal oxide semiconductors 2 Treffer
- crosstalk 2 Treffer
- digital electronics 2 Treffer
- electric fields 2 Treffer
- electric inverters 2 Treffer
- electrodes 2 Treffer
- electronic noise 2 Treffer
- logic circuits 2 Treffer
- nanostructured materials 2 Treffer
- nanowires 2 Treffer
- power amplifiers 2 Treffer
- semiconductors -- junctions 2 Treffer
- silicon 2 Treffer
- silicon nanowires 2 Treffer
- silicon-on-insulator technology 2 Treffer
- soi cmos devices 2 Treffer
- substrate noise 2 Treffer
- temperature effect 2 Treffer
- bipolar junction transistors 1 Treffer
- bipolar-cmos integrated circuits 1 Treffer
- breakdown voltage 1 Treffer
- computer simulation 1 Treffer
- deep trench 1 Treffer
- dielectric devices 1 Treffer
- dielectrics 1 Treffer
- dynamic random access memory 1 Treffer
- effect of temperature on metal oxide semiconductor field-effect transistors 1 Treffer
- electric properties of germanium 1 Treffer
- electric resistance 1 Treffer
- electron work function 1 Treffer
- gate-all-around (gaa) 1 Treffer
- germanium 1 Treffer
- germanium-on-insulator (geol) 1 Treffer
- germanium-on-insulator devices -- manufacture 1 Treffer
- heterogeneous integration 1 Treffer
- integrated circuits 1 Treffer
- isolation technology 1 Treffer
- manufacturing processes 1 Treffer
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12 Treffer
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In: IEEE Electron Device Letters, Jg. 29 (2008-08-01), Heft 8, S. 902-905Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 29 (2008-08-01), Heft 8, S. 898-901Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 30 (2009-05-01), Heft 5, S. 541-543Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 30 (2009-05-01), Heft 5, S. 565-567Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 30 (2009-05-01), Heft 5, S. 559-571Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 29 (2008-08-01), Heft 8, S. 898-901Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 30 (2009-05-01), Heft 5, S. 556-558Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 30 (2009-05-01), Heft 5, S. 562-564Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 30 (2009-05-01), Heft 5, S. 559-561Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 29 (2008-08-01), Heft 8, S. 913-915Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 27 (2006-11-01), Heft 11, S. 911-913Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 27 (2006-11-01), Heft 11, S. 911-913Online academicJournalZugriff: