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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- circuits integres 602 Treffer
- integrated circuits 602 Treffer
- complementary mos technology 583 Treffer
- technologie mos complementaire 583 Treffer
- tecnologia mos complementario 580 Treffer
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45 weitere Werte:
- conception. technologies. analyse fonctionnement. essais 572 Treffer
- design. technologies. operation analysis. testing 572 Treffer
- circuits electriques, optiques et optoelectroniques 283 Treffer
- electric, optical and optoelectronic circuits 283 Treffer
- circuit properties 265 Treffer
- proprietes des circuits 265 Treffer
- circuits electroniques 254 Treffer
- electronic circuits 254 Treffer
- transistors 249 Treffer
- evaluation performance 198 Treffer
- performance evaluation 198 Treffer
- evaluacion prestacion 196 Treffer
- circuit integre 184 Treffer
- integrated circuit 183 Treffer
- circuito integrado 180 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 122 Treffer
- electronic equipment and fabrication. passive components, printed wiring boards, connectics 122 Treffer
- physics 122 Treffer
- physique 122 Treffer
- mosfet 104 Treffer
- transistor mosfet 104 Treffer
- electronique faible puissance 102 Treffer
- low-power electronics 102 Treffer
- reliability 96 Treffer
- fiabilite 95 Treffer
- circuit integre cmos 92 Treffer
- cmos integrated circuits 92 Treffer
- fiabilidad 92 Treffer
- silicium 89 Treffer
- silicon 89 Treffer
- silicio 83 Treffer
- circuit design 82 Treffer
- circuits integres par fonction (dont memoires et processeurs) 82 Treffer
- circuits numeriques 82 Treffer
- conception circuit 82 Treffer
- digital circuits 82 Treffer
- integrated circuits by function (including memories and processors) 82 Treffer
- diseno circuito 79 Treffer
- power electronics 76 Treffer
- electronique puissance 75 Treffer
- implementation 75 Treffer
- electronica potencia 74 Treffer
- implementacion 71 Treffer
- amplificateurs 67 Treffer
- amplifiers 67 Treffer
Publikation
- microelectronics and reliability 211 Treffer
- microelectronics journal 165 Treffer
- solid-state electronics 85 Treffer
- integration (amsterdam) 65 Treffer
- microelectronic engineering 58 Treffer
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45 weitere Werte:
- organic electronics (print) 19 Treffer
- materials science & engineering. b, solid-state materials for advanced technology 11 Treffer
- reliability of electron devices, failure physics and analysis 11 Treffer
- amf/rf[ams/rf] cmos circuit design for wireless transceivers 10 Treffer
- insulating films on semiconductors 2013 9 Treffer
- 17th european symposium on reliability of electron devices, failure physics and analysis (esref 2006), wuppertal, germany, 3-6 october 2006 8 Treffer
- journal of parallel and distributed computing (print) 8 Treffer
- 14th workshop on dielectrics in microelectronics (wodim 2006) 7 Treffer
- 16th european symposium on reliability of electron devices, failure physics and analysis (esref 2005), arcachon, france, october 10-14, 2005 7 Treffer
- journal of non-crystalline solids 7 Treffer
- journal of crystal growth 6 Treffer
- micro/nano devices and systems 2013: an open thematic journal issue 6 Treffer
- selected extended papers from ulis 2012 conference 6 Treffer
- selected papers from the essderc 2011 conference 6 Treffer
- 2009 international electron devices and materials symposium (iedms) 5 Treffer
- computing with future nanotechnology 5 Treffer
- materials chemistry and physics 5 Treffer
- materials science in semiconductor processing 5 Treffer
- dielectrics in microelectronics (wodim 2004) 4 Treffer
- european materials research society (e-mrs) 2001, spring meeting, symposium d: second international conference on silicon epitaxy and heterostructures, strasbourg, france, june 4-8th 2001 4 Treffer
- papers selected from the ultimate integration on silicon conference 2009, ulis 2009 4 Treffer
- physica. e, low-dimentional systems and nanostructures 4 Treffer
- reliability physics of advanced electron devices 4 Treffer
- advances in submicron mos devices and technology 3 Treffer
- comptes rendus de l'academie des sciences. serie iv, physique, astrophysique 3 Treffer
- comptes rendus. physique 3 Treffer
- cryogenics (guildford) 3 Treffer
- infrared physics & technology 3 Treffer
- neural networks 3 Treffer
- neurocomputing (amsterdam) 3 Treffer
- selected full-length extended papers from the eurosoi 2009 conference 3 Treffer
- containing papers presented at the international conference on advanced materials 1999, symposium m: silicon-based materials and devices, june 13-18, 1999, beijing, china 2 Treffer
- international journal of thermal sciences 2 Treffer
- negative-bias-temperature instability (nbti) in mos devices special sectio n 2 Treffer
- new aspects of si-and ge-based materials and devices 2 Treffer
- optics and lasers in engineering 2 Treffer
- proceedings of the 19th international conference on amorphous and microcrystalline semiconductors - science and technology (icams 19), nice, france, august 27-31, 2001. part b 2 Treffer
- proceedings of the e-mrs 2008 symposium c: frontiers in silicon-based photonics e-mrs symposium c 2 Treffer
- real-time imaging (print) 2 Treffer
- special issue devoted to the 2nd international memory workshop (imw 2010) 2 Treffer
- special issue with papers selected from the ultimate integration on silicon conference, ulis 2008 2 Treffer
- special issue: containing papers presented at the 2001 lawrence symposium on critical issues in epitaxy, january 3-6, 2001, scottsdale arizona 2 Treffer
- thin solid films 2 Treffer
- third international conference on low dimensional structures and devices, september 15-17, 1999, antalya, turkey 2 Treffer
- [microscale heat transfer] 1 Treffer
Sprache
Geographischer Bezug
704 Treffer
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In: Microelectronics and reliability, Jg. 54 (2014), Heft 1, S. 90-99academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 4, S. 510-531academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 1, S. 48-61academicJournalZugriff:
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-state electronics, Jg. 91 (2014), S. 81-86academicJournalZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 155-158academicJournalZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 89-94academicJournalZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 178-182academicJournalZugriff:
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In: Solid-state electronics, Jg. 98 (2014), S. 26-31academicJournalZugriff:
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In: Solid-state electronics, Jg. 91 (2014), S. 91-99academicJournalZugriff:
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In: Solid-state electronics, Jg. 95 (2014), S. 28-31academicJournalZugriff:
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In: Solid-state electronics, Jg. 62 (2011), Heft 1, S. 115-122academicJournalZugriff:
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In: 14TH Workshop on dielectrics in microelectronics (WoDiM 2006), Jg. 47 (2007), Heft 4-5, S. 739-742KonferenzZugriff:
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In: SiO2, advanced dielectrics and related devices, Mondelo, Palermo, Italy, June 25-28, 2006, Jg. 353 (2007), Heft 5-7, S. 639-644KonferenzZugriff:
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In: Microelectronics and reliability, Jg. 46 (2006), Heft 5-6, S. 702-712KonferenzZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 127-130academicJournalZugriff:
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In: Solid-state electronics, Jg. 91 (2014), S. 137-146academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 3, S. 349-355academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 4, S. 592-599academicJournalZugriff:
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In: Solid-state electronics, Jg. 81 (2013), S. 151-156academicJournalZugriff:
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In: Reliability of electron devices, failure physics and analysis, Jg. 44 (2004), Heft 9-11, S. 1519-1522KonferenzZugriff: