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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- circuit properties 34 Treffer
- circuits electriques, optiques et optoelectroniques 34 Treffer
- electric, optical and optoelectronic circuits 34 Treffer
- proprietes des circuits 34 Treffer
- amplificateurs 33 Treffer
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45 weitere Werte:
- amplifiers 33 Treffer
- circuits electroniques 33 Treffer
- electronic circuits 33 Treffer
- circuits integres 26 Treffer
- conception. technologies. analyse fonctionnement. essais 26 Treffer
- design. technologies. operation analysis. testing 26 Treffer
- integrated circuits 26 Treffer
- evaluacion prestacion 22 Treffer
- evaluation performance 22 Treffer
- performance evaluation 22 Treffer
- complementary mos technology 21 Treffer
- technologie mos complementaire 21 Treffer
- tecnologia mos complementario 21 Treffer
- figura ruido 19 Treffer
- figure bruit 19 Treffer
- noise figure 19 Treffer
- transistors 17 Treffer
- gain 11 Treffer
- ganancia 11 Treffer
- orden 3 9 Treffer
- ordre 3 9 Treffer
- third order 9 Treffer
- electronique faible puissance 8 Treffer
- implementacion 8 Treffer
- implementation 8 Treffer
- intercept point 8 Treffer
- low-power electronics 8 Treffer
- point d'interception 8 Treffer
- circuit integre radiofrequence 7 Treffer
- circuits hyperfrequences, circuits integres hyperfrequences, lignes de transmission hyperfrequences, circuits a ondes submillimetriques 7 Treffer
- high electron mobility transistor 7 Treffer
- microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits 7 Treffer
- radiofrequency integrated circuits 7 Treffer
- transistor mobilite electron elevee 7 Treffer
- transistor movibilidad elevada electrones 7 Treffer
- aumento potencia 6 Treffer
- banda ultraancha 6 Treffer
- bobine inductance 6 Treffer
- cascode connection 6 Treffer
- circuit integre cmos 6 Treffer
- cmos integrated circuits 6 Treffer
- compose binaire 6 Treffer
- decharge electrostatique 6 Treffer
- dispositif protection 6 Treffer
- dispositifs magnetiques 6 Treffer
Publikation
- microelectronics and reliability 11 Treffer
- microelectronics journal 8 Treffer
- integration (amsterdam) 7 Treffer
- solid-state electronics 4 Treffer
- amf/rf[ams/rf] cmos circuit design for wireless transceivers 3 Treffer
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9 weitere Werte:
- microelectronic engineering 3 Treffer
- journal of crystal growth 2 Treffer
- 16th european symposium on reliability of electron devices, failure physics and analysis (esref 2005), arcachon, france, october 10-14, 2005 1 Treffer
- european materials research society (e-mrs) 2001, spring meeting, symposium d: second international conference on silicon epitaxy and heterostructures, strasbourg, france, june 4-8th 2001 1 Treffer
- infrared physics & technology 1 Treffer
- materials science & engineering. b, solid-state materials for advanced technology 1 Treffer
- materials science in semiconductor processing 1 Treffer
- molecular beam epitaxy 2002: proceedings of the twelfth international conference on molecular beam epitaxy, san francisco, ca, usa, 15-20 september 2002 1 Treffer
- physica. c. superconductivity 1 Treffer
Sprache
39 Treffer
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In: Microelectronics journal, Jg. 42 (2011), Heft 2, S. 253-264academicJournalZugriff:
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In: Microelectronics journal, Jg. 42 (2011), Heft 11, S. 1263-1268academicJournalZugriff:
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In: Microelectronics journal, Jg. 39 (2008), Heft 12, S. 1534-1537academicJournalZugriff:
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In: AMF/RF[AMS/RF] CMOS Circuit Design for Wireless Transceivers, Jg. 42 (2009), Heft 1, S. 83-88academicJournalZugriff:
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In: Microelectronics journal, Jg. 40 (2009), Heft 1, S. 197-201academicJournalZugriff:
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In: AMF/RF[AMS/RF] CMOS Circuit Design for Wireless Transceivers, Jg. 42 (2009), Heft 1, S. 3-9academicJournalZugriff:
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In: 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2005), Arcachon, France, October 10-14, Jg. 45 (2005), Heft 9-11, S. 1382-1385KonferenzZugriff:
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In: Microelectronics and reliability, Jg. 46 (2006), Heft 5-6, S. 702-712KonferenzZugriff:
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In: Solid-state electronics, Jg. 64 (2011), Heft 1, S. 47-53academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 50 (2010), Heft 6, S. 807-812academicJournalZugriff:
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In: Infrared physics & technology, Jg. 46 (2005), Heft 3, S. 249-256academicJournalZugriff:
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In: Physica. C. Superconductivity, Jg. 492 (2013), S. 32-35academicJournalZugriff:
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In: Solid-state electronics, Jg. 73 (2012), S. 27-31academicJournalZugriff:
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In: Microelectronics journal, Jg. 42 (2011), Heft 5, S. 754-757academicJournalZugriff:
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In: Materials science in semiconductor processing, Jg. 14 (2011), Heft 2, S. 89-93academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 42 (2009), Heft 3, S. 304-311academicJournalZugriff:
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In: Microelectronics journal, Jg. 41 (2010), Heft 12, S. 882-888academicJournalZugriff:
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In: Microelectronics journal, Jg. 41 (2010), Heft 8, S. 449-457academicJournalZugriff:
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In: AMF/RF[AMS/RF] CMOS Circuit Design for Wireless Transceivers, Jg. 42 (2009), Heft 1, S. 89-94academicJournalZugriff:
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In: Solid-state electronics, Jg. 91 (2014), S. 74-77academicJournalZugriff: