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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- fabricacion microelectrica 11 Treffer
- fabrication microelectronique 11 Treffer
- microelectronic fabrication 11 Treffer
- lithographie 10 Treffer
- lithography 10 Treffer
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45 weitere Werte:
- litografia 10 Treffer
- correccion de proximidad optica 8 Treffer
- correction optique proximite 8 Treffer
- efecto proximidad 8 Treffer
- effet proximite 8 Treffer
- optical proximity correction 8 Treffer
- proximity effect 8 Treffer
- circuits integres 7 Treffer
- conception. technologies. analyse fonctionnement. essais 7 Treffer
- design. technologies. operation analysis. testing 7 Treffer
- integrated circuits 7 Treffer
- pastilla electronica 6 Treffer
- pastille electronique 6 Treffer
- telecommunications 6 Treffer
- wafer 6 Treffer
- circuit integre 5 Treffer
- circuito integrado 5 Treffer
- integrated circuit 5 Treffer
- miniaturisation 5 Treffer
- miniaturizacion 5 Treffer
- miniaturization 5 Treffer
- circuits integres par fonction (dont memoires et processeurs) 4 Treffer
- evaluacion prestacion 4 Treffer
- evaluation performance 4 Treffer
- faisceau laser 4 Treffer
- haz laser 4 Treffer
- integrated circuits by function (including memories and processors) 4 Treffer
- laser beam 4 Treffer
- memoire acces direct 4 Treffer
- memoria acceso directo 4 Treffer
- performance evaluation 4 Treffer
- random access memory 4 Treffer
- comparative study 3 Treffer
- electronic packaging 3 Treffer
- essais, mesure, bruit et fiabilite 3 Treffer
- estudio comparativo 3 Treffer
- etude comparative 3 Treffer
- genie mecanique 3 Treffer
- interconexion 3 Treffer
- interconnection 3 Treffer
- interconnexion 3 Treffer
- mass production 3 Treffer
- mechanical engineering 3 Treffer
- memoire acces direct statique 3 Treffer
- microscopia electronica barrido 3 Treffer
Publikation
- 0annual bacus symposium on photomask technology 6 Treffer
- 25th annual bacus symposium on photomask technology (4-7 october, 2006, monterey, california, usa) 6 Treffer
- spie proceedings series 6 Treffer
- proceedings of spie, the international society for optical engineering 4 Treffer
- optical microlithography xix (21-24 february 2006, san jose, california, usa) 3 Treffer
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6 weitere Werte:
- laser precision microfabrication (munich, 21-24 june 2003) 2 Treffer
- in-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing ii (edinburgh, 31 may - 1 june 2001) 1 Treffer
- photomask and next-generation lithography mask technology xiii (18-20 april, 2006, yokohama, japan) 1 Treffer
- photon processing in microelectronics and photonics ii (san jose ca, 27-30 january 2003) 1 Treffer
- photon processing in microelectronics and photonics iii (san jose ca, 26-29 january 2004) 1 Treffer
- smart sensors, actuators, and mems (maspalomas, 19-21 may 2003) 1 Treffer
Sprache
16 Treffer
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Pushing the Lithography Limit : Applying Inverse Lithography Technology (ILT) at the 65nm GenerationIn: Optical microlithography XIX (21-24 February 2006, San Jose, California, USA), 2006KonferenzZugriff:
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In: Photomask and next-generation lithography mask technology XIII (18-20 April, 2006, Yokohama, Japan), 2006KonferenzZugriff:
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In: 25th annual BACUS symposium on photomask technology (4-7 October, 2006, Monterey, California, USA), 2005KonferenzZugriff:
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In: 25th annual BACUS symposium on photomask technology (4-7 October, 2006, Monterey, California, USA), 2005KonferenzZugriff:
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In: 25th annual BACUS symposium on photomask technology (4-7 October, 2006, Monterey, California, USA), 2005KonferenzZugriff:
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In: Optical microlithography XIX (21-24 February 2006, San Jose, California, USA), 2006KonferenzZugriff:
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In: Optical microlithography XIX (21-24 February 2006, San Jose, California, USA), 2006KonferenzZugriff:
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In: 25th annual BACUS symposium on photomask technology (4-7 October, 2006, Monterey, California, USA), 2005KonferenzZugriff:
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In: 25th annual BACUS symposium on photomask technology (4-7 October, 2006, Monterey, California, USA), 2005KonferenzZugriff:
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In: 25th annual BACUS symposium on photomask technology (4-7 October, 2006, Monterey, California, USA), 2005KonferenzZugriff:
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In: Photon processing in microelectronics and photonics III (San Jose CA, 26-29 January 2004), 2004, S. 454-464KonferenzZugriff:
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In: Laser precision microfabrication (Munich, 21-24 June 2003), 2003, S. 157-162KonferenzZugriff:
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In: Photon processing in microelectronics and photonics II (San Jose CA, 27-30 January 2003), 2003, S. 473-480KonferenzZugriff:
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In: Laser precision microfabrication (Munich, 21-24 June 2003), 2003, S. 303-307KonferenzZugriff:
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In: Smart sensors, actuators, and MEMS (Maspalomas, 19-21 May 2003), 2003, S. 285-294KonferenzZugriff:
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In: In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II (Edinburgh, 31 May - 1 June 2001), 2001, S. 76-81KonferenzZugriff: