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Weniger Treffer
Gefunden in
Schlagwort
- electronic engineering 806 Treffer
- cmos 769 Treffer
- electronic, optical and magnetic materials 710 Treffer
- electrical engineering 690 Treffer
- hardware_performanceandreliability 684 Treffer
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45 weitere Werte:
- law 499 Treffer
- law.invention 499 Treffer
- materials chemistry 304 Treffer
- hardware_logicdesign 295 Treffer
- surfaces, coatings and films 247 Treffer
- atomic and molecular physics, and optics 223 Treffer
- hardware_general 184 Treffer
- transistor 184 Treffer
- radiation 174 Treffer
- amplifier 166 Treffer
- integrated circuit 164 Treffer
- voltage 152 Treffer
- safety, risk, reliability and quality 146 Treffer
- electronic circuit 137 Treffer
- chip 131 Treffer
- 02 engineering and technology 123 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 109 Treffer
- capacitor 89 Treffer
- mosfet 88 Treffer
- 020208 electrical & electronic engineering 87 Treffer
- instrumentation 77 Treffer
- metals and alloys 74 Treffer
- power (physics) 72 Treffer
- rf power amplifier 64 Treffer
- 020206 networking & telecommunications 63 Treffer
- hardware_arithmeticandlogicstructures 61 Treffer
- electrostatic discharge 55 Treffer
- capacitance 54 Treffer
- optoelectronics 51 Treffer
- reliability (semiconductor) 50 Treffer
- 01 natural sciences 47 Treffer
- circuit design 47 Treffer
- industrial and manufacturing engineering 47 Treffer
- low voltage 47 Treffer
- silicon on insulator 44 Treffer
- bandwidth (signal processing) 43 Treffer
- computer science::hardware architecture 43 Treffer
- direct-coupled amplifier 43 Treffer
- voltage-controlled oscillator 43 Treffer
- integrated circuit design 42 Treffer
- logic gate 41 Treffer
- inductor 40 Treffer
- nmos logic 40 Treffer
- 0103 physical sciences 39 Treffer
- low-power electronics 39 Treffer
Verlag
- elsevier bv 299 Treffer
- institute of electrical and electronics engineers (ieee) 299 Treffer
- iop publishing 188 Treffer
- institute of electronics, information and communications engineers (ieice) 63 Treffer
- wiley 25 Treffer
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24 weitere Werte:
- hal ccsd 21 Treffer
- springer science and business media llc 17 Treffer
- ieee 13 Treffer
- emerald 11 Treffer
- esd assoc 3 Treffer
- purdue university 2 Treffer
- aperta 1 Treffer
- arxiv 1 Treffer
- collegium basilea 1 Treffer
- elsevier 1 Treffer
- elsevier science 1 Treffer
- hindawi limited 1 Treffer
- ieee computer society 1 Treffer
- ieee-inst electrical electronics engineers inc 1 Treffer
- institute of electrical and electronics engineers 1 Treffer
- institute of electrical and electronics engineers inc. 1 Treffer
- institute of electronics, information and communication engineers 1 Treffer
- kth, mikro- och nanosystemteknik 1 Treffer
- linkopings universitet, elektroniska komponenter 1 Treffer
- lulea tekniska universitet, eislab 1 Treffer
- pleiades publishing ltd 1 Treffer
- spie 1 Treffer
- springer 1 Treffer
- transducer research foundation, inc. 1 Treffer
Publikation
- journal of semiconductors 187 Treffer
- ieee transactions on microwave theory and techniques 140 Treffer
- microelectronics reliability 125 Treffer
- solid-state electronics 100 Treffer
- ieee microwave and wireless components letters 73 Treffer
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31 weitere Werte:
- ieice electronics express 63 Treffer
- sensors and actuators a: physical 59 Treffer
- ieee transactions on semiconductor manufacturing 44 Treffer
- ieee transactions on electromagnetic compatibility 30 Treffer
- microwave and optical technology letters 24 Treffer
- microsystem technologies 16 Treffer
- ieee microwave magazine 12 Treffer
- microelectronics international 11 Treffer
- journal of electrostatics 10 Treffer
- indrastra global 3 Treffer
- measurement 2 Treffer
- microelectronic engineering 2 Treffer
- 2000 solid-state, actuators, and microsystems workshop technical digest 1 Treffer
- 2004 ieee international reliability physics symposium. proceedings 1 Treffer
- 2007 ieee radio frequency integrated circuits (rfic) symposium 1 Treffer
- advanced engineering materials 1 Treffer
- electrical overstress/electrostatic discharge symposium proceedings 1 Treffer
- electrical overstress/electrostatic discharge symposium proceedings 2000 (ieee cat. no.00th8476) 1 Treffer
- icmts 93 proceedings of the 1993 international conference on microelectronic test structures 1 Treffer
- ieee journal of solid-state circuits 1 Treffer
- ieee radio frequency integrated circuits (rfic) symposium, 2003 1 Treffer
- international journal of microwave science and technology 1 Treffer
- journal of non-crystalline solids 1 Treffer
- materials science in semiconductor processing 1 Treffer
- microelectronics journal 1 Treffer
- mrs bulletin 1 Treffer
- nanotechnology perceptions 1 Treffer
- proceedings of 35th european solid-state device research conference, 2005. essderc 2005. 1 Treffer
- russian microelectronics 1 Treffer
- sensors and actuators. a: physical 1 Treffer
- smart materials and structures 1 Treffer
Sprache
1.009 Treffer
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In: Solid-State Electronics, Jg. 135 (2017-09-01), S. 100-104Online unknownZugriff:
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In: IEEE Transactions on Microwave Theory and Techniques, Jg. 65 (2017-11-01), S. 4418-4427Online unknownZugriff:
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In: IEEE Transactions on Microwave Theory and Techniques, Jg. 65 (2017-11-01), S. 4241-4254Online unknownZugriff:
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In: Microsystem Technologies, Jg. 24 (2017-04-24), S. 503-510Online unknownZugriff:
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In: IEEE Transactions on Electromagnetic Compatibility, Jg. 59 (2017-04-01), S. 662-669Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 69 (2017-02-01), S. 52-59Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 67 (2016-12-01), S. 74-81Online unknownZugriff:
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In: IEEE Microwave Magazine, Jg. 17 (2016-12-01), S. 55-69Online unknownZugriff:
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In: IEEE Transactions on Microwave Theory and Techniques, Jg. 64 (2016-12-01), S. 4241-4249Online unknownZugriff:
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In: IEEE Transactions on Microwave Theory and Techniques, Jg. 64 (2016-11-01), S. 3612-3622Online unknownZugriff:
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In: Solid-State Electronics, Jg. 124 (2016-10-01), S. 28-34Online unknownZugriff:
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In: IEEE Transactions on Microwave Theory and Techniques, Jg. 64 (2016-07-01), S. 2294-2303Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 73 (2017-06-01), S. 116-121Online unknownZugriff:
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In: IEEE Microwave and Wireless Components Letters, Jg. 27 (2017-07-01), S. 651-653Online unknownZugriff:
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In: IEEE Transactions on Microwave Theory and Techniques, Jg. 64 (2016-06-01), S. 1736-1744Online unknownZugriff:
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In: Microsystem Technologies, Jg. 23 (2016-05-27), S. 4245-4253Online unknownZugriff:
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In: Microsystem Technologies, Jg. 23 (2016-05-19), S. 4211-4219Online unknownZugriff:
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In: IEEE Transactions on Microwave Theory and Techniques, Jg. 64 (2016-05-01), S. 1655-1666Online unknownZugriff:
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In: Microwave and Optical Technology Letters, Jg. 58 (2016-04-23), S. 1560-1563Online unknownZugriff:
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In: Microwave and Optical Technology Letters, Jg. 58 (2016-03-28), S. 1374-1377Online unknownZugriff: