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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- condensed matter: structure, mechanical and thermal properties 49 Treffer
- etat condense: structure, proprietes mecaniques et thermiques 49 Treffer
- cross-disciplinary physics: materials science; rheology 45 Treffer
- domaines interdisciplinaires: science des materiaux; rheologie 45 Treffer
- spectre photoelectron uv 38 Treffer
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45 weitere Werte:
- ultraviolet photoelectron spectra 38 Treffer
- spectre photoelectron rx 27 Treffer
- x-ray photoelectron spectra 27 Treffer
- electron and ion emission by liquids and solids; impact phenomena 23 Treffer
- emissions electronique et ionique; phenomenes d'impact 23 Treffer
- spectrometrie photoelectron 23 Treffer
- compose mineral 22 Treffer
- inorganic compounds 21 Treffer
- etude experimentale 20 Treffer
- experimental study 20 Treffer
- metal transition 20 Treffer
- photoelectron spectroscopy 20 Treffer
- photoemission and photoelectron spectra 20 Treffer
- photoemission et spectres photoelectroniques 20 Treffer
- electronic structure 18 Treffer
- electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures 18 Treffer
- structure electronique 18 Treffer
- structure electronique et proprietes electriques des surfaces, interfaces, couches minces et structures de basse dimensionnalite 18 Treffer
- transition elements 18 Treffer
- silicon 13 Treffer
- ups 13 Treffer
- couche mince 12 Treffer
- silicium 12 Treffer
- thin films 12 Treffer
- xps 11 Treffer
- etats electroniques de surface et d'interface 10 Treffer
- interface solide solide 10 Treffer
- semiconductor materials 10 Treffer
- solid-solid interfaces 10 Treffer
- surface and interface electron states 10 Treffer
- transition element compounds 10 Treffer
- si 9 Treffer
- interfaces, heterostructures, nanostructures 8 Treffer
- interfaces; heterostructures; nanostructures 8 Treffer
- organic semiconductors 7 Treffer
- oxygen 7 Treffer
- oxygene 7 Treffer
- semiconducteur organique 7 Treffer
- ag 6 Treffer
- argent 6 Treffer
- bande valence 6 Treffer
- charge transfer 6 Treffer
- etats de surface, structure de bande, densite d'etats electroniques 6 Treffer
- photoemission 6 Treffer
- pulverisation irradiation 6 Treffer
Verlag
Publikation
- icsfs-10: proceedings of the tenth international conference on solid films and surfaces, princeton, new jersey, july 9-13, 2000 4 Treffer
- 13th applied surface analysis workshop, dresden, september 14th-17th 2004 (aofa 13) 3 Treffer
- proceedings of the seventh international conference on the formation of semiconductor interfaces, goteborg, sweden, june 21-25, 1999 3 Treffer
- the ninth international conference on the formation of semiconductor interfaces, icfsi-9, madrid, etsii, spain, september 15-19, 2003 3 Treffer
- 4th international conference on photo-excited processes and applications (4-icpepa) 1 Treffer
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4 weitere Werte:
- acsin-5, proceedings of the fifth international symposium on atomically controlled surfaces, interfaces and nanostructures, aix en provence, france, july 6-9, 1999 1 Treffer
- icmat 05: symposium l: materials physics at interfaces 1 Treffer
- nanometre science and technology / nano-5 1 Treffer
- the 5th international vacuum electron sources conference (ivesc 2004), beijing, china, september 6-10, 2004 1 Treffer
Sprache
72 Treffer
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In: 13th Applied Surface Analysis Workshop, Dresden, September 14th-17th 2004 (AOFA 13), Jg. 252 (2005), Heft 1, S. 108-112KonferenzZugriff:
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In: Applied surface science, Jg. 257 (2011), Heft 23, S. 9785-9790academicJournalZugriff:
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In: Applied surface science, Jg. 252 (2005), Heft 5, S. 1801-1805academicJournalZugriff:
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In: 13th Applied Surface Analysis Workshop, Dresden, September 14th-17th 2004 (AOFA 13), Jg. 252 (2005), Heft 1, S. 89-93KonferenzZugriff:
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In: Applied surface science, Jg. 284 (2013), S. 514-522academicJournalZugriff:
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In: Applied surface science, Jg. 258 (2011), Heft 2, S. 780-785academicJournalZugriff:
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In: Applied surface science, Jg. 45 (1990), Heft 1, S. 71-83academicJournalZugriff:
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In: Applied surface science, Jg. 37 (1989), Heft 4, S. 419-438academicJournalZugriff:
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In: Applied surface science, Jg. 305 (2014), S. 396-401academicJournalZugriff:
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In: The Ninth International Conference on the Formation of Semiconductor Interfaces, ICFSI-9, Madrid, ETSII, Spain, September 15-19, 2003, Jg. 234 (2004), Heft 1-4, S. 497-502KonferenzZugriff:
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In: Applied surface science, Jg. 236 (2004), Heft 1-4, S. 473-478academicJournalZugriff:
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In: Applied surface science, Jg. 222 (2004), Heft 1-4, S. 399-408academicJournalZugriff:
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In: Applied surface science, Jg. 276 (2013), S. 497-501academicJournalZugriff:
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In: Applied surface science, Jg. 258 (2012), Heft 16, S. 5996-6002academicJournalZugriff:
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In: Applied surface science, Jg. 255 (2009), Heft 18, S. 8183-8189academicJournalZugriff:
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In: Applied surface science, Jg. 254 (2008), Heft 15, S. 4572-4576academicJournalZugriff:
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In: Applied surface science, Jg. 250 (2005), Heft 1-4, S. 57-62academicJournalZugriff:
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In: The 5th International Vacuum Electron Sources Conference (IVESC 2004), Beijing, China, September 6-10, Jg. 251 (2005), Heft 1-4, S. 14-18KonferenzZugriff:
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In: Applied surface science, Jg. 276 (2013), S. 101-111academicJournalZugriff:
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In: Applied surface science, Jg. 270 (2013), S. 364-369academicJournalZugriff: