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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- conception. technologies. analyse fonctionnement. essais 158 Treffer
- design. technologies. operation analysis. testing 158 Treffer
- circuits electriques, optiques et optoelectroniques 96 Treffer
- electric, optical and optoelectronic circuits 96 Treffer
- circuit properties 91 Treffer
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45 weitere Werte:
- proprietes des circuits 91 Treffer
- circuits electroniques 90 Treffer
- electronic circuits 90 Treffer
- transistors 78 Treffer
- circuit integre 51 Treffer
- circuito integrado 51 Treffer
- integrated circuit 51 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 38 Treffer
- electronic equipment and fabrication. passive components, printed wiring boards, connectics 38 Treffer
- electronique faible puissance 36 Treffer
- low-power electronics 36 Treffer
- mosfet 33 Treffer
- transistor mosfet 33 Treffer
- amplificateurs 32 Treffer
- amplifiers 32 Treffer
- implementacion 31 Treffer
- implementation 31 Treffer
- circuit design 29 Treffer
- conception circuit 29 Treffer
- diseno circuito 29 Treffer
- circuits numeriques 28 Treffer
- digital circuits 28 Treffer
- electronica potencia 28 Treffer
- electronique puissance 28 Treffer
- power electronics 28 Treffer
- transistor 24 Treffer
- circuit integre cmos 23 Treffer
- cmos integrated circuits 23 Treffer
- convertisseurs de signal 22 Treffer
- damaging 22 Treffer
- deterioracion 22 Treffer
- endommagement 22 Treffer
- fiabilidad 22 Treffer
- fiabilite 22 Treffer
- optimisation 22 Treffer
- optimizacion 22 Treffer
- optimization 22 Treffer
- reliability 22 Treffer
- signal convertors 22 Treffer
- delay time 20 Treffer
- miniaturisation 20 Treffer
- miniaturizacion 20 Treffer
- miniaturization 20 Treffer
- silicio 20 Treffer
- silicium 20 Treffer
Publikation
- microelectronics journal 53 Treffer
- microelectronics and reliability 46 Treffer
- integration (amsterdam) 31 Treffer
- solid-state electronics 23 Treffer
- microelectronic engineering 10 Treffer
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24 weitere Werte:
- organic electronics (print) 4 Treffer
- materials science & engineering. b, solid-state materials for advanced technology 3 Treffer
- 16th european symposium on reliability of electron devices, failure physics and analysis (esref 2005), arcachon, france, october 10-14, 2005 2 Treffer
- amf/rf[ams/rf] cmos circuit design for wireless transceivers 2 Treffer
- cryogenics (guildford) 2 Treffer
- dielectrics in microelectronics (wodim 2004) 2 Treffer
- selected extended papers from ulis 2012 conference 2 Treffer
- signal processing 2 Treffer
- special issue: containing papers presented at the 2001 lawrence symposium on critical issues in epitaxy, january 3-6, 2001, scottsdale arizona 2 Treffer
- 17th european symposium on reliability of electron devices, failure physics and analysis (esref 2006), wuppertal, germany, 3-6 october 2006 1 Treffer
- 2009 international electron devices and materials symposium (iedms) 1 Treffer
- current trends in nanotechnologies: from materials to systems, proceedings of symposium s, emrs spring meeting 2001, strasbourg, france, june 5-8, 2001 1 Treffer
- displays 1 Treffer
- european materials research society (e-mrs) 2001, spring meeting, symposium d: second international conference on silicon epitaxy and heterostructures, strasbourg, france, june 4-8th 2001 1 Treffer
- hardware architectures for algebra, cryptology and number theory 1 Treffer
- lcos - a disruptive microdisplay technology for large screen displays 1 Treffer
- materials science & engineering c. biomimetic and supramolecular systems 1 Treffer
- micro/nano devices and systems 2013: an open thematic journal issue 1 Treffer
- papers selected from the ultimate integration on silicon conference 2009, ulis 2009 1 Treffer
- physica. e, low-dimentional systems and nanostructures 1 Treffer
- proceedings of the e-mrs 2008 symposium c: frontiers in silicon-based photonics e-mrs symposium c 1 Treffer
- reliability of electron devices, failure physics and analysis 1 Treffer
- selected papers from the essderc 2011 conference 1 Treffer
- special issue with papers selected from the ultimate integration on silicon conference, ulis 2008 1 Treffer
Sprache
177 Treffer
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In: Microelectronics and reliability, Jg. 54 (2014), Heft 1, S. 90-99academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 4, S. 510-531academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 47 (2014), Heft 1, S. 48-61academicJournalZugriff:
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-state electronics, Jg. 91 (2014), S. 81-86academicJournalZugriff:
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In: Micro/Nano Devices and Systems 2013: An open thematic journal issue, Jg. 119 (2014), S. 89-94academicJournalZugriff:
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In: Solid-state electronics, Jg. 91 (2014), S. 91-99academicJournalZugriff:
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In: Signal processing, Jg. 104 (2014), S. 401-406academicJournalZugriff:
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In: Solid-state electronics, Jg. 91 (2014), S. 137-146academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 3, S. 349-355academicJournalZugriff:
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In: Solid-state electronics, Jg. 73 (2012), S. 15-20academicJournalZugriff:
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In: Solid-state electronics, Jg. 82 (2013), S. 41-45academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 51 (2011), Heft 12, S. 2357-2365academicJournalZugriff:
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In: Microelectronic engineering, Jg. 88 (2011), Heft 6, S. 888-901academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 44 (2011), Heft 2, S. 136-143academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 43 (2010), Heft 3, S. 251-257academicJournalZugriff:
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In: Integration (Amsterdam), Jg. 45 (2012), Heft 1, S. 33-45academicJournalZugriff:
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In: Solid-state electronics, Jg. 53 (2009), Heft 10, S. 1092-1098academicJournalZugriff:
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In: Solid-state electronics, Jg. 63 (2011), Heft 1, S. 14-18academicJournalZugriff:
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In: Microelectronics journal, Jg. 42 (2011), Heft 5, S. 785-789academicJournalZugriff:
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In: Microelectronics journal, Jg. 42 (2011), Heft 2, S. 396-402academicJournalZugriff: