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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- transistors 281 Treffer
- circuits electriques, optiques et optoelectroniques 124 Treffer
- electric, optical and optoelectronic circuits 124 Treffer
- circuit properties 108 Treffer
- proprietes des circuits 108 Treffer
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45 weitere Werte:
- circuits electroniques 97 Treffer
- electronic circuits 97 Treffer
- silicon on insulator technology 74 Treffer
- technologie silicium sur isolant 74 Treffer
- tecnologia silicio sobre aislante 74 Treffer
- dual gate transistor 64 Treffer
- transistor de compuerta doble 64 Treffer
- transistor grille double 64 Treffer
- circuit integre 62 Treffer
- circuito integrado 62 Treffer
- cmos integrated circuits 62 Treffer
- integrated circuit 62 Treffer
- circuit integre cmos 61 Treffer
- seuil tension 55 Treffer
- umbral tension 55 Treffer
- voltage threshold 55 Treffer
- mos technology 54 Treffer
- technologie mos 54 Treffer
- tecnologia mos 54 Treffer
- damaging 53 Treffer
- deterioracion 53 Treffer
- endommagement 53 Treffer
- self aligned technology 51 Treffer
- technologie autoalignee 51 Treffer
- tecnologia rejilla autoalineada 51 Treffer
- nmos technology 50 Treffer
- technologie nmos 50 Treffer
- tecnologia nmos 50 Treffer
- electronique faible puissance 49 Treffer
- low-power electronics 49 Treffer
- circuit design 48 Treffer
- conception circuit 48 Treffer
- diseno circuito 48 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 46 Treffer
- electronic equipment and fabrication. passive components, printed wiring boards, connectics 46 Treffer
- alto rendimiento 42 Treffer
- haute performance 42 Treffer
- high performance 42 Treffer
- miniaturisation 42 Treffer
- miniaturizacion 42 Treffer
- miniaturization 42 Treffer
- canal corto 40 Treffer
- canal court 40 Treffer
- grille transistor 40 Treffer
- optics 40 Treffer
Verlag
- institute of electrical and electronics engineers 170 Treffer
- elsevier 35 Treffer
- elsevier science 26 Treffer
- ieee 24 Treffer
- electrochemical society 18 Treffer
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16 weitere Werte:
- institute of physics 10 Treffer
- oxford university press 8 Treffer
- spie 6 Treffer
- springer 5 Treffer
- institution of engineering and technology 4 Treffer
- taylor & francis 4 Treffer
- american scientific publishers 2 Treffer
- business center for academic societies 2 Treffer
- ieee society 2 Treffer
- institution of electrical engineers 2 Treffer
- acm 1 Treffer
- association for computing machinery 1 Treffer
- edp sciences 1 Treffer
- ieee computer society 1 Treffer
- international microelectronics and packaging society 1 Treffer
- world scientific publishing 1 Treffer
Publikation
- i.e.e.e. transactions on electron devices 79 Treffer
- ieee electron device letters 33 Treffer
- solid-state electronics 23 Treffer
- proceedings - electrochemical society 18 Treffer
- microelectronics and reliability 15 Treffer
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45 weitere Werte:
- ieee microwave and wireless components letters 13 Treffer
- ieee transactions on microwave theory and techniques 13 Treffer
- microelectronic engineering 13 Treffer
- ieee transactions on nanotechnology 9 Treffer
- semiconductor science and technology 9 Treffer
- ieee journal of solid-state circuits 8 Treffer
- ieee transactions on semiconductor manufacturing 8 Treffer
- ieice transactions on electronics 8 Treffer
- microelectronics journal 7 Treffer
- silicon-on-insulator technology and devices xi (paris, 28 april - 2 may 2003) 6 Treffer
- infos 2007: proceedings of the 15th biennial conference on insulating films on semiconductors, june 20-23, 2007, glyfada athens, greece 5 Treffer
- spie proceedings series 5 Treffer
- 2004 ieee international soi conference (charleston sc, 4-7 october 2004) 4 Treffer
- ieee transactions on very large scale integration (vlsi) systems 4 Treffer
- international journal of electronics 4 Treffer
- 2004 ieee international reliability physics symposium proceedings, 42nd annual (phoenix az, 25-29 april 2004) 3 Treffer
- ieee international electron devices meeting 2004 (iedm technical digest) 3 Treffer
- iet circuits, devices & systems (print) 3 Treffer
- journal of computational electronics (print) 3 Treffer
- ulsi process integration iii (paris, 28 april - 2 may 2003) 3 Treffer
- 2002 symposium on vlsi technology (honolulu hi, 11-13 june 2002, digest of technical papers) 2 Treffer
- 2004 ieee international integrated reliability workshop (final report) 2 Treffer
- 2004 ieee international symposium on circuits and systems (proceedings) 2 Treffer
- 2004 international conference on microelectronic test structures (march 22-25, 2004, awaji yumebutai international conference center, japan) 2 Treffer
- 2004 symposium on vlsi technology (digest of technical papers) 2 Treffer
- 3rd international sige technology and device meeting (princeton, new jersey, 15-17 may 2006) 2 Treffer
- advanced gate stack, source/drain and channel engineering for si-based cmos : naw materials, processes, and equipment (quebec pq, 16-18 may 2005) 2 Treffer
- advanced short-time thermal processing for si-based cmos devices (paris, 27 april - 2 may 2003) 2 Treffer
- advanced short-time thermal processing for si-based cmos devices ii (san antonio tx, 10-12 may 2004) 2 Treffer
- electron devices (san francisco ca, 8-11 december 2002, technical digest) 2 Treffer
- electronics letters 2 Treffer
- eurosoi'06 conference. selected papers 2 Treffer
- integration (amsterdam) 2 Treffer
- journal of low power electronics (print) 2 Treffer
- noise in devices and circuits ii (maspalomas, 26-28 may 2004) 2 Treffer
- proceedings of the ieee 2 Treffer
- 16th european symposium on reliability of electron devices, failure physics and analysis (esref 2005), arcachon, france, october 10-14, 2005 1 Treffer
- 17th international conference on vlsi design (concurrently with the 3rd international conference on embedded systems design) 1 Treffer
- 2004 24th internationcal conference on microelectronics (nis, serbia and montenegro, 16-19 may 20) 1 Treffer
- 2004 european solid state circuits conference (esscirc) 1 Treffer
- 2005 custom integrated circuits conference 1 Treffer
- 2009 international electron devices and materials symposium (iedms) 1 Treffer
- 35th european microwave conference, paris, october 3-7, 2005 1 Treffer
- circuits, systems, and signal processing 1 Treffer
- design methodologies for nanoelectronic digital and analogue circuits 1 Treffer
Sprache
321 Treffer
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A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuitsIn: Solid-state electronics, Jg. 91 (2014), S. 81-86academicJournalZugriff:
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In: INFOS 2007: Proceedings of the 15th Biennial Conference on Insulating Films on Semiconductors, June 20-23, Jg. 84 (2007), Heft 9-10, S. 2101-2104KonferenzZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 19 (2006), Heft 1, S. 10-18Online KonferenzZugriff:
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In: ICCAD-2005 (International Conference on Computer Aided Design), 2005, S. 207-210KonferenzZugriff:
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In: PESC'04 (2004 IEEE 35th annual power electronics specialists conference), 2004, S. 4486-4491KonferenzZugriff:
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In: 2005 Custom Integrated Circuits Conference, Jg. 41 (2006), Heft 8, S. 1830-1845Online KonferenzZugriff:
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In: IEEE journal of solid-state circuits, Jg. 48 (2013), Heft 10, S. 2296-2308Online academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 3, S. 349-355academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 60 (2013), Heft 11, S. 3726-3733Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 60 (2013), Heft 12, S. 4173-4179Online academicJournalZugriff:
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In: Frontiers in Electronics: Future Chips, Jg. 12 (2002), Heft 2, S. 563-572KonferenzZugriff:
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In: INFOS 2007: Proceedings of the 15th Biennial Conference on Insulating Films on Semiconductors, June 20-23, Jg. 84 (2007), Heft 9-10, S. 2398-2403KonferenzZugriff:
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In: 2004 IEEE international reliability physics symposium proceedings, 42nd annual (Phoenix AZ, 25-29 April 2004), 2004, S. 110-116KonferenzZugriff:
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In: Reliability of electron devices, failure physics and analysis, Jg. 44 (2004), Heft 9-11, S. 1519-1522KonferenzZugriff:
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In: 2004 IEEE International Symposium on Circuits and Systems (proceedings), 2004, S. 661-664KonferenzZugriff:
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In: Solid-state electronics, Jg. 51 (2007), Heft 1, S. 48-56academicJournalZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 25 (2012), Heft 2, S. 255-265Online academicJournalZugriff:
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In: IEICE transactions on electronics, Jg. 95 (2012), Heft 6, S. 1104-1109academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 60 (2013), Heft 3, S. 972-977Online academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 57 (2010), Heft 9, S. 2073-2079Online academicJournalZugriff: