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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- applied sciences 436 Treffer
- sciences appliquees 436 Treffer
- electronics 413 Treffer
- electronique 413 Treffer
- electronique des semiconducteurs. microelectronique. optoelectronique. dispositifs a l'etat solide 270 Treffer
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45 weitere Werte:
- semiconductor electronics. microelectronics. optoelectronics. solid state devices 270 Treffer
- transistors 177 Treffer
- transistor 122 Treffer
- optics 110 Treffer
- optique 110 Treffer
- transistor bipolaire 107 Treffer
- electronica 106 Treffer
- bipolar transistor 103 Treffer
- telecommunications 84 Treffer
- physics 81 Treffer
- physique 81 Treffer
- condensed state physics 80 Treffer
- physique de l'etat condense 80 Treffer
- silicium 69 Treffer
- silicon 69 Treffer
- transistor bipolar 67 Treffer
- integrated circuits 64 Treffer
- circuits integres 63 Treffer
- cristallographie cristallogenese 60 Treffer
- crystallography 60 Treffer
- etude experimentale 59 Treffer
- experimental study 59 Treffer
- circuit integre 58 Treffer
- evaluacion prestacion 58 Treffer
- evaluation performance 58 Treffer
- performance evaluation 58 Treffer
- caracteristique electrique 53 Treffer
- conception. technologies. analyse fonctionnement. essais 52 Treffer
- design. technologies. operation analysis. testing 52 Treffer
- electrical characteristic 51 Treffer
- circuits electriques, optiques et optoelectroniques 50 Treffer
- electric, optical and optoelectronic circuits 50 Treffer
- caracteristica electrica 48 Treffer
- fabrication microelectronique 48 Treffer
- integrated circuit 48 Treffer
- electromagnetism 47 Treffer
- electromagnetisme 47 Treffer
- electromagnetismo 47 Treffer
- estudio experimental 47 Treffer
- gain courant 47 Treffer
- circuit properties 45 Treffer
- current gain 45 Treffer
- proprietes des circuits 45 Treffer
- silicio 45 Treffer
- transistor n p n 45 Treffer
Verlag
- institute of electrical and electronics engineers 70 Treffer
- elsevier science 50 Treffer
- elsevier 46 Treffer
- institution of electrical engineers 42 Treffer
- ieee 28 Treffer
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43 weitere Werte:
- american institute of physics 19 Treffer
- spie 18 Treffer
- institute of physics 17 Treffer
- taylor & francis 11 Treffer
- springer 10 Treffer
- japanese journal of applied physics 9 Treffer
- american chemical society 7 Treffer
- electrochemical society 5 Treffer
- institution of engineering and technology 5 Treffer
- wiley 5 Treffer
- wiley-vch 4 Treffer
- atomic energy society of japan 3 Treffer
- ieee japan 3 Treffer
- oxford university press 3 Treffer
- taylor and francis 3 Treffer
- american geophysical union 2 Treffer
- american meteorological society 2 Treffer
- edp sciences 2 Treffer
- nec creative 2 Treffer
- blackwell 1 Treffer
- communications society 1 Treffer
- general electric company 1 Treffer
- institute of metal finishing 1 Treffer
- institute of pure and applied physics 1 Treffer
- institution of electrical engineers, publishing department 1 Treffer
- international business machines 1 Treffer
- interperiodica 1 Treffer
- kluwer 1 Treffer
- masson 1 Treffer
- optical society of america 1 Treffer
- paris regies 1 Treffer
- pergamon 1 Treffer
- physical society of japan 1 Treffer
- preston publications 1 Treffer
- ptetis 1 Treffer
- ran 1 Treffer
- royal society of chemistry 1 Treffer
- society for industrial and applied mathematics 1 Treffer
- techniques de l'ingenieur 1 Treffer
- university of bologna 1 Treffer
- vch 1 Treffer
- veb 1 Treffer
- world scientific publishing 1 Treffer
Publikation
- electronics letters 39 Treffer
- i.e.e.e. transactions on electron devices 25 Treffer
- solid-state electronics 24 Treffer
- applied physics letters 13 Treffer
- semiconductor science and technology 13 Treffer
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45 weitere Werte:
- ieee electron device letters 12 Treffer
- spie proceedings series 12 Treffer
- microelectronics and reliability 10 Treffer
- international journal of electronics 9 Treffer
- japanese journal of applied physics 9 Treffer
- journal of nuclear materials 9 Treffer
- microelectronics journal 9 Treffer
- iee proceedings. circuits, devices and systems 7 Treffer
- proceedings of spie, the international society for optical engineering 6 Treffer
- ieee journal of solid-state circuits 5 Treffer
- ieee transactions on microwave theory and techniques 5 Treffer
- bctm : bipolar /bicmos circuits and technology meeting (minneapolis mn, 29 september - 1 october 2002) 4 Treffer
- bctm proceedings 2004 (proceedings of the 2004 bipolar/bicmos circuits and technology meetings) 4 Treffer
- ispsd '02 : 14th international symposium on power semiconductor devices & ics (santa fe nm, 4-7 june 2002) 4 Treffer
- journal of applied physics 4 Treffer
- journal of the electrochemical society 4 Treffer
- physica status solidi. a. applied research 4 Treffer
- 12th international symposium on power semiconductor devices & ics (toulouse, 22-25 may 2000) 3 Treffer
- ieee microwave and wireless components letters 3 Treffer
- ieee transactions on semiconductor manufacturing 3 Treffer
- ispsd '04 (proceedings of the 16th international symposium on power semiconductor devices & ics) 3 Treffer
- journal of electronic materials 3 Treffer
- journal of nuclear science and technology 3 Treffer
- journal of the american chemical society 3 Treffer
- lecture notes in computer science 3 Treffer
- noise in devices and circuits iii (24-26 may 2005, austin, texas, usa) 3 Treffer
- thin solid films 3 Treffer
- 3rd international sige technology and device meeting (princeton, new jersey, 15-17 may 2006) 2 Treffer
- applied surface science 2 Treffer
- bipolar bicmos/cmos devices and technologies 2 Treffer
- extremes (boston) 2 Treffer
- ieee transactions on circuits and systems. 2, analog and digital signal processing 2 Treffer
- ieee transactions on computer-aided design of integrated circuits and systems 2 Treffer
- integration (amsterdam) 2 Treffer
- journal of applied polymer science 2 Treffer
- journal of microelectromechanical systems 2 Treffer
- journal of physics. condensed matter (print) 2 Treffer
- macromolecular chemistry and physics (print) 2 Treffer
- materials science in semiconductor processing 2 Treffer
- microelectronic device technology ii (santa clara ca, 23-24 september 1998) 2 Treffer
- microelectronic device technology iii (santa clara ca, 22-23 september 1999) 2 Treffer
- nec research & development 2 Treffer
- optics communications 2 Treffer
- physica. b, condensed matter 2 Treffer
- radiation effects and defects in solids 2 Treffer
Sprache
Geographischer Bezug
503 Treffer
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In: Fullerenes, nanotubes, and carbon nanostructures (Print), Jg. 21 (2013), Heft 1-5, S. 213-232academicJournalZugriff:
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In: IEEE transactions on nanotechnology, Jg. 12 (2013), Heft 6, S. 1178-1184Online academicJournalZugriff:
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In: IEEE transactions on microwave theory and techniques, Jg. 59 (2011), Heft 12, S. 3195-3205Online academicJournalZugriff:
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In: IEEE transactions on microwave theory and techniques, Jg. 54 (2006), Heft 4, S. 1363-1369Online academicJournalZugriff:
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In: IEEE transactions on very large scale integration (VLSI) systems, Jg. 15 (2007), Heft 2, S. 182-195Online academicJournalZugriff:
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In: Implementating intelligence on silicon integrated circuits _ Part II: New architectures and algorithms, Jg. 24 (1998), Heft 1-2, S. 43-61Online academicJournalZugriff:
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In: IEEE transactions on circuits and systems. 2, Analog and digital signal processing, Jg. 42 (1995), Heft 3, S. 220-224Online academicJournalZugriff:
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In: Fuzzy sets and systems, Jg. 71 (1995), Heft 2, S. 155-163Online academicJournalZugriff:
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In: Tetrahedron (Oxford. Print), Jg. 67 (2011), Heft 30academicJournalZugriff:
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In: Journal of the Physical Society of Japan, Jg. 77 (2008), Heft 7academicJournalZugriff:
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In: Japanese journal of applied physics, Jg. 32 (1993), Heft 5B, S. 2521-2524academicJournalZugriff:
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In: Device modelling for the 1990s, Jg. 26 (1995), Heft 2-3, S. 255-259academicJournalZugriff:
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In: Macromolecules (Print), Jg. 47 (2014), Heft 15, S. 4971-4978academicJournalZugriff:
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In: Noise in devices and circuits III (24-26 May 2005, Austin, Texas, USA), 2005, S. 150-157KonferenzZugriff:
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In: Noise in devices and circuits III (24-26 May 2005, Austin, Texas, USA), 2005, S. 132-142KonferenzZugriff:
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In: ISPSD '04 (proceedings of the 16th International Symposium on Power Semiconductor Devices & ICs), 2004, S. 285-287KonferenzZugriff:
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In: Signals and electronic systems (proceedings), 2005, S. 461-464KonferenzZugriff:
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In: 2004 IEEE / SEMI advanced semiconductor manufacturing conference and workshop (Boston MA, May 4-6, 2004), 2004, S. 66-69KonferenzZugriff:
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In: 2004 international conference on microelectronic test structures (March 22-25, 2004, S. 127-131KonferenzZugriff:
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In: Proceedings of Eurosensors XIII, The Hague, Jg. 85 (2000), Heft 1-3, S. 70-74Online KonferenzZugriff: