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In: Ultramicroscopy, Jg. 94 (2003), Heft 3-4, S. 277-281academicJournalZugriff:
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In: SPM 2002: Proceedings of the Fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Las Vegas, Nevada, USA, May 26-29, Jg. 97 (2003), Heft 1-4, S. 467-472KonferenzZugriff:
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In: Ultramicroscopy, Jg. 11 (1983), Heft 4, S. 303-305academicJournalZugriff: