Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- components, circuits, devices and systems 11 Treffer
- fault tolerant systems 11 Treffer
- circuit faults 9 Treffer
- computing and processing 9 Treffer
- communication, networking and broadcast technologies 6 Treffer
-
45 weitere Werte:
- fpga 6 Treffer
- fault-tolerance 5 Treffer
- sram-based fpga 5 Treffer
- table lookup 5 Treffer
- aging 4 Treffer
- algorithms 4 Treffer
- computer architecture 4 Treffer
- configuration management 4 Treffer
- engineered materials, dielectrics and plasmas 4 Treffer
- fabrics 4 Treffer
- fault-tolerant computing 4 Treffer
- graceful degradation 4 Treffer
- integrated circuit fault tolerance 4 Treffer
- resilience 4 Treffer
- runtime 4 Treffer
- stress 4 Treffer
- tiles 4 Treffer
- fault detection 3 Treffer
- random access memory 3 Treffer
- routing 3 Treffer
- switches 3 Treffer
- bioengineering 2 Treffer
- circuit testing 2 Treffer
- costs 2 Treffer
- electrical fault detection 2 Treffer
- general topics for engineers 2 Treffer
- graph theory 2 Treffer
- hardware 2 Treffer
- logic gates 2 Treffer
- logic testing 2 Treffer
- look-up table 2 Treffer
- partial reconfiguration 2 Treffer
- power, energy and industry applications 2 Treffer
- programmable logic arrays 2 Treffer
- reconfigurable logic 2 Treffer
- redundancy 2 Treffer
- runtime reconfiguration 2 Treffer
- signal processing and analysis 2 Treffer
- single event upset 2 Treffer
- triple modular redundancy 2 Treffer
- aging mitigation 1 Treffer
- application software 1 Treffer
- application specific integrated circuits 1 Treffer
- arrays 1 Treffer
- automatic testing 1 Treffer
Publikation
- ieee transactions on computers 4 Treffer
- 13th ieee symposium on design and diagnostics of electronic circuits and systems, design and diagnostics of electronic circuits and systems (ddecs), 2010 ieee 13th international symposium on 1 Treffer
- 14th ieee international symposium on design and diagnostics of electronic circuits and systems, design and diagnostics of electronic circuits & systems (ddecs), 2011 ieee 14th international symposium on 1 Treffer
- 18th international conference on vlsi design held jointly with 4th international conference on embedded systems design, vlsi design, 2005. 18th international conference on, vlsi design 1 Treffer
- 2002 ieee international symposium on circuits and systems (iscas), circuits and systems (iscas), 2002 ieee international symposium on, circuits and systems 1 Treffer
-
10 weitere Werte:
- 2010 ieee computer society annual symposium on vlsi, vlsi (isvlsi), 2010 ieee computer society annual symposium on 1 Treffer
- 2011 14th euromicro conference on digital system design, digital system design (dsd), 2011 14th euromicro conference on 1 Treffer
- 2011 international conference on reconfigurable computing and fpgas, reconfigurable computing and fpgas (reconfig), 2011 international conference on 1 Treffer
- 2012 19th ieee international conference on electronics, circuits, and systems (icecs 2012), electronics, circuits and systems (icecs), 2012 19th ieee international conference on 1 Treffer
- 2013 7th international conference on intelligent systems and control (isco), intelligent systems and control (isco), 2013 7th international conference on 1 Treffer
- 2016 29th international conference on vlsi design and 2016 15th international conference on embedded systems (vlsid), vlsi design and 2016 15th international conference on embedded systems (vlsid), 2016 29th international conference on 1 Treffer
- proceedings 1999 ieee international symposium on defect and fault tolerance in vlsi systems (eft'99), defect and fault tolerance in vlsi systems, 1999. dft '99. international symposium on, defect and fault tolerance in vlsi systems 1 Treffer
- proceedings 1999 pacific rim international symposium on dependable computing, dependable computing, 1999. proceedings. 1999 pacific rim international symposium on, dependable computing 1 Treffer
- proceedings ed&tc european design and test conference, european design and test conference, 1996. ed&tc 96. proceedings, european design and test conference 1 Treffer
- proceedings of the ninth asian test symposium, test symposium, 2000. (ats 2000). proceedings of the ninth asian, asian test symposium 1 Treffer
Sprache
16 Treffer
-
In: 2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012), 2012-12-01, S. 761-764KonferenzZugriff:
-
In: 2010 IEEE Computer Society Annual Symposium on VLSI, 2010-07-01, S. 58-62KonferenzZugriff:
-
In: 2013 7th International Conference on Intelligent Systems and Control (ISCO), 2013, S. 265-270KonferenzZugriff:
-
In: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2011-04-01, S. 139-142KonferenzZugriff:
-
In: 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2010-04-01, S. 305-308KonferenzZugriff:
-
In: IEEE Transactions on Computers, Jg. 66 (2017-06-01), Heft 6, S. 957-970Online academicJournalZugriff:
-
In: Proceedings of the Ninth Asian Test Symposium, 2000, S. 411-416KonferenzZugriff:
-
In: Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99), 1999, S. 377-385KonferenzZugriff:
-
In: 2002 IEEE International Symposium on Circuits and Systems (ISCAS), Jg. 4 (2002), S. 1KonferenzZugriff:
-
In: 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID), 2016, S. 445-450KonferenzZugriff:
-
In: 2011 International Conference on Reconfigurable Computing and FPGAs, 2011-11-01, S. 164-169KonferenzZugriff:
-
In: 2011 14th Euromicro Conference on Digital System Design, 2011-08-01, S. 231-238KonferenzZugriff:
-
In: 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems, 2005, S. 736-741KonferenzZugriff:
-
In: Proceedings 1999 Pacific Rim International Symposium on Dependable Computing, 1999, S. 40-44KonferenzZugriff:
-
In: Proceedings ED&TC European Design and Test Conference, 1996, S. 165-169Online KonferenzZugriff:
-
In: http://web.mit.edu/~cvikram/www/vlsi05.pdfOnline academicJournalZugriff: