Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- logic gates 9 Treffer
- silicon 7 Treffer
- capacitance 3 Treffer
- cmos 2 Treffer
- cmos inverter 2 Treffer
-
45 weitere Werte:
- cmos technology 2 Treffer
- inverters 2 Treffer
- layout 2 Treffer
- mathematical model 2 Treffer
- metals 2 Treffer
- mosfet 2 Treffer
- performance evaluation 2 Treffer
- ac performance 1 Treffer
- adder 1 Treffer
- adders 1 Treffer
- amoled 1 Treffer
- analytical models 1 Treffer
- biosensors 1 Treffer
- capacitance matching 1 Treffer
- charge sharing 1 Treffer
- circuit synthesis 1 Treffer
- cmos biosensor 1 Treffer
- cmos integrated circuits 1 Treffer
- cmos process 1 Treffer
- complementary fet (cfet) 1 Treffer
- domino logic 1 Treffer
- doping 1 Treffer
- doping-free 1 Treffer
- driver 1 Treffer
- electrodes 1 Treffer
- erbium 1 Treffer
- extended-gate field-effect transistor (egfet) 1 Treffer
- ferroelectric 1 Treffer
- ferroelectric fet (fefet) 1 Treffer
- gallium nitride 1 Treffer
- gan 1 Treffer
- gm/id method 1 Treffer
- hafnium oxide (hfo2) 1 Treffer
- high frame rate 1 Treffer
- hyperspectral imaging 1 Treffer
- indexes 1 Treffer
- indium gallium arsenide 1 Treffer
- integrated circuit modeling 1 Treffer
- ions 1 Treffer
- iron 1 Treffer
- junctions 1 Treffer
- leakage currents 1 Treffer
- light emitting diodes 1 Treffer
- logic arrays 1 Treffer
- logic-in-memory (lim) 1 Treffer
14 Treffer
-
In: IEEE Journal of the Electron Devices Society, Jg. 12 (2024), S. 187-194Online academicJournalZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 12 (2024), S. 236-242Online academicJournalZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 10 (2022), S. 78-82Online academicJournalZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 9 (2021), S. 995-1002Online academicJournalZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 9 (2021), S. 691-703Online academicJournalZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 11 (2023), S. 15-21Online academicJournalZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 11 (2023), S. 456-466Online academicJournalZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 4 (2016-03-01), Heft 2, S. 50-50Online academicJournalZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 3 (2015-05-01), Heft 3, S. 149-149Online academicJournalZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 8 (2020), S. 748-756Online academicJournalZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 8 (2020), S. 740-747Online academicJournalZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 8 (2020), S. 925-929Online academicJournalZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 3 (2015-05-01), Heft 3, S. 208-208Online academicJournalZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 2 (2014-07-01), Heft 4, S. 44-44Online academicJournalZugriff: