Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Schlagwort
- materials science 176 Treffer
- optoelectronics 163 Treffer
- electrical and electronic engineering 158 Treffer
- electronic, optical and magnetic materials 133 Treffer
- mosfet 106 Treffer
-
45 weitere Werte:
- electrical engineering 98 Treffer
- doping 83 Treffer
- law 64 Treffer
- law.invention 64 Treffer
- transistor 50 Treffer
- chemistry 49 Treffer
- electronic engineering 44 Treffer
- condensed matter physics 37 Treffer
- threshold voltage 36 Treffer
- transconductance 36 Treffer
- electric field 34 Treffer
- chemistry.chemical_element 30 Treffer
- drain-induced barrier lowering 30 Treffer
- voltage 28 Treffer
- chemistry.chemical_compound 27 Treffer
- channel length modulation 25 Treffer
- cmos 24 Treffer
- gate oxide 24 Treffer
- equivalent series resistance 23 Treffer
- general engineering 23 Treffer
- silicon 22 Treffer
- general physics and astronomy 21 Treffer
- capacitance 20 Treffer
- communication channel 20 Treffer
- materials chemistry 19 Treffer
- degradation (geology) 18 Treffer
- ion implantation 18 Treffer
- oxide 18 Treffer
- reliability (semiconductor) 17 Treffer
- substrate (electronics) 17 Treffer
- impact ionization 16 Treffer
- engineering 15 Treffer
- hardware_integratedcircuits 13 Treffer
- hardware_performanceandreliability 13 Treffer
- condensed matter::mesoscopic systems and quantum hall effect 12 Treffer
- integrated circuit 12 Treffer
- analytical chemistry 11 Treffer
- current (fluid) 11 Treffer
- nanotechnology 11 Treffer
- silicon on insulator 11 Treffer
- stress (mechanics) 11 Treffer
- breakdown voltage 10 Treffer
- fabrication 10 Treffer
- semiconductor device 10 Treffer
- electron 9 Treffer
Verlag
Publikation
- ieee transactions on electron devices 66 Treffer
- ieee electron device letters 40 Treffer
- japanese journal of applied physics 18 Treffer
- solid-state electronics 15 Treffer
- electronics letters 10 Treffer
-
27 weitere Werte:
- international journal of electronics 6 Treffer
- spie proceedings 6 Treffer
- microelectronics reliability 4 Treffer
- ieee journal of solid-state circuits 3 Treffer
- iee proceedings i solid state and electron devices 2 Treffer
- ieee transactions on semiconductor manufacturing 2 Treffer
- international journal of modern physics b 2 Treffer
- journal of vacuum science & technology a: vacuum, surfaces, and films 2 Treffer
- semiconductor science and technology 2 Treffer
- smart structures, devices, and systems 2 Treffer
- superlattices and microstructures 2 Treffer
- 2006 ieee international conference on semiconductor electronics 1 Treffer
- 2010 the 2nd international conference on industrial mechatronics and automation 1 Treffer
- canadian journal of physics 1 Treffer
- conference digest [late news papers volume included]device research conference, 2004. 62nd drc. 1 Treffer
- electronics and communications in japan (part i: communications) 1 Treffer
- iee proceedings g circuits, devices and systems 1 Treffer
- ieee transactions on computer-aided design of integrated circuits and systems 1 Treffer
- ieee transactions on industry applications 1 Treffer
- ieee transactions on nuclear science 1 Treffer
- journal of display technology 1 Treffer
- journal of semiconductors 1 Treffer
- journal of the electrochemical society 1 Treffer
- le journal de physique iv 1 Treffer
- microelectronics journal 1 Treffer
- nuclear instruments and methods in physics research section a: accelerators, spectrometers, detectors and associated equipment 1 Treffer
- proceedings of the 14th international symposium on power semiconductor devices and ics 1 Treffer
201 Treffer
-
In: IEEE Transactions on Electron Devices, Jg. 41 (1994-07-01), S. 1239-1248Online unknownZugriff:
-
In: Solid-State Electronics, Jg. 38 (1995-06-01), S. 1191-1196Online unknownZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 42 (1995-05-01), S. 957-962Online unknownZugriff:
-
In: Solid-State Electronics, Jg. 38 (1995-02-01), S. 419-424Online unknownZugriff:
-
In: Semiconductor Science and Technology, Jg. 13 (1998-05-01), S. 453-459Online unknownZugriff:
-
In: Solid-State Electronics, Jg. 37 (1994-12-01), S. 1961-1965Online unknownZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 41 (1994-07-01), S. 1222-1226Online unknownZugriff:
-
In: International Journal of Electronics, Jg. 76 (1994), S. 65-74Online unknownZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 41 (1994), S. 268-271Online unknownZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 41 (1994), S. 1618-1622Online unknownZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 41 (1994), S. 186-190Online unknownZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 40 (1993-04-01), S. 773-781Online unknownZugriff:
-
In: IEEE Electron Device Letters, Jg. 22 (2001-05-01), S. 236-238Online unknownZugriff:
-
In: 2010 The 2nd International Conference on Industrial Mechatronics and Automation, 2010-05-01Online unknownZugriff:
-
In: International Journal of Electronics, Jg. 73 (1992-10-01), S. 703-710Online unknownZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 39 (1992-07-01), S. 1694-1703Online unknownZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 39 (1992-04-01), S. 982-989Online unknownZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 42 (1995), S. 1461-1466Online unknownZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 42 (1995), S. 362-365Online unknownZugriff:
-
In: International Journal of Electronics, Jg. 71 (1991-08-01), S. 215-225Online unknownZugriff: