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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- engineered materials, dielectrics and plasmas 5 Treffer
- components, circuits, devices and systems 4 Treffer
- coatings 3 Treffer
- communication, networking and broadcast technologies 2 Treffer
- computing and processing 2 Treffer
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42 weitere Werte:
- diamonds 2 Treffer
- fields, waves and electromagnetics 2 Treffer
- grain boundaries 2 Treffer
- metallization 2 Treffer
- photonics and electrooptics 2 Treffer
- signal processing and analysis 2 Treffer
- thermal conductivity 2 Treffer
- tungsten 2 Treffer
- ald 1 Treffer
- bioengineering 1 Treffer
- chemical vapor deposition 1 Treffer
- cobalt 1 Treffer
- corrosion 1 Treffer
- cu interconnect 1 Treffer
- degradation 1 Treffer
- electrical resistance measurement 1 Treffer
- engineering profession 1 Treffer
- ethanol 1 Treffer
- general topics for engineers 1 Treffer
- grain size 1 Treffer
- graphene 1 Treffer
- logic gates 1 Treffer
- mol 1 Treffer
- nanotechnology 1 Treffer
- nuclear engineering 1 Treffer
- plasmas 1 Treffer
- plating 1 Treffer
- power, energy and industry applications 1 Treffer
- pvd 1 Treffer
- random access memory 1 Treffer
- reliability 1 Treffer
- robotics and control systems 1 Treffer
- scanning electron microscopy 1 Treffer
- selective deposition 1 Treffer
- signal propagation 1 Treffer
- silicon compounds 1 Treffer
- standards 1 Treffer
- substrates 1 Treffer
- tan 1 Treffer
- tin 1 Treffer
- transistors 1 Treffer
- transmission lines 1 Treffer
Verlag
Publikation
- 2016 ieee international interconnect technology conference / advanced metallization conference (iitc/amc), interconnect technology conference / advanced metallization conference (iitc/amc), 2016 ieee international 2 Treffer
- 2011 ieee international interconnect technology conference, interconnect technology conference and 2011 materials for advanced metallization (iitc/mam), 2011 ieee international 1 Treffer
- 2013 13th ieee international conference on nanotechnology (ieee-nano 2013) 1 Treffer
- 2013 13th ieee international conference on nanotechnology (ieee-nano 2013), nanotechnology (ieee-nano), 2013 13th ieee conference on 1 Treffer
- 2013 ieee international symposium on electromagnetic compatibility, electromagnetic compatibility (emc), 2013 ieee international symposium on 1 Treffer
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2 weitere Werte:
- 2013 twentieth international workshop on active-matrix flatpanel displays and devices (am-fpd), active-matrix flatpanel displays and devices (am-fpd), 2013 twentieth international workshop on 1 Treffer
- 2018 ieee international interconnect technology conference (iitc), interconnect technology conference (iitc), 2018 ieee international 1 Treffer
Sprache
7 Treffer
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In: 2013 IEEE International Symposium on Electromagnetic Compatibility, 2013-08-01, S. 539-544KonferenzZugriff:
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In: 2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013), 2013-08-01, S. 121-124KonferenzZugriff:
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Modified ALD TaN Barrier with Ru Liner and Dynamic Cu Reflow for 36nm Pitch Interconnect IntegrationIn: 2018 IEEE International Interconnect Technology Conference (IITC), 2018-06-01, S. 43-45KonferenzZugriff:
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In: 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016-05-01, S. 105-107KonferenzZugriff:
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In: 2011 IEEE International Interconnect Technology Conference, 2011-05-01, S. 1-3KonferenzZugriff:
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In: 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016-05-01, S. 171-173KonferenzZugriff:
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In: 2013 Twentieth International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2013-07-01, S. 257-258KonferenzZugriff: