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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- finfet 20 Treffer
- logic gates 18 Treffer
- mathematical model 12 Treffer
- components, circuits, devices and systems 11 Treffer
- capacitance 10 Treffer
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45 weitere Werte:
- electric capacity 8 Treffer
- logic circuits 8 Treffer
- computational modeling 7 Treffer
- integrated circuit modeling 7 Treffer
- semiconductor device modeling 7 Treffer
- bsim-cmg 6 Treffer
- circuit simulation 6 Treffer
- hardware design languages 6 Treffer
- mosfet 6 Treffer
- optimization 6 Treffer
- data models 5 Treffer
- engineered materials, dielectrics and plasmas 5 Treffer
- ferroelectric 5 Treffer
- ferroelectric (fe) 5 Treffer
- fin field-effect transistor (finfet) 5 Treffer
- iron 5 Treffer
- libraries 5 Treffer
- manufacturing processes 5 Treffer
- microelectronics 5 Treffer
- negative capacitance 5 Treffer
- negative capacitance field-effect transistor (ncfet) 5 Treffer
- process variations 5 Treffer
- reliability 5 Treffer
- transistors 5 Treffer
- verilog-ams 5 Treffer
- analytical models 4 Treffer
- antiferroelectric 4 Treffer
- computational complexity 4 Treffer
- computing and processing 4 Treffer
- design technology co-optimization (dtco) 4 Treffer
- electric fields 4 Treffer
- experimental validation 4 Treffer
- field-effect transistors 4 Treffer
- high voltages 4 Treffer
- integrated circuits 4 Treffer
- intel corp. 4 Treffer
- microprocessors 4 Treffer
- ncfet 4 Treffer
- performance technology 4 Treffer
- quantum gates 4 Treffer
- resource description framework 4 Treffer
- semiconductor research 4 Treffer
- simulation methods & models 4 Treffer
- spice 4 Treffer
- spice simulation 4 Treffer
Verlag
Publikation
- ieee transactions on electron devices 7 Treffer
- ieee transactions on circuits & systems. part i: regular papers 4 Treffer
- ieee transactions on computer-aided design of integrated circuits & systems 4 Treffer
- ieee journal of the electron devices society, electron devices society, ieee journal of the, ieee j. electron devices soc. 2 Treffer
- ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices 2 Treffer
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9 weitere Werte:
- 2014 ieee 57th international midwest symposium on circuits and systems (mwscas), circuits and systems (mwscas), 2014 ieee 57th international midwest symposium on 1 Treffer
- 2019 32nd international conference on vlsi design and 2019 18th international conference on embedded systems (vlsid), vlsi design and 2019 18th international conference on embedded systems (vlsid), 2019 32nd international conference on, vlsid 1 Treffer
- 2021 ieee computer society annual symposium on vlsi (isvlsi), vlsi (isvlsi), 2021 ieee computer society annual symposium on, isvlsi 1 Treffer
- 2024 8th ieee electron devices technology & manufacturing conference (edtm), electron devices technology & manufacturing conference (edtm), 2024 8th ieee 1 Treffer
- ieee journal of the electron devices society 1 Treffer
- ieee transactions on circuits and systems i: regular papers, circuits and systems i: regular papers, ieee transactions on, ieee trans. circuits syst. i 1 Treffer
- ieee transactions on computer-aided design of integrated circuits and systems : cad : a publication of the ieee circuits and systems society 1 Treffer
- ieee transactions on computer-aided design of integrated circuits and systems, computer-aided design of integrated circuits and systems, ieee transactions on, ieee trans. comput.-aided des. integr. circuits syst. 1 Treffer
- proceedings of the 2015 international conference on microelectronic test structures, microelectronic test structures (icmts), 2015 international conference on 1 Treffer
Sprache
11 Treffer
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 917-920KonferenzZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 12 (2024), S. 415-425Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-03-01), Heft 3, S. 976-980Online academicJournalZugriff:
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In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 2024-03-03, S. 1-3KonferenzZugriff:
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In: IEEE Transactions on Circuits and Systems I: Regular Papers, Jg. 67 (2020-09-01), Heft 9, S. 3127-3137Online academicJournalZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 11 (2023), S. 444-455Online academicJournalZugriff:
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In: 2021 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2021-07-01, S. 176-181KonferenzZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-06-01), Heft 6, S. 3074-3079Online academicJournalZugriff:
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In: 2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID), 2019, S. 502-503KonferenzZugriff:
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In: Proceedings of the 2015 International Conference on Microelectronic Test Structures, 2015-03-01, S. 110-115KonferenzZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, Jg. 34 (2015-10-01), Heft 10, S. 1696-1699Online academicJournalZugriff: