Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- components, circuits, devices and systems 2 Treffer
- engineered materials, dielectrics and plasmas 2 Treffer
- insulation 2 Treffer
- benchmark testing 1 Treffer
- calibration 1 Treffer
-
25 weitere Werte:
- capacitance 1 Treffer
- conducting materials 1 Treffer
- conductivity 1 Treffer
- conductors 1 Treffer
- dielectrics 1 Treffer
- electromagnetic analysis 1 Treffer
- electromagnetic propagation 1 Treffer
- equivalent circuits 1 Treffer
- geoscience 1 Treffer
- green's function methods 1 Treffer
- insulator testing 1 Treffer
- integrated circuit interconnections 1 Treffer
- interferometry 1 Treffer
- iterative algorithms 1 Treffer
- maxwell equations 1 Treffer
- metal-insulator structures 1 Treffer
- microstrip 1 Treffer
- object detection 1 Treffer
- radar applications 1 Treffer
- radar imaging 1 Treffer
- signal processing and analysis 1 Treffer
- space technology 1 Treffer
- synthetic aperture radar 1 Treffer
- system testing 1 Treffer
- target recognition 1 Treffer
Publikation
- ieee international geoscience and remote sensing symposium, geoscience and remote sensing symposium, 2002. igarss '02. 2002 ieee international, geoscience and remote sensing symposium 1 Treffer
- proceedings of the ieee 1998 international interconnect technology conference (cat. no.98ex102), interconnect technology conference, 1998. proceedings of the ieee 1998 international, interconnect technology 1 Treffer
- proceedings of the ieee 2000 international interconnect technology conference (cat. no.00ex407), interconnect technology conference, 2000. proceedings of the ieee 2000 international, interconnect technology 1 Treffer
3 Treffer
-
In: IEEE International Geoscience and Remote Sensing Symposium, Jg. 3 (2002), S. 1723-1725KonferenzZugriff:
-
In: Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407), 2000, S. 167-169KonferenzZugriff:
-
In: Proceedings of the IEEE 1998 International Interconnect Technology Conference (Cat. No.98EX102), 1998, S. 178-180KonferenzZugriff: