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In: Microelectronics Reliability, Jg. 36 (1996-11-01), S. 1727-1730Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 51 (2011-12-01), S. 2124-2128Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 32 (1992-11-01), S. 1509-1514Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 50 (2010-06-01), S. 839-846Online unknownZugriff: